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  • A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

    Key Features:

    • Mechanical platen lift for safer RF set-ups and reduced operator errors
    • Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
    • Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
    • Spacious platen design supporting RF and DC setups with ease
    • Compact footprint with field-upgradable components
    • Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

     

  • Engineered for cutting-edge EV, automotive, and aerospace compliance, the HVR 1000 is a complete high-voltage ripple test system built to handle demanding lab environments with unmatched precision and safety.

    Key Features:

    • Wide Frequency Range: AC ripple from 10 Hz to 200 kHz
    • High Voltage Output: Up to 1000V DC and 60 kW power
    • Waveform Versatility: Generates sine, triangle, and custom signals
    • Robust Safety: Multi-layer overvoltage, overcurrent, and thermal protection
    • Zero Licensing Fees: Future test standard updates included
    • User-Centric Interface: Intuitive controls with HDMI and LAN support
    • Flexible Configuration: Available as HVR 1000RG (Ripple Generator only)
    • Space-Saving Design: Small footprint, ideal for compact lab setups

     

  • The HVR 1200RG Ripple Generator is a powerful, next-gen solution tailored for electric vehicle high-voltage testing. Designed for use with traction inverters and HIL test stands, this rugged system delivers unmatched ripple current and voltage capabilities across a wide frequency range.

    Key Features:

    • Ripple Current Output: Up to 600 A peak
    • Voltage Range: 0 – 150 Vp (300 Vp-p)
    • Wide Frequency Support: 150 Hz to 300 kHz
    • DC Voltage Compatibility: 0 – 1200 V (or up to 2000 V in bridged mode)
    • Data Monitoring: Real-time tracking of voltage, current, and impedance
    • Built-In Protections: Handles short circuits and noisy DUTs effortlessly
    • Modular & Expandable: Configurable for current and future EV standards
    • Noise-Resistant: Engineered to operate accurately in high-noise environments

     

  • Key Features

    • Supports wafers up to 200 mm (optional 300 mm upgrade)
    • Operates at cryogenic temperatures down to 10 K
    • Semi-automated with optional full automation via autoloader
    • Compatible with liquid nitrogen, liquid helium, or cryo-cooler
    • Ice- and condensation-free probing for stable performance
    • Up to eight probe positioners or probe card integration
    • Solid vibration-isolated frame for precision measurements
    • Velox software with intuitive alignment and automation

     

  • Key Features

    • Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
    • Supports wafers up to 150 mm or single dies
    • Up to six probe positioners for flexible testing
    • Optional thermal chuck from -60°C to +300°C
    • Probing possible with open chamber lid at atmosphere
    • Stable, vibration-isolated frame for precise results
    • Ergonomic design with hinged topside lid for easy access
    • Independent control of chuck stage and positioners
    • Fast, manual step-and-repeat wafer testing

     

  • Cascade PM300 – 300 mm Analytical Probe Station

    Key Features:

    • Industry benchmark for manual wafer probing and failure analysis.
    • Superior mechanical stability with granite base for precision and repeatability.
    • High-precision probe positioning with independent X-Y coarse and fine adjustments.
    • Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
    • Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
    • Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
    • Spacious, ergonomic design supporting up to 12 positioners.
    • Upgradeable platform to support future testing needs.

     

  • Cascade TESLA300 – Advanced On-Wafer Power Device Characterization

    Key Features:

    • High-voltage and high-current testing up to 10 kV / 600 A.
    • Integrated AttoGuard™ and FemtoGuard™ technology for ultra-low leakage and capacitance.
    • MicroVac™ chuck surface for thin wafer handling and low contact resistance.
    • TÜV-certified safety system with interlocks and full enclosure.
    • Top-lift wafer loading eliminates lift pins for accurate vertical device measurements.
    • Full thermal range from -60°C to +300°C with efficient transition times.
    • Seamless integration with Keysight and Keithley analyzers.
    • Remote operation capability for safe offsite control.
    • Velox and Velox Dash™ software for intuitive automation.

     

    • High Power: Ranging from  750W to 15kW.
    • User-Friendly: Easy connections via LAN (LXI 1.5), USB (2.0), RS-232/RS-485.
    • Safe & Certified: CE/UKCA marked with built-in safety.
    • Versatile: Ideal for various industries.
    • Warranty: 5 years.

     

    • Optional Interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA (IS420)
    • Output Power Levels: 1kW to 15kW, low-noise performance
    • Output Voltage/Current: Up to 1500V and 1500A
    • AC Input Options: Single-phase and three-phase with Active Power Factor Correction
    • Mechanical Options: Blank Front Panel, Air Filter Kits, Parallel Kits
    • Certifications: CE/UKCA Marked, UL/cUL/IEC/EN 61010-1
    • Warranty: 5 years

     

    • High power density, lightweight, and portable
    • Output power: 30kW, 45kW, 60kW; Output voltages: 10V to 600V
    • Advanced features: Programmable V/I Slew-Rate, Constant-Power Limit, Arbitrary Waveform Generator
    • Built-in interfaces: LAN (LXI 1.5), USB (2.0), RS-232/RS-485, Isolated Analog (5V/10V)
    • Optional interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA
    • CE and UKCA marked, worldwide safety approvals, 5-year warranty

     

     

    • Compact, air-cooled OEM style
    • Superior pulse repeatability
    • Simple parallel operation for higher power
    • Optional Active PFC (pf = 0.98)
    • Full remote control interface
    • High EMI-RFI immunity

     

    • Advanced semiconductor technology
    • High-quality construction
    • Rapid capacitor and pulse-forming network charging
    • Compact and lightweight design
    • Simple parallel operation for higher power needs
    • Compatible with worldwide input voltages and frequencies
    • Fully adjustable output voltage
    • Comprehensive remote control interface

     

  • High-Speed Current Control: No dynamic overshoot or oscillation
    High Slew-Rate: Up to 30A/*s for fast load changes
    Low Voltage Operation: Stable operation with no turn-on delay
    Multi-Functional: Seven load modes and four operating modes
    Parallel Operation: Up to 10kW with 10 units
    User-Friendly Interface: Built-in USB and optional IEEE interfaces
    Compliance: EN61010-1 compliant with a two-year warranty

  • Key Performance Capabilities:

    • Slew rates up to 60 V/µsec.
    • Up to 240A DC at +50VDC or –50VDC (4301-240 configuration).
    • Can provide pulses of up to 800 amps at voltages of up to ±100V (4301-240 configuration).
    • Adjustable compensation allows the system to maintain a 50V/2 µsec rise-time over a wide range of current outputs.

     

  • Key Performance Capabilities:

    • Bandwidth: DC to 50 kHz
    • Voltage: 0 to 250 VRMS; 0 to 350 VDC
    • Current: 100 to 500 ARMS
    • Distortion: 0.1%
    • Power: 4 kW to 20 kW*Power levels up to 5X rated power when driving reactive loads
    • High power efficiency and density

    *Models available with output from 4 kW to 20 kW (capable of up to 125 kVA).

     

  • Key Performance Capabilities:

    • 4-Quadrant – Can source and sink current
    • ±80V – DC supply for 12V to 48V systems; meets 80V surge requirements
    • 300 kHz Sine – DC ripple tests for all major standards
    • 3µs Rise Time – Exceeds surge and dropout slew rate requirements
    • 3mΩ DC Source Impedance – Out-performs ISO 7637-2 requirements
    • Supports ground reference and supply offset testing required for ISO 16750-2 Sect. 4.8 and other similar standards