Products

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• Reliable and Repeatable solid state signal generation
• Standard Internal/external pulse modulation
• USB/Ethernet Control
• 10 MHz external or internal reference
• 100 Hz Frequency Resolution
• Easily portable
• Sized to fit into a single rack unit for ATE applications

• Reliable and Repeatable solid state digital attenuation
• Includes GUI, Windows and Linux SDK, LabVIEW driver
• Programmable attenuation ramp and fading profiles
• Operate multiple devices directly from a PC or self-powered hub
• Easily portable USB powered device
• USB and Ethernet control interfaces

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Customizable & savable test setups
• Program & Datalog Storage
• User Defined Temperature Limits
• Local & Remote Operations
• LabView™ drivers
• IEEE-488, RS232 ports

• 20 Amp Operation: Full performance with 20 amp service
• Automatic Power Reduction: Reduces power usage during idle periods
• Heat Only Mode: Reduces power usage when cold temperatures are not used
• WhisperStream Technology: quieter, smooth-sounding operation, 56 dBA
• Frost Free Test Environment: dry air purge for tester interface, prevents condensation:
  0.5 to 3scfm (0.25 to 1.5 l/s)
• Heated Defrost: quickly removes moisture buildup from internal chiller
• DUT Temperature Control : Proprietary control algorithm enables DUT temperature to be directly controlled
• Transition Rate*
  -55 to +125°C, approx. 10 seconds
  125 to -55°C, approx. 10 seconds
• System Airflow Output*
  4 to 18scfm (1.9 to 8.5 l/s) Continuous
• Temperature Range*
  -80 to +225°C (60Hz) No LN2 or LCO2 Required

• High reliability thermal cycling without thermoelectric modules
• Temperature range: -65 to 175°C
• Cooling power:
  • 40W at -40°C for lower power devices
  • 55W at -55°C and 120W at -40°C.
• Transition rate: up to <35 sec over 25 to -40°C
• Easy and secure thermal connection to in-circuit or test socked DUT
• Touch-screen controller: user-programmable temperatures, graphing, data logging
• Communications options: Ethernet, USB, IEEE, RS232

-60° to +200°C

• Economy model with high thermal capacity
• Precise temperatures with fast transitions from -60 to 200°C
• No annual leak testing required per EU 517/2014 F-Gas Regulation
• Effective testing and conditioning of electronic components, boards, and modules
• Available for 50 and 60Hz operation
• No need for Liquid Nitrogen (LN2) or Liquid Carbon Dioxide (LCO2)
• Remote communications and set up and touch screen operation
• User Defined Temperature Limits

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

Contact Intelligence

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.