Engineered for precision and safety, the EPS150TESLA delivers accurate on-wafer power device characterization up to 3,000 V and 100 A, making it a trusted choice for high-voltage and high-current testing.
Key Features:
On-wafer power device characterization up to 3,000 V (triaxial) / 10,000 V (optional coaxial).
High-current probing up to 100 A with ultra-low contact resistance.
Triax chuck design for accurate low-leakage measurements.
Shielded test environment with advanced grounding and arcing protection.
Seamless integration with analyzers via SIGMA kit and optimized signal path.
Safe probe tip exchange and thin-wafer handling capability.
OVERVIEWUltra-High Brightness: Engineered to perform in a widerange of lighting conditions, ensuring excellentvisibility in both indoor and outdoor environments.
Robust Durability: Built to withstand demandingconditions for long-term reliability.
Ultra-Thin & Lightweight: Designed for seamlessintegration into compact spaces, leveraging microLED’sinherently slim profile without compromisingperformance.
Power-Efficient Design: Consumes significantly lesspower compared to traditional display technologies.