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Teledyne LeCroy

Teledyne LeCroy is a leading manufacturer of advanced oscilloscopes, protocol analyzers, and other test instruments that verify performance, validate compliance, and debug complex electronic systems quickly and thoroughly. Since its founding in 1964, the Company has focused on incorporating powerful tools into innovative products that enhance “Time-to-Insight”​. Faster time to insight enables users to rapidly find and fix defects in complex electronic systems, dramatically improving time-to-market for a wide variety of applications and end markets. Teledyne LeCroy is based in Chestnut Ridge, N.Y.

  • Teledyne LeCroy WavePro HD Oscilloscopes
    Teledyne LeCroy WavePro HD Oscilloscopes
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    Teledyne LeCroy Teledyne LeCroy WavePro HD Oscilloscopes
    • HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
    • Up to 5 Gpts of acquisition memory enables detailed viewing of long events
    • 15.6” 1900 x 1080 Full HD capacitive touchscreen
    • ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
    • MAUI with OneTouch user interface for intuitive and efficient operation
    • Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
    • Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
    • Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
    • Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
    • Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

     

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  • WaveMaster 8 Zi-B Oscilloscopes
    WaveMaster 8 Zi-B Oscilloscopes
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    Teledyne LeCroy Teledyne LeCroy WaveMaster 8 Zi-B Oscilloscopes
    • Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
    • Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
    • Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
    • Time interval error (TIE) jitter track analysis
    • Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
    • Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
    • Jitter measurements table with full details for one or more “lanes” plus reference

     

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