Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis. View Discounted Products
Discount Products: Look through products available for a 25% – 50% discount in 2020. The items provided on a first come, first serve basis. View Discounted Products
The MicroProf® MHU, metrology tool with Material Handling Unit is specially designed for semiconductor, MEMS, sapphire and LED industries. Typical applications are measurement of bare and coated wafers, or structured wafers at various lithographic process steps. Due to a robot arm with two vacuum end effectors, the tool has very high throughput rates up to 220 wafers per hour. It is capable of processing wafer sizes from 2 to 12 inches. Up to 4 open cassettes can be processed and additionally there is the option to integrate a pre-aligner and an OCR reader. The option for two-sided sample measurement allows the simultaneous measurement of the top and bottom surface with determination of the sample thickness, total thickness variation (TTV) and various surface parameters such as roughness, waviness and flatness of both sides. A complete wafer shape measurement is also possible with analysis of the global and local wafer parameters.
A wafer sorting function is available, which is adjustable according to customer requirements. Based on the multi-sensor concept, additional sensors can be retrofitted at a later date. A further domain of the MicroProf® MHU is the layer thickness determination of thin films, as well as layer stacks, measurement of step heights, bumps, vias (TSVs), trenches, etc. Due to its fully SEMI-compliant design, almost maintenance-free hardware components and its high throughput, the MicroProf® MHU is the perfect solution for use
in production.
ACA TMetrix Inc. is a leading Canadian distributor of test and measurement instruments and design tools. For over 55 years we have provided products manufactured by the world’s leading instrument manufacturers. Leading Distributor of Design Tools and Test Equipment in Canada.
System | |
assembly | gantry design |
sensor | multi-sensor |
clean room class | optional filter fan units, ISO class 4 |
throughput | 200 w/h (6“, full wafer inspection 4 profiles SEMI MF657) |
wafer sizes | 2“ to 12“ |
uptime | > 99%; MTBFp, > 800h |
wafer materials | silicon, sapphire, compound semiconductors, glass, quartz etc. |
Scanning Stage | |
travel | up to 440 mm x 305 mm |
drive type | direct drive |
bearing type | crossed roller bearing |
encoder resolution | 50 nm |
flatness | < 2 µm / 100 mm |
max. speed | 300 mm / s |
load capacity | 5 kg |
z-axis | motorized axis |
z-cxis travel | 50 mm (100 mm optional) |
System Requirements | |
environmental requirements | clean, vibration free, stable temperature |
power supply | 110 / 230 V AC, 50-60 Hz, 1 Phase |
vacuum | ~65 kPa, 5 m³/h |
CDA | 6 bar |
footprint (L x W x H) | 1642 x 1267 x 1900 mm1 / 1680 x 1500 x 1900 mm2 |
weight | ~800 kg1 / ~1200 kg2 |
MicroProf® 200 MHU with filter fan units additional specifications on request
2 MicroProf® 300 MHU with filter fan units
Datasheet