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  • Precision meets performance in this regenerative, modular, and highly controllable DC power supply for high-voltage testing applications.

    Key Features:

    • Output voltage: 0 to 3000 V DC
    • Power range: 54 to 2000+ kW
    • Fast response: <250 µs rise/fall times
    • Regenerative sink/source operation
    • High current accuracy: <0.02% FS
    • Auto-ranging voltage-current flexibility (factor 3)
    • Full digital modes: CV, CC, CP, CR, Ri-Sim
    • Modular design with up to 44 units
    • Optional HMI touchscreen and CAN interface
    • Waveform generation via AnyWave + WaveMaster

     

    • HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
    • Up to 5 Gpts of acquisition memory enables detailed viewing of long events
    • 15.6” 1900 x 1080 Full HD capacitive touchscreen
    • ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
    • MAUI with OneTouch user interface for intuitive and efficient operation
    • Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
    • Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
    • Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
    • Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
    • Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

     

    • Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
    • Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
    • Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
    • Time interval error (TIE) jitter track analysis
    • Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
    • Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
    • Jitter measurements table with full details for one or more “lanes” plus reference