Description
IM7585 Impedance Analyzer for High-Frequency Testing
The Hioki IM7585 Impedance Analyzer combines speed, accuracy, and versatility, making it ideal for high-frequency component testing in both research and high-volume production. Its top test frequency range of 1 MHz to 1.3 GHz and rapid 0.5 millisecond measurement time allow engineers to analyze electronic components efficiently, including ferrite chip beads and chip inductors.
Precision and Stability
With only 0.07% measured value variability at 1 GHz, the IM7585 provides unmatched measurement stability. The device maintains a basic accuracy of ±0.65% rdg., ensuring reliable results even in critical applications. Its RF I-V method further enhances measurement fidelity, while the contact check function ensures secure connections and prevents false readings.
Flexible Design and Functionality
The analyzer features a compact half-rack body with a palm-sized test head, allowing easy installation in crowded labs or production lines. The device supports frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode. A built-in comparator function enables automated PASS/FAIL testing, streamlining quality control processes.
Wide Application Across Electronics
Engineers can use the IM7585 for R&D on high-frequency components or in production environments to ensure consistent quality. Combined with the SMD Test Fixture IM9201, it accommodates six SMD sizes, facilitating accurate and repeatable measurements. The analyzer’s contact check and waveform judgment features detect poor connections, reducing downtime and errors in testing.
Reliable Setup
Connecting the test head is simple: attach the cable to the analyzer and tighten the nut until the torque wrench handle bends slightly. This ensures optimal contact without risking damage.
Technical Specifications Table
| Specification | Details |
| Product Name | Hioki IM7585 Impedance Analyzer |
| Measurement Frequency | 1 MHz – 1.3 GHz |
| Test Speed | 0.5 ms (analog) |
| Measured Value Variability | 0.07% at 1 GHz |
| Basic Accuracy | ±0.65% rdg. |
| Body Size | Half-rack, compact |
| Test Head | Palm-sized, cable connection |
| Measurement Methods | RF I-V, frequency sweep, level sweep, time interval |
| Contact Check | DCR test, Hi-Z reject, waveform judgment |
| Comparator Function | PASS/FAIL evaluation |
| Applications | R&D, high-volume production, chip beads, chip inductors |
| Accessories | Test fixture required (IM9201 recommended) |
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