Description
Cascade EPS200MMW for mmW and THz Measurements
The Cascade EPS200MMW mmW and THz Probe System is a cutting-edge platform engineered for precise probing of RF, millimeter-wave, and terahertz devices. Designed to support active and passive component testing, it provides unmatched electrical accuracy, mechanical stability, and measurement flexibility up to 500 GHz and beyond.
Complete Solution for High-Frequency Testing
The EPS200MMW integrates seamlessly with T-Wave Probes and VDI WR2.2 Extenders, enabling high dynamic range and superior directivity across mmW and THz frequencies. With built-in load-pull measurement support, it is the perfect choice for R&D teams, semiconductor developers, and researchers pushing the limits of high-frequency device performance.
SlimVue Microscope for High-Resolution Probing
The system features the SlimVue Microscope, combining eyepieces and a CCD camera for flexible operation. With 1 μm optical resolution, 3x zoom, and quick lens exchange, users can resolve pads under 50 μm with ease. The minimized footprint and fast switching between navigation and high-resolution optics provide exceptional usability and speed.
Flexible Probing with Sigma Application Kits
Equipped with Application Specific Sigma Kits, the EPS200MMW supports broadband, coax RF, load-pull, and banded waveguide configurations. Engraved platen guides and optical feedback ensure precise platen positioning. This modularity makes the system adaptable for virtually any mmW or sub-THz application, offering rapid setup and seamless integration with tuners and modules.
THz Measurement Capability with Superior Stability
The rock-solid mechanical design of the EPS200MMW ensures stable, repeatable probing at extreme frequencies. With submicron stage accuracy, a motorized positioner, and ±1 μm separation repeatability, it guarantees precise probe placement and consistent overtravel control. This results in highly stable measurements across the terahertz range, giving engineers confidence in their data quality.
Technical Specifications
| Feature | Details |
| Wafer Size | 200 mm |
| Frequency Range | mmW up to 500 GHz+ (THz capable) |
| Measurement Types | mmW, THz, load-pull, broadband, coax RF, banded waveguide |
| Optical System | SlimVue Microscope with eyepieces and CCD camera |
| Optical Resolution | 1 μm with 3x zoom |
| Pad Size Capability | Resolves pads smaller than 50 μm |
| Probing Kits | Application Specific Sigma Kits |
| Platen Features | Engraved guides, optical feedback (gauge), fast mounting |
| Stage Accuracy | Submicron accuracy with motorized positioner |
| Contact Repeatability | ±1 μm separation repeatability |
| Stability | Rock-solid mechanical design for consistent THz measurements |
Click here to learn more about similar products from FormFactor Beaverton Inc.
