Products

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements

Quantify composite layer resistance and interface resistance in Li-ion battery electrode sheets

The RM2610 Electrode Resistance Measurement System is an advanced tool designed for precise quantification of composite layer resistivity and interface resistance in Li-ion battery electrode sheets. Using cutting-edge inverse problem analysis, the system isolates and calculates resistance values critical for optimizing battery performance. Its intuitive design includes a constant current source and a multi-probe setup, enabling rapid measurements and detailed analysis.

With the ability to measure resistance variations caused by material properties, composition, and manufacturing conditions, the RM2610 accelerates the development of high-performance batteries. This system supports both positive and negative electrodes and provides visual insights into uniformity and density effects. Ideal for research and manufacturing environments, the RM2610 ensures reliable, accurate measurements essential for advancing lithium-ion battery technology.

Rapid 6.4ms Super Megohm and Low Current Testing

Key Features

• 300 times better noise resistance
• Max. 1000 V output: SM7110
• Max. 2 × 10^19 Ω display
• Min. 0.1 fA resolution
• Built-in EXT I/O, RS-232C, GP-IB and USB
• Flexible, Multipurpose Design, High Resistance
• Meter/Electrometer/Picoammeter/IR Meter
• Measure resistance of materials by combining with optional electrode

• HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
• Up to 5 Gpts of acquisition memory enables detailed viewing of long events
• 15.6” 1900 x 1080 Full HD capacitive touchscreen
• ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
• MAUI with OneTouch user interface for intuitive and efficient operation
• Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
• Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
• Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
• Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
• Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

• Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
• Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
• Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
• Time interval error (TIE) jitter track analysis
• Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
• Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
• Jitter measurements table with full details for one or more “lanes” plus reference

• Maximum safety in the field by absolutely preventing short-circuit accidents with fused measurement terminals and current-limiting resistor
• ±0.3% DC V basic accuracy, wide 40 Hz to 1 kHz AC V frequency characteristics
• Low-pass filter (100 Hz/ 500 Hz) cuts high harmonics (when measuring inverter fundamental waveforms)
• Connect to PC with USB communication function (optional)
• Broad -25°C (-13°F) to 65°C (149°F) operating temperature range CAT IV 600 V, CAT III 1000 V