Products

The CDG 7000 is a new test generator for all standards on immunity to conducted disturbances induced by high-frequency fields – including BCI tests (ISO 11452-4). One of the very few combined IEC 61000-4-6 test systems that contain the RF signal generator, an RF power amplifier, a 3-channel RF voltmeter, and a directional coupler at a very affordable price. IEC 60601-1-2 calling out IEC 61000-4-39 magnetic immunity for close proximity testing requirements can also now be met with the 10 kHz unit.

• Frequency Range:
  • 10 kHz – 30 MHz Conducted
  • 5 MHz – 1GHz Radiated
• Frequency step:
  • 10/500 kHz switchable CE
  • 5/10 MHz switchable RE
• Includes: Generator, antenna, charger, wood case

• 10 kHz – 3 GHz, 40dB Gain, 5dB N.F.
• Compensation for long cable loss for EMI Measurement
• Improve system noise floor flatness
• High EMI performance
• High linearity LNA for EMI measurement
• High dynamic range
• Unconditionally Stable
• State-of-the-Art Technology

• EMI Measurements:
  • FFT-based dual-channel receiver
  • According to CISPR16-1-1
  • Peak, Quasi-Peak, and Average Detectors
  • Resolution Bandwidth Filters of 200 Hz, 9 kHz, and 120 kHz (CISPR), and 1 kHz and 10 kHz (MIL)
  • The fastest receiver in the market: Line and Neutral measurements with the 3 detectors simultaneously (6 simultaneous measurements)

• High Power: Ranging from  750W to 15kW.
• User-Friendly: Easy connections via LAN (LXI 1.5), USB (2.0), RS-232/RS-485.
• Safe & Certified: CE/UKCA marked with built-in safety.
• Versatile: Ideal for various industries.
• Warranty: 5 years.

• Optional Interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA (IS420)
• Output Power Levels: 1kW to 15kW, low-noise performance
• Output Voltage/Current: Up to 1500V and 1500A
• AC Input Options: Single-phase and three-phase with Active Power Factor Correction
• Mechanical Options: Blank Front Panel, Air Filter Kits, Parallel Kits
• Certifications: CE/UKCA Marked, UL/cUL/IEC/EN 61010-1
• Warranty: 5 years

• High power density, lightweight, and portable
• Output power: 30kW, 45kW, 60kW; Output voltages: 10V to 600V
• Advanced features: Programmable V/I Slew-Rate, Constant-Power Limit, Arbitrary Waveform Generator
• Built-in interfaces: LAN (LXI 1.5), USB (2.0), RS-232/RS-485, Isolated Analog (5V/10V)
• Optional interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA
• CE and UKCA marked, worldwide safety approvals, 5-year warranty

• Compact, air-cooled OEM style
• Superior pulse repeatability
• Simple parallel operation for higher power
• Optional Active PFC (pf = 0.98)
• Full remote control interface
• High EMI-RFI immunity

• Advanced semiconductor technology
• High-quality construction
• Rapid capacitor and pulse-forming network charging
• Compact and lightweight design
• Simple parallel operation for higher power needs
• Compatible with worldwide input voltages and frequencies
• Fully adjustable output voltage
• Comprehensive remote control interface

• High-Speed Current Control: No dynamic overshoot or oscillation
• High Slew-Rate: Up to 30A/*s for fast load changes
• Low Voltage Operation: Stable operation with no turn-on delay
• Multi-Functional: Seven load modes and four operating modes
• Parallel Operation: Up to 10kW with 10 units
• User-Friendly Interface: Built-in USB and optional IEEE interfaces
• Compliance: EN61010-1 compliant with a two-year warranty

HDO4000A oscilloscopes have 4 analog input channels, 12-bit resolution using Teledyne LeCroy’s HD4096 high-definition technology, up to 1 GHz of bandwidth and a compact form factor with a large 12.1” multi-touch display. They are ideal for debug and troubleshooting of power electronics designs, digital power management or power integrity analysis, automotive electronics systems, and deeply embedded or mechatronic designs.

The WaveSurfer 3000z has a 10.1″ capacitive touch display, the longest memory, and the deepest toolbox – all at an affordable price.

• HD4096 technology provides 12-bit resolution all the time
• 2ProBus input supports over 30 probes in 9 product categories
• 3Long record capture of up to 25 Mpts
• 412.1” 1280 x 800 HD capacitive touchscreen
• 5Mixed-signal capability – debug complex embedded designs with integrated 16-channel mixed signal option
• 6Easy connectivity with 2 USB 3.1 ports
• 7MAUI with OneTouch user interface for intuitive and efficient operation

• 15.6″ 1920 x 1080 capacitive touchscreen display
• 24 analog input channels
• 3ProBus input supports every Teledyne LeCroy probe
• 4MAUI with OneTouch user interface for intuitive and efficient operation
• 5Q-Scape multi-tab display architecture
• 6Up to 250 Mpts of acquisition memory
• 7HD4096 technology – 12 bits all the time
• 8Buttons/indicators color-coded to associated waveform on display
• 9Use cursors and adjust settings without opening a menu
• 10Mixed Signal capability with 16 integrated digital channels
• 116 USB 3.1 ports (2 front, 4 side)

• HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
• Up to 5 Gpts of acquisition memory enables detailed viewing of long events
• 15.6” 1900 x 1080 Full HD capacitive touchscreen
• ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
• MAUI with OneTouch user interface for intuitive and efficient operation
• Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
• Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
• Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
• Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
• Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

• Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
• Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
• Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
• Time interval error (TIE) jitter track analysis
• Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
• Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
• Jitter measurements table with full details for one or more “lanes” plus reference