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    • Versatile Current Sensing: Accurately measure small and large currents, from sub-milliamp levels to thousands of amps.
    • High-Speed Pulse Monitoring: Patented distributed termination technology enables ultra-fast rise time measurement (as short as 2ns).
    • Enhanced Noise Immunity & Safety: Double shielding minimizes external noise, making these monitors ideal for high-voltage applications.
    • Robust Construction: Sealed models are suitable for high-voltage insulating oil or vacuum environments.
    • Broad Compatibility: Works with oscilloscopes, spectrum analyzers, power analyzers, digital voltmeters, ADCs, and more.

     

  • High-Precision Current Measurement with BNC Connectivity

    • Precision Current Sensing: ±1% accuracy ensures reliable real-time current monitoring.
    • BNC Connector for Seamless Connectivity: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
    • Clamp-On Design for Non-Intrusive Measurement: Safely monitor live current flow without circuit disruption.
    • 50 Ohm Termination Compatible: Output reduces by half when using a 50Ω termination.
    • High-Voltage Safety Considerations: Conductive case requires adequate insulation for user safety.

     

  • High-Precision Current Sensing with BNC Connectivity

    • High-Precision Measurement: ±1% accuracy for reliable current sensing.
    • Customizable Configurations: Designed to meet specific user requirements for precision measurement.
    • BNC Connector for Easy Integration: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
    • Non-Insulated Conductive Case: Proper insulation must be provided on the monitored conductor.
    • 50 Ohm Termination Compatibility: Using a 50Ω termination reduces the output to half.

     

  • High-Precision Voltage Measurement Up to 500kV

    • High-Voltage Measurement Capability: Supports up to 500kV in insulating oil and customizable calibration for air use.
    • Precision Division Ratios: Models with 5000:1, 10,000:1, and custom ratios, ensuring reliable voltage scaling.
    • Temperature-Compensated Accuracy: ±1% over 20°C to 80°C, providing stable voltage readings.
    • Robust Design for Harsh Environments: Sealed for high-voltage insulating oil use, with custom air calibration available.
    • Safe Operation with Ground Loop Control: The outer conductor is isolated from the case, allowing controlled grounding connections.

     

  • Precision Pulse Output Up to 500kV

    • Wide Voltage Range: Supports 100kV to 500kV pulse outputs for high-energy applications.
    • Fast Pulse Transmission: Pulse durations from 0.25 to 50 microseconds, ensuring efficient energy transfer.
    • Insulating Oil Immersion: Open-construction design for operation in high-voltage insulating oil, reducing breakdown risks.
    • Advanced Overvoltage Protection: Designed with built-in safety factors (50-100%) to prevent damage from overvoltages.
    • Reliable Flashover Protection: Corona ring-to-core insulation prevents damage from accidental flashovers.

     

  • Single-phase, 2U, industrial amplifier/battery simulator

    • Bench-sized
    • Powered from 120V/230VAC
    • Source and Sink (4 quadrant)
    • Rugged Design
    • 3-Year, No-Fault Warranty

    Key Performance Capabilities:

    • Drop outs and surges as fast as 1.2µs
    • Small signal response up to 1 MHz
    • 13.5 VDC at up to 28A
    • Field-selectable ±40V, 75V or 150V potential

     

  • The First Wide-Bandwidth, High-Power Digital Amplifiers

    • Max Continuous Output Current: 300A RMS
    • Surge Rating: 2X power at up to 400 VP or 750A
    • Apparent Power Rating: Up to 5X continuous power rating atup to 400 VP or 750A
    • Supply Voltage: Three-phase, 208V ±10%, 60A, 50/60 Hz; 400V ±10%, 15A version available.
    • Dimensions (HxWxD): 36.5 x 21.0 x 30.75 inches (92.7 x 53.3 x 78.1 cm)
    • Weight: Appx. 540 lbs. (244.9 kg)

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

     

  • The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

     

  • Solutions For:

    •  Accurate measurement with tri-axis sensors
    • Instant audio and visual alarm
    • Robust, reliable and user-friendly
    • Covers 5G / 6G bands, measuring up to 71 GHz

    User profile:

    • Persons working near antennas including installation and maintenance workers, broadcast, PMR and mobile phone operators or regulatory body employees

    Measurement capabilities:

    • Continuous monitoring of Electromagnetic Field levels with isotropic tri-axis E-field sensors
    • EMF Level indicated by a LED color scale
    • Audio and visual alarms triggered when EMF exceeds the reference level
  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

  • Genius Education Kits Overview