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  • A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

    Key Features:

    • Supports wafers and substrates up to 200 mm or single dies
    • Up to eight positioners and probe card compatibility
    • Optional thermal chuck (-60°C to 300°C) with pressure regulation
    • Accessories available: black bodies and optical motion analysis tools
    • Upgradeable to 300 mm wafer capability
    • Built-in vibration isolation for precise, stable measurements
    • Ideal for DC, RF, MEMS, and optoelectronic testing
    • Ergonomic manual drives with front-loading capability
    • High throughput with software-controlled chuck for fast step-and-repeat

     

  • Cascade Summit 200 mm Manual Probe System

    Key Features:

    • High-precision manual on-wafer device and process characterization.
    • Wide thermal range from -60°C to +300°C.
    • Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
    • PureLine™ and AttoGuard® technologies for low-noise performance.
    • Configurable for DC, RF, mmW, WLR, and FA applications.
    • Locking roll-out stage for safe wafer access.
    • Ergonomic 3-axis manual stage with intuitive controls.
    • Dedicated Velox software with Augmented Align for accurate RF probing.

     

  • Cascade SUMMIT200 Advanced 200 mm Probe Station

    Key Features:

    • High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
    • Up to 5X faster time to accurate data with automated wafer handling.
    • Wide thermal range from -60°C to +300°C with IceShield™.
    • PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
    • Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
    • Flexible platform for device characterization, FA, WLR, and design debug.
    • Velox control software with modern UI, workflow guide, and automation tools.
    • Ergonomic operation with quick manual wafer access and roll-out stage.

     

  • Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

    Key Features:

    • On-wafer device testing up to 10,000 V DC / 600 A
    • AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
    • MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
    • TÜV-certified safety system with full enclosure and interlocks
    • Wide thermal range: -60°C to +300°C with TopHat chamber
    • Roll-out chuck and auxiliary mounts for flexible wafer handling
    • Remote operation and full software integration with Velox and analyzers
    • Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

     

  • Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

    Key Features:

    • Integrated silicon photonics wafer and die-level probing solution.
    • Autonomous SiPh Measurement Assistant for hands-free calibration.
    • OptoVue™ technology for real-time, in-situ optical calibrations.
    • Supports vertical, horizontal edge, and wafer-level edge coupling.
    • Dark, shielded, frost-free environment with SiPh TopHat.
    • Thermal capability from -40°C to +125°C.
    • Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
    • Partnerships with Keysight and PI for precision instrumentation.
    • Easy setup and automation with Velox and Velox Dash™ interface.

     

  • Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

    Key Features:

    • Ultra-low noise measurements with patented PureLine™ 3 technology.
    • Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
    • Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
    • Plug-and-Go TestCell Power Management eliminating ground-loop noise.
    • Autonomous 24/7 operation with optimized motorized probe positioners.
    • Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
    • Integrated Velox software for simple, efficient automation.

     

  • Teledyne Test Tools Digital Power Meters provide reliable, high-precision AC and DC power measurements in a compact design. Ideal for R&D, QA, and compliance testing.

    Key Features:

    • Bandwidth: DC, 0.1 Hz to 100 kHz
    • High-resolution 4″ and 5″ TFT LCD displays
    • 19 power measurement parameters
    • 16-bit ADC and 300 kHz sampling rate (T3PM1100)
    • Waveform, harmonic, and integration functions
    • External current sensor input (T3PM1100)
    • Supports IEC 62301 and IEC 61000-4-7 standards
    • Interfaces: USB, LAN, RS-232C
    • Front/rear terminal inputs for flexible testing

     

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  • Compact and quiet bench power supply with precision linear regulation and a range of output options for lab or system use.

    Key Features:

    • Linear regulated bench DC power supply
    • Single, dual, and triple output options
    • Up to 56V and 5A with up to 130W output
    • 4-digit voltage and current display per output
    • Constant voltage or constant current operation
    • Switchable local/remote sensing
    • Silent, fan-free convection cooling
    • Compact design saves bench space
    • Optional RS232 or USB interfaces (on select models)
    • Auxiliary output (1.5–5V/2A) on EL302RT

     

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  • A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

    Key Features:

    • Mechanical platen lift for safer RF set-ups and reduced operator errors
    • Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
    • Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
    • Spacious platen design supporting RF and DC setups with ease
    • Compact footprint with field-upgradable components
    • Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

     

  • A versatile bench power supply series with mixed-mode regulation, ideal for lab or system environments.

    Key Features:

    • Single, dual, or triple outputs with up to 420W power
    • Output ranges: 18V/10A, 20V/20A, 35V/5A, 42V/10A
    • Dual model: 2×35V/4A or 150V/2A (combined)
    • Triple model includes 1.5–5V/5A auxiliary output
    • Independent 4-digit meters for each output
    • Local or remote sensing with constant V or I modes
    • Silent, fan-free operation for most models
    • Compact, space-saving design
    • RS232 or USB interfaces on select models

     

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  • Compact, versatile, and efficient, the FX Series is ideal for test labs, R&D, and educational use.

    Key Features:

    • PowerFlex autoranging outputs (up to 105W per channel)
    • Dual or triple output models (210W or 246W total)
    • SELV compliant and high safety design
    • Rotary, touch, and USB control options
    • Low ripple noise (<2mV), high resolution (1mV/1mA)
    • Voltage tracking and simultaneous V/I control
    • Remote USB interface with SCPI protocol
    • 25 user-defined memory presets
    • Switchable remote sense & intelligent cooling
    • Includes Test Bridge software for logging & automation

     

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  • HDA125 High-Speed Digital Analyzer brings advanced logic analysis capabilities to your existing Teledyne LeCroy oscilloscopes. Compact, accurate, and versatile.

    Key Features:

    • 12.5 GS/s sample rate for high-speed digital capture
    • Supports up to 18 digital channels
    • Compatible with WaveMaster/SDA 8 Zi-B and LabMaster 10Zi-A oscilloscopes
    • QuickLink Probe System for fast, low-impact signal access
    • 3 GHz bandwidth and 80 ps timing accuracy
    • Command bus decoding for in-depth DDR/LPDDR memory debugging
    • Minimal signal loading with 110 kΩ, 0.12 pF tip impedance
    • Cost-effective QuickLink solder-in tips simplify multi-point testing
    • Ideal for mixed-signal, high-speed, and memory interface debugging
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    • Current measurement from insulated probing of conductor
    • Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
    • Wide dynamic range of 10mA to 20A peak to peak
    • Wide bandwidth of DC to 5MHz
    • Low noise figure equivalent to <6mA rms at full B/W
    • Safety rated to 300V Cat II (600V Cat 1)
    • Suitable for connection to any oscilloscope
    • High accuracy general purpose H-field probe
    • Converts to ‘closed magnetic circuit’ current probe

     

  • Teledyne Test Tools LCR Meters offer precision testing in a compact form, perfect for R&D labs and production lines.

    Key Features:

    • 3.5” high-resolution color LCD display
    • Test frequency up to 300 kHz with continuous output
    • 0.05% basic measurement accuracy
    • Spot or full frequency range with OPEN/SHORT correction
    • Automatic Level Control (ALC) for consistent voltage on components like MLCCs
    • Measure up to 4 parameters simultaneously
    • DCR measurement & built-in ±2.5 V DC bias
    • PASS/FAIL indicator and 10-bin sorting function
    • List measurement for automated test sweeps (up to 10 points)
    • Interfaces: RS-232C, USB, handler, and USB storage
    • Compact 2U, 1/2 rack size for automated test setups
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  • The Aim-TTi LCR400 Precision LCR Meter delivers high-accuracy component testing in a compact, user-friendly design. With 0.1% basic accuracy and built-in comparator functions, it’s ideal for precision component measurement and quality control.

    Key Features:

    • 0.1% basic measurement accuracy for reliable results
    • Automatic component recognition for ease of operation
    • Dual 5-digit high-brightness displays for clear readings
    • Built-in 4-terminal component fixture for stable connections
    • Limits comparator with 8 Pass bins and 2 Fail bins
    • Three selectable test frequencies with switchable bias
    • RS232 standard interface for PC connectivity
    • Optional SMD tweezers, Kelvin clips, and PC logging software

     

  • The Aim-TTi LD400 Series DC Electronic Load is a versatile and high-performance solution for testing DC power supplies, batteries, and converters. With precise control, multiple operating modes, and advanced transient testing, it ensures dependable and accurate performance for laboratory and production environments.

    Key Features:

    • Wide operating range: 0–80V and 0–80A
    • 400W continuous and 600W short-term power dissipation
    • Multiple modes: constant current, voltage, resistance, conductance, and power
    • Operates at <1V for high-current testing up to 40A
    • Built-in transient generator with variable slew rate
    • High accuracy with fine-level setting resolution
    • Variable drop-out voltage for battery discharge testing
    • Graphical LCD with intuitive soft-key control
    • Analog and TTL remote control functions
    • USB, RS232, and LAN (LXI) interfaces; optional GPIB (LD400P)
    • Front and rear input terminals for flexible connections

     

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