3504 C HiTESTER

3504 C HiTESTER

The Hioki 3504 C HiTESTER is a dual-band capacitance meter designed for high-speed inspection of large-capacitance MLCCs on automated taping and sorting machines. Using constant voltage testing, it ensures stable and repeatable measurements while detecting contact errors to improve production yield.

Key Features

  • Dual measurement frequencies of 120 Hz and 1 kHz
  • Fast measurement time of 2 ms for inline testing
  • Constant voltage testing for voltage-dependent capacitance
  • Continuous contact error monitoring during measurement
  • BIN function for automated sorting and classification
  • Advanced 4-terminal contact check on selected models
  • Optimized for integration with taping machines

 

SKU: 3504_C_HiTESTER Category:



Description

3504 C HiTESTER for MLCC Production Inspection

The Hioki 3504 C HiTESTER is engineered for manufacturers who require accurate and stable capacitance measurements of multi-layer ceramic capacitors in high-volume production environments. Designed specifically for taping machines and sorting systems, this capacitance meter supports consistent inspection of large-capacitance MLCCs using constant voltage measurement techniques.

Constant Voltage Measurement Accuracy

One of the key advantages of the 3504 C HiTESTER is its ability to perform capacitance measurements using constant voltage testing. This method is essential for evaluating MLCCs that exhibit voltage dependency characteristics. By maintaining a stable measurement voltage, the instrument delivers reliable and repeatable results that align with real-world operating conditions.

The meter supports measurement frequencies of 120 Hz and 1 kHz, allowing manufacturers to evaluate capacitors across commonly required test conditions. With a typical measurement time of just 2 milliseconds, the 3504 C HiTESTER enables rapid inspection without sacrificing accuracy.

Reliability on Automated Lines

To improve yield and reduce false rejects, the 3504 C HiTESTER continuously monitors contact conditions during measurement. The advanced models can detect contact failure across all four terminals, ensuring accurate readings even in demanding automated environments. This proactive contact monitoring helps prevent undetected connection issues that can affect measurement integrity.

The built-in BIN function on supported models allows components to be classified automatically based on measurement results. This capability makes the instrument ideal for use with sorting machines, helping streamline quality control workflows and improve throughput.

Model Flexibility

The 3504 series offers multiple configurations to match different production requirements. From cost-effective high-speed models to advanced versions with enhanced contact detection and communication interfaces, manufacturers can select the version that best fits their inspection needs.

By combining speed, accuracy, and production-ready functionality, the 3504 C HiTESTER delivers dependable performance for MLCC inspection and supports consistent quality in modern electronics manufacturing.

Technical Specifications

Specification Details
Product Name Hioki 3504 C HiTESTER
Measurement Parameters Capacitance C, Loss coefficient D
Measurement Range 0.9400 pF to 20.0000 mF
Measurement Frequencies 120 Hz, 1 kHz
Measurement Time 2 ms typical
Measurement Accuracy C ±0.09 percent rdg, D ±0.0016
Measurement Voltage 100 mV, 500 mV, 1 V rms
Constant Voltage Testing Supported
Contact Check 4-terminal detection on 3504-60
BIN Function Available on 3504-50 and 3504-60
Interfaces RS-232C, GP-IB depending on model
Display Six-digit LED
Power Supply 100 to 240 V AC selectable
Dimensions 260 mm W × 100 mm H × 220 mm D
Weight 3.8 kg
Included Accessories Power cord, instruction manual, spare fuse

 

 

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Additional information

Weight 8.6 lbs
Dimensions 220 × 260 × 100 mm
model

3504-40, 3504-50, 3504-60

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