Products

TMetrix carries the following test and measurement products:

Showing 65–80 of 347 results


    • Cryogenic Temperaturesy
      • Fully isolated experiment space for true 4K temperatures during probing
      • Cryogenic positioners to provide large travel ranges without warming up the device
    • Low Vibration
      • Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
      • A soft vacuum bellows provides a compliant mounting interface for the cryocooler
    • Configurability
      • Quick release vacuum feedthroughs for easy configurability
      • A large rectangular port for high signal capacity
      • Multiple stage feedthroughs for thermally intercepting the signals
      • Many available system options and add ons to choose from

     

     

    • Low vibration from < 1 Hz to 1 kHz
      • Opposed bellows
      • Passive isolation
      • Active isolation (optional)
    • 4 K platform with quick access
    • 4 K electrical and fiber optic feedthroughs
    • Expandable, modular construction
    • Easy, flexible I/O
      • 8x NW50 flanges below the table
      • 8x HPD standard cable feethrough flanges on 50 K and 3 K plates
      • Cable feedthroughs on base flange above the table
      • Standard ports for DC, RF & optical fibers 8x HPD standard cable
    • Smart controls
      • Pushbutton auto cooldown from atmosphere TCP/IP control
      • Cryogen-free

     

    • FormFactor probe system: T300, TESLA200, T200, EPS150TESLA (others available)
    • Manual, semi-automatic and fully automatic probes station options
    • FormFactor analytical probes: High Voltage Probes, High Current Probes, High-Power Probes
    • I.P.S. “LuPo” High Voltage / High Power Probe Card (optional)
    • Full over temperature measurements and automation from -60°C to +300°C
    • Keysight power device analyzer (PDA): B1505A (others available)
    • Keysight automation and modeling software: EasyEXPERT group+
    • To complete the system: cables, adapters, mounting hardware, etc.

     

  • for 1/f flicker noise, RTN, phase noise, device characterization, and other low-frequency noise measurements

    • FormFactor probe system: CM300xi-ULN, SUMMIT200 (others available)
    • Manual, semi-automatic and fully automatic probes station options
    • FormFactor analytical probes: DCP probes (others available) on manual or motorized positioners
    • FormFactor DC automation software: Autonomous DC Measurement Assistant for unattended probing over temperature on small pads
    • Full over temperature measurements and automation from -60°C to +300°C
    • Keysight advanced low-frequency noise analyzer (A-LFNA): E4727B
    • Keysight automation and modeling software: PathWave WaferPro (WaferPro Express)
    • To complete the system: cables, adapters, mounting hardware, etc.

     

    • FormFactor probe system: CM300xi, SUMMIT200, MPS150 (others available)
    • Manual, semi-automatic and fully automatic probes station options
    • FormFactor analytical probes: RF and DC probes on manual or motorized positioners
    • FormFactor Integrated Single, Dual or 3 sided HexNano Optical Positioning
    • FormFactor photonics automation software: SiPh-Tools and Photonics Controller Interface for automated optical positioner calibrations and control
    • Temperature measurements and automation from -40°C to +125°C
    • Tunable lasers, power meters, and polarization synthesizer: Keysight N7776C, N7778C, N7744C, N7745C, N7786C, N7788C (others available)
    • Modular lasers: Keysight 81606A, 81607A, 81608A and 81602A (others available)
    • Keysight semiconductor parameter analyzer or PXIe SMUs for Optical to Electrical (O-E): B2901A, B1500A, M9601A PXI SMU (others available)
    • Keysight test and automation oftware: Photonics Application Suite (PAS),  PathWave Test Automation with FormFactor Wafer prober plug-in
    • To complete the system: cables, adapters, mounting hardware, etc.

     

    • FormFactor probe system: T300, TESLA200, T200, EPS150TESLA (others available)
    • Manual, semi-automatic and fully automatic probes station options
    • FormFactor analytical probes: High Voltage Probes, High Current Probes, High-Power Probes
    • I.P.S. “LuPo” High Voltage / High Power Probe Card (optional)
    • Full over temperature measurements and automation from -60°C to +300°C
    • Keysight power device analyzer (PDA): B1505A (others available)
    • Keysight automation and modeling software: EasyEXPERT group+
    • To complete the system: cables, adapters, mounting hardware, etc.

     

    • Cryogenic Temperaturesy
      • Fully isolated experiment space for true 4K temperatures during probing
      • Cryogenic positioners to provide large travel ranges without warming up the device
      • Integrated helium pot for high temperature stability of the device under test
      • Fully dry cryogen-free cooler eliminates the need for expensive helium circulation systems
      • Rapid cool liquid nitrogen option for faster cool down times
    • Low Vibration
      • Flexible thermal jumpers to ensure high thermal conductance and low mechanical transmission
      • A soft vacuum bellows provides a compliant mounting interface for the cryocooler
      • Rigid support tube to direct vibrations from the cryocooler away from the sample
    • Configurability
      • Quick release vacuum feedthroughs for easy configurability
      • A large rectangular port for high signal capacity
      • Multiple stage feedthroughs for thermally intercepting the signals
      • Large experimental space provides more workroom and configurable ports
      • Many available system options and add ons to choose from

     

     

     

  • 150 mm modular probe station

    • Ideal for a wide range of applications such as RF, mm-Wave and sub-THz characterization, FA, DWC, MEMS, optoelectronic tests and WL
    • Re-configurable and upgradable as requirements grow
    • Minimizes setup times with no loss in performance or accuracy
    • Seamless integration of various measurement instruments

     

     

    • Lithographic thin-film construction
    • Excellent crosstalk characteristics
    • Non-oxidizing nickel alloy tips
    • Innovative force delivery mechanism
    • 40GHz, 50GHz, 67GHz, 110GHz and 145GHz connectors available
    • GSG, SG, GS, GSGSG, GSSG, SGS configurations
    • 50 to 250 µm pitches (other pitches available on request)
    • High current version (2 A) available

     

  • A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz

    • Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
    • Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
    • Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
    • Durable probe structure ensures more than 250,000 contacts
    • Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications

     

  • Repeatable measurements up to 500 GHz with improved crosstalk performance

    • Probe loss is 3 dB typical between 140 and 200 GHz, S11/S22 15 dB typical
    • Reduced unwanted couplings and transmission modes
    • Able to shrink pad geometries to 25 x 35 µm (best case)
    • Typical contact resistance < 0.05 Ω on Al, < 0.02 Ω on Au
    • WR15, WR12, WR10, WR8, WR6, WR4, WR3, and WR2 bands available.

     

     

  • Next-generation, high-frequency performance with advanced features

    • Continues the Infinity family’s Industry leading electrical performance
    • High temperature capability (175° C +) for automotive device characterization and other applications
    • Better tip visibility for enhanced placement accuracy and repeatability
    • Improved tip life/durability with solid rhodium contacts
    • New tip architecture enables support for narrower pitches (e.g. 25um)
    • Advanced mechanical design combined with small contacts enables probing on smaller pads/pitches and improves durability and robustness

     

  • Test Up to 16 RF Signals with One Probe

    • Ideal for multiport RF/Microwave and high-speed digital signal testing
    • Mix DC and RF/Microwave signals on one probe
    • Long lifetime – typically over one million (1,000,000) touchdowns
    • Excellent performance in temperatures ranging from 10 K to 200°C
    • Probe on any pad material with no damage

     

  • Cost-effective, versatile probe card solution

    • Accommodates a combination of up to four Cascade Microtech probes
    • Configurable for mixed-signal RF/mmW testing
    • Quick and easy repairs to be performed in the field, by simply replacing individual probes
    • Adaptable to new device layouts by exchanging individual probes

     


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