Products

• Available in 4.5-digit (60,000 count) and 6.5-digit (2,200,000 count) resolutions.
• Wide measurement range:
  • DC Voltage: Up to 1000V
  • AC Voltage: Up to 750V (True RMS)
  • Current: 10A (AC/DC)
  • Resistance: 100MΩ (2-wire/4-wire)
  • Capacitance: 2nF – 100mF
  • Temperature measurements with TC and RTD sensor support.
• High-speed measurements:
  • T3DMM4-5: 150 readings per second
  • T3DMM6-5: 10,000 readings per second
• Advanced mathematical functions such as Max, Min, Standard Deviation, dBm/dB, Relative Measurement, Pass/Fail Analysis, and Histograms.
• Connectivity: USB Device, USB Host, and LAN for remote operation via SCPI commands.
• Data Storage: 1GB NAND flash memory for saving configuration files and test data.
• Built-in cold junction compensation for accurate temperature measurements.
• File management system supporting U-disc and local storage for convenient data access.
• Comprehensive user interface with a dual-display system for easy navigation.
• Automatic measurement functions, including statistical analysis, gating, and reference functions.

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

3-Channel AC/DC Power Meter for Single-Phase to 3P4W Equipment such as Motors, Inverters, Power Conditioners, and Power Supplies

• Voltage/current/power basic accuracy of ±0.1% *
• Direct input up to 1000 V AC/DC / 65 A
• Harmonic measurement as standard feature, IEC61000-4-7 compliant
• Little instrument loss, even with large currents. DCCT input with an input resistance of 1 mΩ or less.
• Power factor effect of ±0.1% f.s. delivers highly accurate measurements even for no-load testing of transformers with a low power factor
• Measurement of multiple connections in the optimal range for each due to independent ranges for each channel
• Measure up to 5000 A AC with optional current sensor

• On-wafer power device characterization up to 10,000 V DC / 600 A
• Reduced probe and device destruction at high currents up to 20 A DC and 300 A pulse
• Prevent thin wafers from curling and breaking
• Accurate Rds(on) measurement at high current
• Accurate UIS measurements at high temperature
• Roll-out stage for full wafer access and easy wafer loading/unloading
• Seamless integration between Velox and analyzers/measurement software
• High-throughput wafer autoloading (standard, thinned, warped, TAIKO)
• Easy on-screen navigation, wafer mapping, and operation of accessories with Velox

Enabling single-contact high-current/high-voltage test

• Enables coaxial measurements up to 10,000 V and 300 A pulsed (600 A in a parallel configuration) with a single touchdown
• Even distribution of high current with innovative multi-fingertip design
• Compatible with Tesla 200/300 mm power device characterization system
• Reduced measurement time by testing both high-voltage and high-current conditions with a single touchdown
• Accurate characterization of a wide range of pad sizes and test currents, with minimum pad damage and contact resistance
• Safe, reliable and repeatable high-current/voltage measurements over a wide temperature range (from -55°C to +300°C)