Products

Key Performance Capabilities:

• Bandwidth: DC to 50 kHz
• Voltage: 0 to 250 V_RMS; 0 to 350 VDC
• Current: 100 to 500 A_RMS
• Distortion: 0.1%
• Power: 4 kW to 20 kW*Power levels up to 5X rated power when driving reactive loads
• High power efficiency and density

*Models available with output from 4 kW to 20 kW (capable of up to 125 kVA).

Key Performance Capabilities:

• 4-Quadrant – Can source and sink current
• ±80V – DC supply for 12V to 48V systems; meets 80V surge requirements
• 300 kHz Sine – DC ripple tests for all major standards
• 3µs Rise Time – Exceeds surge and dropout slew rate requirements
• 3mΩ DC Source Impedance – Out-performs ISO 7637-2 requirements
• Supports ground reference and supply offset testing required for ISO 16750-2 Sect. 4.8 and other similar standards

• Dynamic set up: During a simple frame reading, users can define elements to be acquired, recorded, visualized and surveyed in real time.
•  Macro-command: Users can write and execute complex test sequences thanks to macro-command functions.
•  Local & Distant Integration: AT-DIAG can be driven and interrogated by external software. It can also be used with a computer through Ethernet.
• Communication ports: Communication is done through RS232, NI CAN acq. Card, specific acquisition card or system.
•  Protocols: FREERUNNING, KWP2000, CAN, LIN, FlexRay, ARINC, … Possibility to implement new protocols (customized protocol, …).
•  Multi-product & Multi-protocol Communication: Communication can be set up with multiple addresses and protocols during a single test.

• 1 software for all your equipment
• 1 software for all standards
• 1 software for your electrical and EMC tests
• Advanced functions of monitoring and control
• Automated reports
• Team of specialists at your disposal

• Fast: ACA compression and parallelization allow to speed up the calculation
• Accurate: Fully validated with measurement results on real mock-up
• Innovative: New method from research labs
• Powerful: Compute very large models
• Easy: Dedicated graphical user interface with modern layout

• Fast: ACA compression and parallelization allow to speed up the calculation
• Accurate: Fully validated with measurement results on real mock-up
• Innovative: New method from research labs
• Powerful: Compute very large models
• Easy: Dedicated graphical user interface with modern layout

• Unique user interface for all tests
• Independent from any measuring device manufacturers
• Free drivers and over 500 supported devices
• Efficient and dedicated Technical support
• Wide range of supported standards (ENxx, CISPR, AUTOMOTIVE, DO160, …)
• Interface Agilent VEE™, WindowsLabView™, LabWindows CVI™, Visual C++
• Operating system: Win XP, Vista, Seven, Windows 8
• Report in MS Office™ 2003, 2007, 2010, 2013, Open office