Products

The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

• High Power: Ranging from  750W to 15kW.
• User-Friendly: Easy connections via LAN (LXI 1.5), USB (2.0), RS-232/RS-485.
• Safe & Certified: CE/UKCA marked with built-in safety.
• Versatile: Ideal for various industries.
• Warranty: 5 years.

• Optional Interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA (IS420)
• Output Power Levels: 1kW to 15kW, low-noise performance
• Output Voltage/Current: Up to 1500V and 1500A
• AC Input Options: Single-phase and three-phase with Active Power Factor Correction
• Mechanical Options: Blank Front Panel, Air Filter Kits, Parallel Kits
• Certifications: CE/UKCA Marked, UL/cUL/IEC/EN 61010-1
• Warranty: 5 years

• High power density, lightweight, and portable
• Output power: 30kW, 45kW, 60kW; Output voltages: 10V to 600V
• Advanced features: Programmable V/I Slew-Rate, Constant-Power Limit, Arbitrary Waveform Generator
• Built-in interfaces: LAN (LXI 1.5), USB (2.0), RS-232/RS-485, Isolated Analog (5V/10V)
• Optional interfaces: IEEE, EtherCAT, Modbus-TCP, Isolated Analog 4-20mA
• CE and UKCA marked, worldwide safety approvals, 5-year warranty

• Compact, air-cooled OEM style
• Superior pulse repeatability
• Simple parallel operation for higher power
• Optional Active PFC (pf = 0.98)
• Full remote control interface
• High EMI-RFI immunity

• Advanced semiconductor technology
• High-quality construction
• Rapid capacitor and pulse-forming network charging
• Compact and lightweight design
• Simple parallel operation for higher power needs
• Compatible with worldwide input voltages and frequencies
• Fully adjustable output voltage
• Comprehensive remote control interface

• High-Speed Current Control: No dynamic overshoot or oscillation
• High Slew-Rate: Up to 30A/*s for fast load changes
• Low Voltage Operation: Stable operation with no turn-on delay
• Multi-Functional: Seven load modes and four operating modes
• Parallel Operation: Up to 10kW with 10 units
• User-Friendly Interface: Built-in USB and optional IEEE interfaces
• Compliance: EN61010-1 compliant with a two-year warranty

The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

• Vector Network Analyzer (option up to 26.5GHz)
• WinCal XE calibration software
• Uses best measurement practices for optimized measurements
• Known measurement accuracy traced back to independent standards
• Supported by the measurement experts to make you successful
• Best in class RF performance
• Small benchtop footprint
• Industry standard calibration techniques
• Extended 2 Year warranty on FormFactor products for educational customers

• Re-configurable for DC, RF, mmW, FA, WLR and more
• table and repeatable measurements over a wide thermal range
• Moisture-free, light-tight and EMI-shielded test environment with MicroChamber® technology
• Minimize AC and spectral noise
• Manual 3-axis stage with ergonomic controls
• Fast, accurate “hands on” wafer positioning
• Quick, safe, and comfortable wafer access

• Comfortable and ergonomic operation
• Thermal range ambient to +300°C
• RF/microwave device characterization, FA and design debug
• Seamless integration between Velox and analyzers/measurement software
• Complete solutions using probe positioners and probe cards
• Achieve unsurpassed RF/mmW measurement and calibration accuracy with integrated RF tools and WinCal
• Shortest signal path test integration for accurate, thermally stable, and low-error data collection
• Powerful automation tools, reduce total test time on wafers, singulated dies, and modules
• Faster time to first data for standard and “hard to test” devices such as thin wafer, small pad and high power
• Advanced 4-axis semi-automatic stage for accurate positioning and repeatable probe-to-pad contact

Genius Education Kits Overview

• Probe station
• Keysight Streamline Vector Network Analyzer (option up to 53 GHz)
• Choice of probes
• WinCal XE calibration software
• Extended 2 Year warranty on FormFactor products for educational customers
• Optional laptop

• Flexibility
  • Temperatures range from -60°C to +300°C
  • Surfaces are nickel or gold-plated
  • Hybrid chuck design – operation with and without cooling unit
  • Field-upgradeable: On-site cold upgrades for all main prober platforms
• Highest Efficiency for Reduced Cost of Test
  • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
  • Up to 15% faster transition times than other systems on the market
• Low Thermal Resistance
  • Low Thermal Resistance Technology
  • MultiSense with multiple temperature sensors
  • Best temperature accuracy and uniformity
• Superior Electrical Performance
  • Isolated from ground
  • Includes a jack for grounding and biasing
  • Highly planar chuck surface for consistant contact force and overtravel

PureLine 3 Technology

First automated probe station to achieve -190dB spectral noise*

Plug In and Go

Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

Autonomous 24/7 Operation

Up to 4x faster flicker noise thermal testing on 30 μm pads

Reduce Setup Time and Costs
Exclusive low noise site survey, and system verification services

• Quick and easy probe tip navigation
• Maximizes field-of-view
• High magnification
• Shadow-free view of the corresponding features
• Automatically configure and optimize performance
• cTUVus certified and CE
• Compatible with TopHat for perfect shielding
• 24/7 operating, Increased MTBF
• Stops all system motion and warns of unobserved contact

Contact Intelligence

• Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
• Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
• Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.