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  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

     

  • The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

     

  • Solutions For:

    •  Accurate measurement with tri-axis sensors
    • Instant audio and visual alarm
    • Robust, reliable and user-friendly
    • Covers 5G / 6G bands, measuring up to 71 GHz

    User profile:

    • Persons working near antennas including installation and maintenance workers, broadcast, PMR and mobile phone operators or regulatory body employees

    Measurement capabilities:

    • Continuous monitoring of Electromagnetic Field levels with isotropic tri-axis E-field sensors
    • EMF Level indicated by a LED color scale
    • Audio and visual alarms triggered when EMF exceeds the reference level
    • High Power: Ranging from  750W to 15kW.
    • User-Friendly: Easy connections via LAN (LXI 1.5), USB (2.0), RS-232/RS-485.
    • Safe & Certified: CE/UKCA marked with built-in safety.
    • Versatile: Ideal for various industries.
    • Warranty: 5 years.

     

    • Optional Interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA (IS420)
    • Output Power Levels: 1kW to 15kW, low-noise performance
    • Output Voltage/Current: Up to 1500V and 1500A
    • AC Input Options: Single-phase and three-phase with Active Power Factor Correction
    • Mechanical Options: Blank Front Panel, Air Filter Kits, Parallel Kits
    • Certifications: CE/UKCA Marked, UL/cUL/IEC/EN 61010-1
    • Warranty: 5 years

     

    • High power density, lightweight, and portable
    • Output power: 30kW, 45kW, 60kW; Output voltages: 10V to 600V
    • Advanced features: Programmable V/I Slew-Rate, Constant-Power Limit, Arbitrary Waveform Generator
    • Built-in interfaces: LAN (LXI 1.5), USB (2.0), RS-232/RS-485, Isolated Analog (5V/10V)
    • Optional interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA
    • CE and UKCA marked, worldwide safety approvals, 5-year warranty

     

     

    • Compact, air-cooled OEM style
    • Superior pulse repeatability
    • Simple parallel operation for higher power
    • Optional Active PFC (pf = 0.98)
    • Full remote control interface
    • High EMI-RFI immunity

     

    • Advanced semiconductor technology
    • High-quality construction
    • Rapid capacitor and pulse-forming network charging
    • Compact and lightweight design
    • Simple parallel operation for higher power needs
    • Compatible with worldwide input voltages and frequencies
    • Fully adjustable output voltage
    • Comprehensive remote control interface

     

  • High-Speed Current Control: No dynamic overshoot or oscillation
    High Slew-Rate: Up to 30A/*s for fast load changes
    Low Voltage Operation: Stable operation with no turn-on delay
    Multi-Functional: Seven load modes and four operating modes
    Parallel Operation: Up to 10kW with 10 units
    User-Friendly Interface: Built-in USB and optional IEEE interfaces
    Compliance: EN61010-1 compliant with a two-year warranty

  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

    • Re-configurable for DC, RF, mmW, FA, WLR and more
    • table and repeatable measurements over a wide thermal range
    • Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
    • Minimize AC and spectral noise
    • Manual 3-axis stage with ergonomic controls
    • Fast, accurate “hands on” wafer positioning
    • Quick, safe, and comfortable wafer access

     

    • Comfortable and ergonomic operation
    • Thermal range ambient to +300°C
    • RF/microwave device characterization, FA and design debug
    • Seamless integration between Velox and analyzers/measurement software
    • Complete solutions using probe positioners and probe cards
    • Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
    • Shortest signal path test integration for accurate, thermally stable, and low-error data collection
    • Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
    • Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
    • Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel