Products

A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

Key Features:

• Supports wafers and substrates up to 200 mm or single dies
• Up to eight positioners and probe card compatibility
• Optional thermal chuck (-60°C to 300°C) with pressure regulation
• Accessories available: black bodies and optical motion analysis tools
• Upgradeable to 300 mm wafer capability
• Built-in vibration isolation for precise, stable measurements
• Ideal for DC, RF, MEMS, and optoelectronic testing
• Ergonomic manual drives with front-loading capability
• High throughput with software-controlled chuck for fast step-and-repeat

Cascade Summit 200 mm Manual Probe System

Key Features:

• High-precision manual on-wafer device and process characterization.
• Wide thermal range from -60°C to +300°C.
• Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
• PureLine™ and AttoGuard® technologies for low-noise performance.
• Configurable for DC, RF, mmW, WLR, and FA applications.
• Locking roll-out stage for safe wafer access.
• Ergonomic 3-axis manual stage with intuitive controls.
• Dedicated Velox software with Augmented Align for accurate RF probing.

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

Compact and quiet bench power supply with precision linear regulation and a range of output options for lab or system use.

Key Features:

• Linear regulated bench DC power supply
• Single, dual, and triple output options
• Up to 56V and 5A with up to 130W output
• 4-digit voltage and current display per output
• Constant voltage or constant current operation
• Switchable local/remote sensing
• Silent, fan-free convection cooling
• Compact design saves bench space
• Optional RS232 or USB interfaces (on select models)
• Auxiliary output (1.5–5V/2A) on EL302RT

A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

Key Features:

• Mechanical platen lift for safer RF set-ups and reduced operator errors
• Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
• Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
• Spacious platen design supporting RF and DC setups with ease
• Compact footprint with field-upgradable components
• Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

A versatile bench power supply series with mixed-mode regulation, ideal for lab or system environments.

Key Features:

• Single, dual, or triple outputs with up to 420W power
• Output ranges: 18V/10A, 20V/20A, 35V/5A, 42V/10A
• Dual model: 2×35V/4A or 150V/2A (combined)
• Triple model includes 1.5–5V/5A auxiliary output
• Independent 4-digit meters for each output
• Local or remote sensing with constant V or I modes
• Silent, fan-free operation for most models
• Compact, space-saving design
• RS232 or USB interfaces on select models

Compact, versatile, and efficient, the FX Series is ideal for test labs, R&D, and educational use.

Key Features:

• PowerFlex autoranging outputs (up to 105W per channel)
• Dual or triple output models (210W or 246W total)
• SELV compliant and high safety design
• Rotary, touch, and USB control options
• Low ripple noise (<2mV), high resolution (1mV/1mA)
• Voltage tracking and simultaneous V/I control
• Remote USB interface with SCPI protocol
• 25 user-defined memory presets
• Switchable remote sense & intelligent cooling
• Includes Test Bridge software for logging & automation

• Current measurement from insulated probing of conductor
• Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
• Wide dynamic range of 10mA to 20A peak to peak
• Wide bandwidth of DC to 5MHz
• Low noise figure equivalent to <6mA rms at full B/W
• Safety rated to 300V Cat II (600V Cat 1)
• Suitable for connection to any oscilloscope
• High accuracy general purpose H-field probe
• Converts to ‘closed magnetic circuit’ current probe

The Aim-TTi LCR400 Precision LCR Meter delivers high-accuracy component testing in a compact, user-friendly design. With 0.1% basic accuracy and built-in comparator functions, it’s ideal for precision component measurement and quality control.

Key Features:

• 0.1% basic measurement accuracy for reliable results
• Automatic component recognition for ease of operation
• Dual 5-digit high-brightness displays for clear readings
• Built-in 4-terminal component fixture for stable connections
• Limits comparator with 8 Pass bins and 2 Fail bins
• Three selectable test frequencies with switchable bias
• RS232 standard interface for PC connectivity
• Optional SMD tweezers, Kelvin clips, and PC logging software

The Aim-TTi LD400 Series DC Electronic Load is a versatile and high-performance solution for testing DC power supplies, batteries, and converters. With precise control, multiple operating modes, and advanced transient testing, it ensures dependable and accurate performance for laboratory and production environments.

Key Features:

• Wide operating range: 0–80V and 0–80A
• 400W continuous and 600W short-term power dissipation
• Multiple modes: constant current, voltage, resistance, conductance, and power
• Operates at <1V for high-current testing up to 40A
• Built-in transient generator with variable slew rate
• High accuracy with fine-level setting resolution
• Variable drop-out voltage for battery discharge testing
• Graphical LCD with intuitive soft-key control
• Analog and TTL remote control functions
• USB, RS232, and LAN (LXI) interfaces; optional GPIB (LD400P)
• Front and rear input terminals for flexible connections

The Aim-TTi LDH400 Series DC Electronic Load offers a powerful and precise solution for direct testing of DC power sources, converters, and PFCs. Designed for high-voltage applications, it combines advanced features, intuitive control, and reliable performance in a compact form factor.

Key Features:

• Wide voltage range: 10V to 500V and current up to 16A
• 400W continuous power dissipation at 28°C (360W at 40°C)
• Operates in constant current, resistance, conductance, and power modes
• High accuracy and resolution for precise level settings
• Built-in transient generator with adjustable slew rates
• Variable drop-out voltage ideal for battery and power testing
• Graphical LCD with easy soft-key interface
• Front and rear input terminals for flexible connectivity
• Remote control via USB, RS232, and LXI-compliant LAN
• Optional GPIB interface available
• Rated to CAT II (300V) safety standards

• Three or four high performance outputs each with full functionality
• Range switching gives variable voltage/current combinations
• Shared power mode provides double power from a single output
• Low output noise and ripple via linear final regulation
• High setting resolution of up to 1mV and 0.1mA
• Variable OVP and OCP trips on all outputs which can be linked (MX-Q Series 2 units only)
• Individual or combined output on/off control with programmable delay sequencing.
• Selectable voltage tracking (isolated tracking)
• Selectable current meter averaging
• Switchable remote sense capability
• Graphic LCD (colour on Series 2) provides simultaneous output metering
• Numeric or spin-wheel control of all parameters
• 50 setting memories per output plus 50 linked memories
• 3U rack case for bench or rack mounting (4U rack kit accessory available)
• RS-232, USB and LAN (LXI) interfaces (P models)
• GPIB option (P models only)
• Duplicate power & sense terminals at rear (P models)
• Software control from Test Bridge software (free download – P models only)

Series 2 (“S2”) models add:

• Colour display
• Enhanced channel power sharing
• ‘TripLink’ feature: Link channels to trip together on OVP or OCP
• New MX103Q SELV Model

Key Features

• Supports wafers up to 200 mm (optional 300 mm upgrade)
• Operates at cryogenic temperatures down to 10 K
• Semi-automated with optional full automation via autoloader
• Compatible with liquid nitrogen, liquid helium, or cryo-cooler
• Ice- and condensation-free probing for stable performance
• Up to eight probe positioners or probe card integration
• Solid vibration-isolated frame for precision measurements
• Velox software with intuitive alignment and automation