HDO4000A oscilloscopes have 4 analog input channels, 12-bit resolution using Teledyne LeCroy’s HD4096 high-definition technology, up to 1 GHz of bandwidth and a compact form factor with a large 12.1” multi-touch display. They are ideal for debug and troubleshooting of power electronics designs, digital power management or power integrity analysis, automotive electronics systems, and deeply embedded or mechatronic designs.
Analog channel bandwidth: up to 2 Ghz; real-time sampling rate of up to 10 GSa/s
Vertical resolution: 12-bits
Low noise floor: 153 μVrms at full bandwidth of 2 GHz
New generation of high speed display technology:
Waveform capture rates up to 170,000 wfm/s (normal mode), and 750,000 wfm/s (sequence mode)
Supports 256-level intensity grading and color temperature display modes
Memory depth up to 500 Mpts/channel
Digital trigger system
Intelligent trigger: Edge, Slope, Pulse, Window, Runt, Interval, Dropout, Pattern, Qualified, Nth edge, Setup/hold, Delay and Video (HDTV supported)
Serial bus triggering and decoder, supports protocols I2C, SPI, UART, CAN, LIN, CAN FD, FlexRay, I2S, MIL-STD-1553B, SENT and Manchester as standard
Segmented acquisition (Sequence) mode, dividing the maximum record length into multiple segments (up to 80,000), according to trigger conditions set by the user, with a very small dead time between segments to capture the qualifying event
History waveform record (History) function, the maximum recorded waveform length is 80,000 frames
Automatic measurements on 50+ parameters, supports statistics with histogram, track, trend, Gating measurement, and measurements on Math, History, Memory and Ref
4 Math traces (8 Mpts FFT, addition, subtraction, multiplication, division, integration, differential, square root, etc.), supports formula editor
✔ Available in 250 MHz & 350 MHz models
✔ 2, 4, and 8-channel options for multi-signal generation
✔ 16-bit vertical resolution for precise signal emulation
✔ Max sinewave frequency of 250 MHz & 350 MHz
✔ Wave Sequencing for complex test scenarios
✔ Mixed Signal Generation: Supports 8, 16, or 32 synchronized digital channels
✔ True Arbitrary Mode & Direct Digital Synthesis (DDS)
✔ Wideband output voltage window: ±24V (50Ω into High Impedance)
✔ Embedded noise simulation & jitter analysis
✔ Up to 1 Gpts of waveform memory per channel
✔ Seamless integration with LabVIEW™, MATLAB™, Python, and .NET
✔ Multiple Bandwidth Options: 100 MHz, 200 MHz, and 350 MHz
✔ Fast Sampling Rate: Up to 2 GS/s (interleaved) for high-speed signal acquisition
✔ Extended Memory Depth: Up to 28 Mpts per channel for capturing intricate signal variations
✔ Serial Bus Trigger and Decode: Built-in support for I2C, SPI, UART, RS232, CAN, LIN
✔ Waveform Sequence Recorder: Capture and playback up to 80,000 recorded waveforms
✔ Advanced Triggering System: Includes Edge, Slope, Pulse Width, Window, Runt, Interval, and Pattern triggers
✔ Multi-Mode Display: Supports color temperature mapping and intensity grading for signal clarity
✔ MSO Upgrade Option: 16 digital channels available for mixed-signal debugging (on 4-channel models)
✔ Connectivity: USB, LAN, and external trigger output for remote data transfer and PC control
High Bandwidth & Sampling Rate: Models available in 200 MHz, 350 MHz, 500 MHz, and 1 GHz with up to 5 GS/s sample rate.
Deep Memory Capture: Up to 250 Mpts in interleaved mode, allowing detailed waveform analysis.
Advanced Triggering & Waveform Capture: Zone Triggering, History Mode (100,000 waveforms), and a waveform capture rate of 500,000 wfm/s.
Math & Measurement Functions: 9 basic math functions (FFT, addition, subtraction, multiplication, division, etc.) and 50+ automatic measurement parameters.
Bode Plot & Power Analysis: Standard features include Bode Plot for frequency response testing and comprehensive power analysis for applications like power quality assessment, current harmonics, inrush current, and switching loss.
Mixed Signal Debugging: Optional 16-channel MSO capability for digital signal acquisition.
Connectivity & Remote Access: USB, LAN, and embedded web server for remote control and data analysis.
The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.