Products

Single-phase, 2U, industrial amplifier/battery simulator

• Bench-sized
• Powered from 120V/230VAC
• Source and Sink (4 quadrant)
• Rugged Design
• 3-Year, No-Fault Warranty

Key Performance Capabilities:

• Drop outs and surges as fast as 1.2µs
• Small signal response up to 1 MHz
• 13.5 VDC at up to 28A
• Field-selectable ±40V, 75V or 150V potential

The First Wide-Bandwidth, High-Power Digital Amplifiers

• Max Continuous Output Current: 300A RMS
• Surge Rating: 2X power at up to 400 V_P or 750A
• Apparent Power Rating: Up to 5X continuous power rating atup to 400 V_P or 750A
• Supply Voltage: Three-phase, 208V ±10%, 60A, 50/60 Hz; 400V ±10%, 15A version available.
• Dimensions (HxWxD): 36.5 x 21.0 x 30.75 inches (92.7 x 53.3 x 78.1 cm)
• Weight: Appx. 540 lbs. (244.9 kg)

The CDG 7000 is a new test generator for all standards on immunity to conducted disturbances induced by high-frequency fields – including BCI tests (ISO 11452-4). One of the very few combined IEC 61000-4-6 test systems that contain the RF signal generator, an RF power amplifier, a 3-channel RF voltmeter, and a directional coupler at a very affordable price. IEC 60601-1-2 calling out IEC 61000-4-39 magnetic immunity for close proximity testing requirements can also now be met with the 10 kHz unit.

• Frequency Range:
  • 10 kHz – 30 MHz Conducted
  • 5 MHz – 1GHz Radiated
• Frequency step:
  • 10/500 kHz switchable CE
  • 5/10 MHz switchable RE
• Includes: Generator, antenna, charger, wood case

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• 10 kHz – 3 GHz, 40dB Gain, 5dB N.F.
• Compensation for long cable loss for EMI Measurement
• Improve system noise floor flatness
• High EMI performance
• High linearity LNA for EMI measurement
• High dynamic range
• Unconditionally Stable
• State-of-the-Art Technology

The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

Solutions For:

•  Accurate measurement with tri-axis sensors
• Instant audio and visual alarm
• Robust, reliable and user-friendly
• Covers 5G / 6G bands, measuring up to 71 GHz

User profile:

• Persons working near antennas including installation and maintenance workers, broadcast, PMR and mobile phone operators or regulatory body employees

Measurement capabilities:

• Continuous monitoring of Electromagnetic Field levels with isotropic tri-axis E-field sensors
• EMF Level indicated by a LED color scale
• Audio and visual alarms triggered when EMF exceeds the reference level

• EMI Measurements:
  • FFT-based dual-channel receiver
  • According to CISPR16-1-1
  • Peak, Quasi-Peak, and Average Detectors
  • Resolution Bandwidth Filters of 200 Hz, 9 kHz, and 120 kHz (CISPR), and 1 kHz and 10 kHz (MIL)
  • The fastest receiver in the market: Line and Neutral measurements with the 3 detectors simultaneously (6 simultaneous measurements)

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Protocol reports
• Generation of waveforms with synchronous data acquisition
• Modular Expandable
• Individual Waveform Generation
• Standard Libraries included
• Unlimited Waveform size
• 2 different Waveforms synchronously
• DLL’s for LabView, Vector CANoe / CAPL, C#, C++, ANSI C, Python, etc.
• Simulation of imported oscilloscope waveform

BOLAB revolutionizes EV testing with powerful, flexible, and modular HV Electric Vehicle Test Systems. These solutions offer high-speed testing, covering diverse profiles and budgets. Features include a modular design, adaptability, and WaveMaster Software for custom waveforms. Benefit from efficiency, precision, and cost-efficiency in EV testing. Discover the future of high-speed testing with BOLAB’s innovative solutions.

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact