Products

A configurable fine-pitch multi-contact RF/mmW probe for mixed-signal probing up to 110 GHz

• Customizable configuration up to 25 contacts: RF, Eye-Pass power, ground, logic
• Lithographically-defined tips allow automated over temperature measurement on pads as small as 30 µm x 50 µm
• Low and repeatable contact resistance on aluminum pads (< 0.05 Ω) ensures accurate results
• Durable probe structure ensures more than 250,000 contacts
• Able to measure from -40°C to +125°C without compromising performance or accuracy of specifications

100 mm manual cryogenic probe system

• Specially designed for laboratory environments
• Different substrate carriers for wafers up to 100 mm or single dies
• Probe positioners placed inside vacuum chamber
• Excellent measurement accuracy and repeatability
• Simple microscope operation
• Comfortable and easy operation
• Fast, manual step-and-repeat testing of the whole wafer
• Simultaneous contacting and separation of all probes

Multi-Configurable Optical Probe for Photonic Device Characterization

• Flexibility and ease of use
  • Field-replaceable fibers optimized for a variety of applications
  • Wafer mapping capability and visual display of key parameters
• Accuracy
  • Patented contact protection design ensures fast, accurate, and repeatable measurements at the wafer and substrate level
  • Minimized electrical parasitics for at-speed testing
• Compatibility
  • Standard FC type fiber-optic connector
  • Compatible with FormFactor probe stations and accessories

Custom configured for your application

• Choice of Series resistance or Termination (signal line to ground)
• Use of High Performance RF Resistors
• Choice of Resistor values available
• Choice of body styles, Infinity, ACP or FPC

Wafer-level electrical measurement of mmW devices and materials up to 1.1 THz

• Low insertion loss
• Low contact resistance
• 140 GHz – 1.1 THz versions
• Probe pitch as narrow as 25 μm
• Lithographically-defined probe tip
• Nickel contacts

• Supports up to 12 VNA ports than can be mapped to four logical ports for calibration
• Extensive guidance, wizards and management features automate calibration setup, measurement, result data conversion and report creation
• LRRM-SOLT, multi-line TRL and second-tier calibration methods enable precision and simple multi-port calibrations
• Automatic load inductance compensation function ensures the most repeatable calibrations
• Easy to use Probe to ISS/CSR matching tool
• Additional remoting methods
• Interface with Velox™ over LAN

• Easily create tasks
• Obtain fast results
• Adapts to the user’s needs and skills level
• Reduces working time
• Saves money!
• Designed to operate with maximum intelligence
• Automates workflows
• Enables autonomous measurements

Robust RF Test on PCB and Ceramic

• Replace costly and inflexible test fixtures with easy-to-use probe tips
• Long lifetime – typically over 1,000,000 contacts
• GS/SG footprint up to 4 GHz and GSG up to 20 GHz
• High-power RF test: up to 30 Watts
• Test at temperatures from -60°C to 200°C

High power, High performance probe

• High power – 66 W at 2.4 GHz and 43 W at 5 GHz
• Extremely low insertion loss of ≤ 0.4 dB (typical) up to 40 GHz
• Excellent contact control and low contact resistance
• High performance on any pad material (Al or Au)
• Longest lifetime – typically one million (1,000,000) touchdowns

Excellent Performance – Longest Lifetime

• Best price per contact – typically over one million (1,000,000) touchdowns
• RF/Microwave signal is shielded and completely air isolated in the probe body
• Excellent performance in vacuum environments and temperatures as low as 4 K, or as high as 300°C
• Highest impedance control with perfectly-symmetrical, MEMS-machined coplanar contact structure
• Probe on any pad material with minimal damage

• Highest accuracy in test results
• Easy setup even for less experienced users
• Minimized coupling losses with minimal trench dimensions
• Exclusive FormFactor-developed automated test methodology
• Wide range of tools for capturing, logging and interpreting data
• Enables hands-free autonomous calibration and re-calibration at multiple temperatures
• Search First Light feature enables automated determination of initial position for optimization
• Once aligned, all calibration functions are automated and performed through SiPh-Tool

Key Performance Capabilities:

• Slew rates up to 60 V/µsec.
• Up to 240A DC at +50VDC or –50VDC (4301-240 configuration).
• Can provide pulses of up to 800 amps at voltages of up to ±100V (4301-240 configuration).
• Adjustable compensation allows the system to maintain a 50V/2 µsec rise-time over a wide range of current outputs.

Key Performance Capabilities:

• Bandwidth: DC to 50 kHz
• Voltage: 0 to 250 V_RMS; 0 to 350 VDC
• Current: 100 to 500 A_RMS
• Distortion: 0.1%
• Power: 4 kW to 20 kW*Power levels up to 5X rated power when driving reactive loads
• High power efficiency and density

*Models available with output from 4 kW to 20 kW (capable of up to 125 kVA).

Key Performance Capabilities:

• 4-Quadrant – Can source and sink current
• ±80V – DC supply for 12V to 48V systems; meets 80V surge requirements
• 300 kHz Sine – DC ripple tests for all major standards
• 3µs Rise Time – Exceeds surge and dropout slew rate requirements
• 3mΩ DC Source Impedance – Out-performs ISO 7637-2 requirements
• Supports ground reference and supply offset testing required for ISO 16750-2 Sect. 4.8 and other similar standards

Key Performance Capabilities:

• Up to 900 watts RMS power output (7136 model)
• Small signal response up to 400 kHz
• User-adjustable precision DC offset
• User-adjustable current limit: 1A to 25A
• 4-quadrant operation
• AC/DC coupled

1.5GHz & 3GHz

• 1.5GHz and 3GHz models
• Internal DDS baseband generator provided as logic LF output
• Compatible with previous Aim-TTi RF generators
• Phase noise <-117dBc/Hz (typ.) at 1GHz output 10kHz offset
• Extensive analog and digital modulations
• Amplitude range of -127dBm to +13dBm
• High signal purity
• Fast amplitude and/or frequency sweeps