Teledyne LeCroy

Teledyne Test Tools LCR Meters offer precision testing in a compact form, perfect for R&D labs and production lines.

Key Features:

• 3.5” high-resolution color LCD display
• Test frequency up to 300 kHz with continuous output
• 0.05% basic measurement accuracy
• Spot or full frequency range with OPEN/SHORT correction
• Automatic Level Control (ALC) for consistent voltage on components like MLCCs
• Measure up to 4 parameters simultaneously
• DCR measurement & built-in ±2.5 V DC bias
• PASS/FAIL indicator and 10-bin sorting function
• List measurement for automated test sweeps (up to 10 points)
• Interfaces: RS-232C, USB, handler, and USB storage
• Compact 2U, 1/2 rack size for automated test setups

• HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
• Up to 5 Gpts of acquisition memory enables detailed viewing of long events
• 15.6” 1900 x 1080 Full HD capacitive touchscreen
• ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
• MAUI with OneTouch user interface for intuitive and efficient operation
• Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
• Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
• Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
• Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
• Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

• Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
• Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
• Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
• Time interval error (TIE) jitter track analysis
• Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
• Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
• Jitter measurements table with full details for one or more “lanes” plus reference