Description
Ultra High Power Probe
|
| Maximum voltage | 10,000 V DC at 200°C, 8,000 V at 300°C |
| Maximum current | 300 A pulse (600 A in a parallel configuration) / 20 A DC |
| Connector type | High-voltage Banana (4 mm) |
| Operating temperature range | -55°C to 300°C |
| Length of cable | 1 m |
| Probe residual resistance | ≤ 5 mΩ |
| Probe insulation resistance | > 10 TΩ at 25ºC (chuck temperature) > 3 TΩ at 200ºC (chuck temperature) > 1 TΩ at 300ºC (chuck temperature) |
| Positioner compatibility | SUMMIT™ RF positioners |
Ultra High-Power (UHP) Key Features
- Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
- Even distribution of high current with innovative multi-fingertip design
- Compatible with Tesla 200/300 mm power device characterization system
- Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
- Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
- Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C).
UHP Probe Tips
| Typical contact resistance on AlSiCu | < 2 mΩ (AlSiCu metal layer) for 12 fingers < 3 mΩ (AlSiCu metal layer) for 8 fingers tip < 6 mΩ (AlSiCu metal layer) for 4 fingers tip < 30 mΩ (AlSiCu metal layer) for 1 fingers tip |
|
| Tip material | Tungsten | |
| Recommended range of overtravel | 125-250 µm | |
| Scrub | ~150 µm (at 300 µm overtravel) | |
| Finger width | Approximately 250 µm | |
| Finger pitch | 650 µm | |
| Probe tip layouts | 12 fingers (300 A) 7400 µm width 8 fingers (200 A) 4800 µm width 4 fingers (100 A) 2200 µm width 1 finger (25 A) 250 µm width |
