Products

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

Solutions For:

•  Accurate measurement with tri-axis sensors
• Instant audio and visual alarm
• Robust, reliable and user-friendly
• Covers 5G / 6G bands, measuring up to 71 GHz

User profile:

• Persons working near antennas including installation and maintenance workers, broadcast, PMR and mobile phone operators or regulatory body employees

Measurement capabilities:

• Continuous monitoring of Electromagnetic Field levels with isotropic tri-axis E-field sensors
• EMF Level indicated by a LED color scale
• Audio and visual alarms triggered when EMF exceeds the reference level

• Reliable and Repeatable solid state signal generation
• Standard Internal/external pulse modulation
• USB/Ethernet Control
• 10 MHz external or internal reference
• 100 Hz Frequency Resolution
• Easily portable
• Sized to fit into a single rack unit for ATE applications

• Reliable and Repeatable solid state digital attenuation
• Includes GUI, Windows and Linux SDK, LabVIEW driver
• Programmable attenuation ramp and fading profiles
• Operate multiple devices directly from a PC or self-powered hub
• Easily portable USB powered device
• USB and Ethernet control interfaces

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Customizable & savable test setups
• Program & Datalog Storage
• User Defined Temperature Limits
• Local & Remote Operations
• LabView™ drivers
• IEEE-488, RS232 ports

• 20 Amp Operation: Full performance with 20 amp service
• Automatic Power Reduction: Reduces power usage during idle periods
• Heat Only Mode: Reduces power usage when cold temperatures are not used
• WhisperStream Technology: quieter, smooth-sounding operation, 56 dBA
• Frost Free Test Environment: dry air purge for tester interface, prevents condensation:
  0.5 to 3scfm (0.25 to 1.5 l/s)
• Heated Defrost: quickly removes moisture buildup from internal chiller
• DUT Temperature Control : Proprietary control algorithm enables DUT temperature to be directly controlled
• Transition Rate*
  -55 to +125°C, approx. 10 seconds
  125 to -55°C, approx. 10 seconds
• System Airflow Output*
  4 to 18scfm (1.9 to 8.5 l/s) Continuous
• Temperature Range*
  -80 to +225°C (60Hz) No LN2 or LCO2 Required

• High reliability thermal cycling without thermoelectric modules
• Temperature range: -65 to 175°C
• Cooling power:
  • 40W at -40°C for lower power devices
  • 55W at -55°C and 120W at -40°C.
• Transition rate: up to <35 sec over 25 to -40°C
• Easy and secure thermal connection to in-circuit or test socked DUT
• Touch-screen controller: user-programmable temperatures, graphing, data logging
• Communications options: Ethernet, USB, IEEE, RS232

-60° to +200°C

• Economy model with high thermal capacity
• Precise temperatures with fast transitions from -60 to 200°C
• No annual leak testing required per EU 517/2014 F-Gas Regulation
• Effective testing and conditioning of electronic components, boards, and modules
• Available for 50 and 60Hz operation
• No need for Liquid Nitrogen (LN2) or Liquid Carbon Dioxide (LCO2)
• Remote communications and set up and touch screen operation
• User Defined Temperature Limits

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel