RF Multicontact

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FormFactor, Inc FormFactor Cascade ACP-Q Probe
A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz
- Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
- Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
- Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
- Durable probe structure ensures more than 250,000 contacts
- Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
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FormFactor, Inc FormFactor Cascade Multi-|Z| Probe
Test Up to 16 RF Signals with One Probe
- Ideal for multiport RF/Microwave and high-speed digital signal testing
- Mix DC and RF/Microwave signals on one probe
- Long lifetime – typically over one million (1,000,000) touchdowns
- Excellent performance in temperatures ranging from 10 K to 200°C
- Probe on any pad material with no damage
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FormFactor, Inc FormFactor Cascade QuadCard™
Cost-effective, versatile probe card solution
- Accommodates a combination of up to four Cascade Microtech probes
- Configurable for mixed-signal RF/mmW testing
- Quick and easy repairs to be performed in the field, by simply replacing individual probes
- Adaptable to new device layouts by exchanging individual probes
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FormFactor, Inc FormFactor Cascade Unity Probe
Multicontact Probe for RFIC Engineering Test
- Up to 12 contacts; any contact can be DC, Power, Logic to 500 MHz,or RF to 20 GHz
- Online design configuration tool helps you to specify your probe in minutes
- All designs are fully quadrant compatible
- Full solution includes probes, calibration substrates, stations, accessories and software
- Scalable architecture for future needs
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FormFactor, Inc FormFactor Cascade |Z| ProbeWedge
HF and DC Signals on One Cost-Effective ProbeWedge
- Flexibility
  
  The ProbeWedge family is compatible with your existing Cascade Microtech’s probing systems
  
  Plug and play design provides easy handling and strain relief
  
  Ideal probe solution for wafer-level reliability, multi-site tests and DC biasing
- Cost effectiveness
  
  Alternative to inflexible probe cards, ideal for changing demands in R&D
  
  All cables can be re-used and additional single cables can be ordered
  
  Probe blades can be repaired individually
- Accuracy
  
  Kelvin ProbeWedge is ideal for low-resistance measurements
  
  Fully-guarded microstrip blades for low-current measurements down to fA range
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FormFactor, Inc FormFactor InfinityQuad Probe
A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz
- Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
- Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
- Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
- Durable probe structure ensures more than 250,000 contacts
- Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications
REQUEST A QUOTE

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Showing all 6 results

RF Multicontact

A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz

Test Up to 16 RF Signals with One Probe

Cost-effective, versatile probe card solution

Multicontact Probe for RFIC Engineering Test

HF and DC Signals on One Cost-Effective ProbeWedge

A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz

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