Products

Key Attributes:

• Frequency Range from 9 kHz up to 13.6 /26.5 GHz
• -165 dBm/Hz Displayed Average Noise Level (Typ.)
• -105 dBc/Hz@1 GHz,10 kHz offset SSB Phase Noise (Typ.)
• 25 MHz/40 MHz Realtime Spectrum Analysis Bandwidth
• Analog Modulation Analysis and Vector Digital Modulation Analysis
• Channel power, ACPR, OBW, Harmonics, and TOI measurement option
• Web Browser for easy Remote Control over LAN

Key Attributes:

• Frequency up to 13.6 GHz / 20 GHz
• 0.001 Hz frequency setting resolution
• Level setting range: -130 dBm ~ 25 dBm
• Phase Noise: -120 dBc / Hz @ 1 GHz, 20 kHz offset (typ.)
• Level error ≤ 0.7 dB (typ.)
• Standard AM & FM & PM & pulse modulation
• Single pulse, double pulse and pulse train generator (option)

Rapid 6.4ms Super Megohm and Low Current Testing

Key Features

• 300 times better noise resistance
• Max. 1000 V output: SM7110
• Max. 2 × 10^19 Ω display
• Min. 0.1 fA resolution
• Built-in EXT I/O, RS-232C, GP-IB and USB
• Flexible, Multipurpose Design, High Resistance
• Meter/Electrometer/Picoammeter/IR Meter
• Measure resistance of materials by combining with optional electrode

Karis SRK Series Server Cabinets are a reliable way to keep sensitive electronics safe. The professional design features a ventilation rate of more than 74%, providing adequate cooling for the entire system. Karis’s server cabinets will make integrating your data center or data closet fast and easy.

• Curved locking front door with ventilation rate above 80%
• Split locking rear door with ventilation rate above 80%
• Horizontally split locking side panels make access easy
• Two heights, two depths, and two widths available
• Rear vertical cable managers (two) include
• Square hole mounting rails are adjustable front to rear
• Grounding kit included
• Levelers and heavy duty casters come standard
• Full range of optional accessories
• 5 year warranty

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Protocol reports
• Generation of waveforms with synchronous data acquisition
• Modular Expandable
• Individual Waveform Generation
• Standard Libraries included
• Unlimited Waveform size
• 2 different Waveforms synchronously
• DLL’s for LabView, Vector CANoe / CAPL, C#, C++, ANSI C, Python, etc.
• Simulation of imported oscilloscope waveform

BOLAB revolutionizes EV testing with powerful, flexible, and modular HV Electric Vehicle Test Systems. These solutions offer high-speed testing, covering diverse profiles and budgets. Features include a modular design, adaptability, and WaveMaster Software for custom waveforms. Benefit from efficiency, precision, and cost-efficiency in EV testing. Discover the future of high-speed testing with BOLAB’s innovative solutions.

• 3 GHz RF Analog Signal Generator
• Extremely fast switching speed of <100μs
• AM, FM, PM Sweep & Pulse Modulation
• Extra small, compact module platform
• Exceptionally Low Phase Noise of -145dBc/Hz @100MHz and 10@kHz offset
• SPI and micro-USB integrated interfaces
• Remotely programmable via MATLAB, Python, LabVIEW
• and other software programming environments.
• Flixible modular platform for OEM and custom requirements
• and applications, to satisfy specific customer demands.
• Multi instrument synchronization capability

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact