Products

The CDG 7000 is a new test generator for all standards on immunity to conducted disturbances induced by high-frequency fields – including BCI tests (ISO 11452-4). One of the very few combined IEC 61000-4-6 test systems that contain the RF signal generator, an RF power amplifier, a 3-channel RF voltmeter, and a directional coupler at a very affordable price. IEC 60601-1-2 calling out IEC 61000-4-39 magnetic immunity for close proximity testing requirements can also now be met with the 10 kHz unit.

• Frequency Range:
  • 10 kHz – 30 MHz Conducted
  • 5 MHz – 1GHz Radiated
• Frequency step:
  • 10/500 kHz switchable CE
  • 5/10 MHz switchable RE
• Includes: Generator, antenna, charger, wood case

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• 10 kHz – 3 GHz, 40dB Gain, 5dB N.F.
• Compensation for long cable loss for EMI Measurement
• Improve system noise floor flatness
• High EMI performance
• High linearity LNA for EMI measurement
• High dynamic range
• Unconditionally Stable
• State-of-the-Art Technology

• EMI Measurements:
  • FFT-based dual-channel receiver
  • According to CISPR16-1-1
  • Peak, Quasi-Peak, and Average Detectors
  • Resolution Bandwidth Filters of 200 Hz, 9 kHz, and 120 kHz (CISPR), and 1 kHz and 10 kHz (MIL)
  • The fastest receiver in the market: Line and Neutral measurements with the 3 detectors simultaneously (6 simultaneous measurements)

The EMI 64k software allows to embed the TDEMI systems in a fully automated test environment.

• Full automation of EMI testing according to all commercial and military standards
• Automated control of turntable, antenna and other equipment
• Height and Angular Scan
• Procedures according to standards as well as customized procedures
• Reducing the cost for EMC and communication testing and certification by tailored packages

The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

• Frequency Range  1 Hz – 30MHz, 1GHz, 3GHz, 6GHz, 9GHz, 18GHz, 26GHz, 40 GHz and 44GHz
• 225 MHz Real-time Analysis Bandwidth
• Weighted Real-time Spectrogram up to 44 GHz
• CISPR Bandwidths 200 Hz, 9 kHz, 120 kHz, 1 MHz
• MIL/DO Bandwidths 10 Hz, 100 Hz, 1 kHz, 10 kHz, 100 kHz, 1 MHz

The measurement system for all emission measurments in the frequency range 1 Hz – 44 GHz.

• Full compliance EMI Reciever according to standard CISPR 16-1· 1, ANSI C63.2, MIL->461, and DO·160
• Spectrum Analyzer
• Integrated LOW Noise Ampllfier (lNAI)
• Integrated Preselect1on
• Tradttional and FFT·based Mode
• Automatic Stepped Attenuator
• Ultra Low Noise Floor
• Excellent spurious Performance
• Real-time Spectrum Analyzer optional
• Vast IQ-Bandwidth

TDEMI Mobile+. The ultra mobile EMI receiver – Emission measurements everytime, everywhere. Fully stand-alone operable.

• Frequency Ranges 10Hz – 1GHz, 3GHz, 6GHz or 7GHz
• 16000x faster than conventional receivers
• Super compact design and 12V supply
• 225 MHz fully gapless real-time analysis bandwidth
• Weighted Real-time Spectrogram

Ultra High Performance RT Spectrum Analyzer. Ultrafast EMI Measurements.

• Frequency Range from 1 Hz up to 50 GHz
• 225 MHz Real-time analysis bandwidth
• 100 dB Dynamic Range
• Ultrahigh performance preselection in all modes
• Up to 510 MHz Real-time IQ-Analysis bandwidth
• Ultra High Performance Spectrum Analyzer

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Protocol reports
• Generation of waveforms with synchronous data acquisition
• Modular Expandable
• Individual Waveform Generation
• Standard Libraries included
• Unlimited Waveform size
• 2 different Waveforms synchronously
• DLL’s for LabView, Vector CANoe / CAPL, C#, C++, ANSI C, Python, etc.
• Simulation of imported oscilloscope waveform

BOLAB revolutionizes EV testing with powerful, flexible, and modular HV Electric Vehicle Test Systems. These solutions offer high-speed testing, covering diverse profiles and budgets. Features include a modular design, adaptability, and WaveMaster Software for custom waveforms. Benefit from efficiency, precision, and cost-efficiency in EV testing. Discover the future of high-speed testing with BOLAB’s innovative solutions.

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact