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  • Featuring an ultra-compact 0.35”microLED display with high-brightnessand high-resolution technology,delivering dynamic visuals and seamlessintegration for next-generationautomotive heads-up display (HUD).

    Key Features of High Brightness High Resolution 0.35″ Micro-Display:

    • OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellent visibility inboth indoor and outdoor environments.
    • Robust Durability: Built to withstand demandingconditions for long-term reliability.
    • Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
    • Power-Efficient Design: Consumes significantly less powercompared to traditional display technologies, extendingbattery life for wearable devices.

     

  • Showcasing a large 10” panel withultra-bright, energy-efficientmicroLED technology, deliveringdynamic visuals and seamlessintegration for next-generationintelligent vehicles.

    Ket Features:

    • OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellent visibility inboth indoor and outdoor environments.
    • Robust Durability: Built to withstand demandingconditions for long-term reliability.
    • Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
    • Vibrant RGB Color Reproduction: Delivers rich, high-contrast visuals with precise color accuracy, enhancingvisuals for display applications.

     

  • Advancing automotive displayswith ultra-bright, energy-efficientmicroLED technology, enablingdynamic visuals and seamlessintegration for next-generationintelligent vehicles.

    Key Features:

    • OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellent visibility inboth indoor and outdoor environments.
    • Robust Durability: Built to withstand demandingconditions for long-term reliability.
    • Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
    • Vibrant RGB Color Reproduction: Delivers rich, high-contrast visuals with precise color accuracy, enhancingvisuals for display applications.

     

  • Revolutionizing automotivelighting with ultra-bright, energy-efficient microLED displays,enabling adaptive illuminationand seamless integration for next-generation intelligent vehicles.

    Key Features:

    • OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellent visibility inboth indoor and outdoor environments.
    • Robust Durability: Built to withstand demandingconditions for long-term reliability.
    • Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
    • Segment-Driven Intelligence: Enables optimal messagingthrough precisely controlled lighting segments, enhancingintelligent lighting capabilities for smart automotiveapplications and other high-performance devices.

     

  • Transforming automotive lightingwith ultra-bright, energy-efficientmicroLED displays, deliveringprecision illumination andseamless integration for next-generation vehicles.

    Key Features:

    • OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellentvisibility in both indoor and outdoor environments.
    • Robust Durability: Built to withstand demandingconditions for long-term reliability.
    • Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
    • Power-Efficient Design: Consumes significantly lesspower compared to traditional display technologies.

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Highly Damped Step Respond
    • Simple installation – No tuning require
    • Application-specific designs/products/
    • Capabilities to meet your needs
    • Ability to support massive machines, tools, systems

     

    • 6 degrees of freedom
    • Active gain starting from 0.5Hz
    • Variable Damping (patent pending)
    • Build In Artificial Intelligence Feature
    • Adjustable by software active bandwidth
    • Remote control
    • Built in real time diagnostic tools
      • Spectrum analyzer
      • Oscilloscope
    • Shaker Mode

     

    • 6 degrees of freedom
    • Active gain starting from 0.5Hz
    • Variable Damping (patent pending)
    • Build In Artificial Intelligence Feature
    • Adjustable by software active bandwidth
    • Remote control
    • Built in real time diagnostic tools
      • Spectrum analyzer
      • Oscilloscope
    • Shaker Mode

     

    • Highly Damped Step Respond
    • Simple installation – No tuning require
    • Application-specific designs/products/
    • Capabilities to meet your needs
    • Ability to support massive machines, tools, systems

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel