Meters

The Hioki 3506-10 C Meter is a high-speed dual-band capacitance meter designed specifically for ceramic capacitor testing on automated production lines. Built for seamless integration with taping machines and sorting systems, it delivers fast, stable, and repeatable measurements even in demanding manufacturing environments.

Key Features

• Dual measurement frequencies of 1 kHz and 1 MHz
• Ultra-fast analog test time of 0.6 ms at 1 MHz
• Stable low-capacitance measurement for MLCC production
• Enhanced noise resistance for reliable inline testing
• BIN function for efficient component screening
• Designed for integration with taping machines and sorters
• Excellent repeatability for high-volume manufacturing

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements