Teledyne LeCroy

The Teledyne T3SA Series Spectrum Analyzers deliver high-performance signal analysis from 9 kHz to 3.2 GHz in a compact, easy-to-use design. Ideal for R&D, education, production, and pre-compliance testing, it features a large touchscreen and advanced digital IF technology.

Key Features:

• All Digital IF technology10.1”
• WVGA (1024 x 600) touchscreen display
• Frequency range from 9 kHz to 3.2 GHz
• -161 dBm/Hz displayed average noise level (typical)
• -98 dBc/Hz @ 10 kHz offset phase noise (typical)
• Total amplitude accuracy < 0.7 dB
• 1 Hz minimum resolution bandwidth (RBW)
• Built-in preamplifier for improved sensitivity

Typical Applications

● Research Laboratory
● Development Laboratory
● Repair and Maintenance
● Calibration Laboratory
● Automatic Production Test
● General bench-top use

• HD4096 technology provides 12-bit resolution up to 8 GHz and 20 GS/s
• Up to 5 Gpts of acquisition memory enables detailed viewing of long events
• 15.6” 1900 x 1080 Full HD capacitive touchscreen
• ProBus2 input supports up to 8 GHz bandwidth while maintaining support for legacy ProBus probes
• MAUI with OneTouch user interface for intuitive and efficient operation
• Waveform Control Knobs – Control channel, zoom, math and memory traces with the multiplexed vertical and horizontal knobs
• Color-coded panel indicators – Trigger, horizontal and vertical indicator colors correspond to the associated waveform on the display
• Cursor/Adjust Knobs – Enable and position cursors or adjust settings and parameters without opening a menu
• Mixed Signal Capability – Debug complex embedded designs with integrated 16-channel mixed signal capability
• Easy connectivity with seven USB 3.1 ports (3 front, 4 side) and UHD (4k) HDMI and DisplayPort outputs

• Eye diagram (a), eye mask failure (b) and IsoBER eye opening analysis (c)
• Jitter spectrum (a) with noise floor display (b) and inverse FFT of the periodic jitter (c)
• Data dependent jitter (DDj) plot for each bit in synch with pattern (a) and with histogram (b)
• Time interval error (TIE) jitter track analysis
• Jitter histograms (a) with bathtub curves (b) and CDF plot (c)
• Intersymbol interference (ISI) plots pinpoint bit sequences that have high ISI and are sources of bit errors
• Jitter measurements table with full details for one or more “lanes” plus reference