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  • Single-phase, 2U, industrial amplifier/battery simulator

    • Bench-sized
    • Powered from 120V/230VAC
    • Source and Sink (4 quadrant)
    • Rugged Design
    • 3-Year, No-Fault Warranty

    Key Performance Capabilities:

    • Drop outs and surges as fast as 1.2µs
    • Small signal response up to 1 MHz
    • 13.5 VDC at up to 28A
    • Field-selectable ±40V, 75V or 150V potential

     

  • The First Wide-Bandwidth, High-Power Digital Amplifiers

    • Max Continuous Output Current: 300A RMS
    • Surge Rating: 2X power at up to 400 VP or 750A
    • Apparent Power Rating: Up to 5X continuous power rating atup to 400 VP or 750A
    • Supply Voltage: Three-phase, 208V ±10%, 60A, 50/60 Hz; 400V ±10%, 15A version available.
    • Dimensions (HxWxD): 36.5 x 21.0 x 30.75 inches (92.7 x 53.3 x 78.1 cm)
    • Weight: Appx. 540 lbs. (244.9 kg)

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

    • 20 Amp Operation: Full performance with 20 amp service
    • Automatic Power Reduction: Reduces power usage during idle periods
    • Heat Only Mode: Reduces power usage when cold temperatures are not used
    • WhisperStream Technology: quieter, smooth-sounding operation, 56 dBA
    • Frost Free Test Environment: dry air purge for tester interface, prevents condensation:
      0.5 to 3scfm (0.25 to 1.5 l/s)
    • Heated Defrost: quickly removes moisture buildup from internal chiller
    • DUT Temperature Control : Proprietary control algorithm enables DUT temperature to be directly controlled
    • Transition Rate*
      -55 to +125°C, approx. 10 seconds
      125 to -55°C, approx. 10 seconds
    • System Airflow Output*
      4 to 18scfm (1.9 to 8.5 l/s) Continuous
    • Temperature Range*
      -80 to +225°C (60Hz) No LN2 or LCO2 Required

     

    • High reliability thermal cycling without thermoelectric modules
    • Temperature range: -65 to 175°C
    • Cooling power:
      • 40W at -40°C for lower power devices
      • 55W at -55°C and 120W at -40°C.
    • Transition rate: up to <35 sec over 25 to -40°C
    • Easy and secure thermal connection to in-circuit or test socked DUT
    • Touch-screen controller: user-programmable temperatures, graphing, data logging
    • Communications options: Ethernet, USB, IEEE, RS232

     

  • -60° to +200°C

    • Economy model with high thermal capacity
    • Precise temperatures with fast transitions from -60 to 200°C
    • No annual leak testing required per EU 517/2014 F-Gas Regulation
    • Effective testing and conditioning of electronic components, boards, and modules
    • Available for 50 and 60Hz operation
    • No need for Liquid Nitrogen (LN2) or Liquid Carbon Dioxide (LCO2)
    • Remote communications and set up and touch screen operation
    • User Defined Temperature Limits

     

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     

    • Quick and easy probe tip navigation
    • Maximizes field-of-view
    • High magnification
    • Shadow-free view of the corresponding features
    • Automatically configure and optimize performance
    • cTUVus certified and CE
    • Compatible with TopHat for perfect shielding
    • 24/7 operating, Increased MTBF
    • Stops all system motion and warns of unobserved contact

     

  •  

    Contact Intelligence

    • Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

     

     

    • Highest accuracy with backlash-free positioning
    • Drift-free measurements over temperature and time*
    • Easy, and safe swapping between arms
    • Best signal integrity using optimized probe cabling systems
    • Full thermal capability*
    • Manual or progammable

     

    • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
    • Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

     

    • Comprehensive,
    • Turn-key Integrated Measurement System (IMS)
    • with Keysight PNA for On-wafer R&D Measurements
    • from RF to millimeter wave to Terahertz

     

  • Accurate and precise measurement of device parameters up to 3,000 V

    • Coaxial and triaxial measurements up to 3,000 V
    • High-quality construction with low-noise electrical performance
    • Replaceable probe tips in a variety of tip sizes
    • Temperature range of -55 to 300ºC
    • Triaxial measurement ensures a much better understanding of device leakage in the off state
    • Highly reliable, stable and repeatable measurements
    • Integrally designed as part of a complete measurement solution

     


Showing 1–16 of 73 results