Engineered for precision and safety, the EPS150TESLA delivers accurate on-wafer power device characterization up to 3,000 V and 100 A, making it a trusted choice for high-voltage and high-current testing.
Key Features:
- On-wafer power device characterization up to 3,000 V (triaxial) / 10,000 V (optional coaxial).
- High-current probing up to 100 A with ultra-low contact resistance.
- Triax chuck design for accurate low-leakage measurements.
- Shielded test environment with advanced grounding and arcing protection.
- Seamless integration with analyzers via SIGMA kit and optimized signal path.
- Safe probe tip exchange and thin-wafer handling capability.