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  • Multi-Range DC Power Supply with digital control, 3 or 4 Outputs, 315 to 420W with/without Remote Interfaces

    • hree or four high performance outputs each with full functionality
    • Range switching gives variable voltage/current combinations
    • Shared power mode provides double power from a single output
    • Low output noise and ripple via linear final regulation
    • High setting resolution of up to 1mV and 0.1mA
    • Variable OVP and OCP trips on all outputs
    • 50 setting memories per output plus 50 linked memories
    • Selectable voltage tracking (isolated tracking)
    • Selectable current meter averaging
    • Switchable remote sense capability
    • Graphic LCD provides simultaneous output metering
    • Numeric or spin-wheel control of all parameters
    • Individual or combined output on/off control with programmable delay sequencing.
    • 3U half-rack case for bench or rack mounting (4U rack kit accessory available)
    • RS-232, USB and LAN (LXI) interfaces (P models), GPIB option
    • Duplicate power & sense terminals at rear (P models)

     

  • with 10MHz to 3.6 or 6.0GHz bandwidth options

    True hand-held battery powered RF spectrum analyzers.

    • 10MHz to 3600MHz or 6000MHz frequency range
    • Resolution bandwidths from 300Hz to 10MHz (1:3:10)
    • -120dBm typical noise floor at -40dBm ref. level/10kHz RBW
    • Measurement in dBm or dBµV, mV or µW
    • Zero span mode with AM and FM audio demodulation
    • Trace modes of normal, peak hold and trace average
    • Live, View and Reference traces in contrasting colours
    • Twin markers with readout of absolute & difference values
    • Smart marker movement with selectable peak tracking
    • Frequency counter with down to 10Hz resolution
    • Frequency presets and independent state storage
    • Auto-find automatically sets sweep parameters for the highest signal found
    • Unlimited storage for waveforms, set-ups and screens
    • User assignable file names, file stamping from real-time clock
    • USB interfaces for Flash drives and PC connection
    • Comprehensive status and context sensitive help screens
    • Rechargeable lithium ion battery giving more than 3 hours continuous operation from a charge
    • Smaller and lighter than other spectrum analyzers (weight only 0.56 kg)

     

  • DC Power Supply single output, 80V/50A 750W PowerFlex+, LAN & USB interfaces, GPIB Option

    • Wide range of voltage/current combinations
    • Up to 80V and up to 50A within the same power envelope
    • Low output ripple and noise of <3mV rms at full power
    • High setting resolution of 1mV
    • Analogue control interfaces for voltage and current
    • Bench or rack mounting, front and rear terminals
    • LAN (LXI), USB, GPIB interfaces (GPIB optional on QPX750SP)

     

    • 150kHz to 3GHz (TGR2053) and 150kHz to 1.5GHz (TGR2051) frequency range
    • High signal purity, phase noise <-117dBc/Hz (typical) at 1GHz output and 10kHz offset
    • Amplitude range of -127dBm to +13dBm
    • 0.1dBm amplitude setting resolution
    • Internal or external analogue modulations (AM, FM, PM)
    • Amplitude can be set in dBm, dBμV or in linear Volts.
    • Internal or external digital modulations – ASK, OOK, FSK, 3FSK, 4FSK, GFSK, MSK, GMSK, HMSK & PSK with U01 option
    • Modulation Synchronisation
    • Fast amplitude and/or frequency sweeps with comprehensive triggering
    • 5ms sweep settling time
    • 1ppm frequency accuracy, <1ppm drift in first year
    • Modulation waveform output on the rear panel
    • Internal waveforms include: Sine, Square, Ramp, Triangle, PRBS (various lengths) and user-defined pattern
    • Simple operation with the colour touch screen
    • Programmable via USB, LAN (LXI) and GPIB (optional), SCPI compatible
    • Compatible with previous Aim-TTi RF generators

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The EME Guard Plus is a lightweight and robust personal protection monitor designed to ensure the safety of workers operating near electromagnetic field (EMF) emitters such as antennas, radars, and base stations. With a frequency range of 1 MHz to 40 GHz, this device continuously monitors and records EMF exposure levels while providing immediate audio, visual, and vibrating alerts when exposure exceeds predefined safety thresholds. Customizable alarm settings and a triaxial isotropic probe ensure accurate and reliable measurements.

     

  • The EME Guard XS Radar is a state-of-the-art RF safety monitor, specifically designed for workers operating near radar transmitters and antennas. With its isotropic tri-axis E-field sensors, this compact device provides continuous EMF monitoring over a frequency range of 1 MHz to 40 GHz, including short pulsed signal detection. Equipped with audio and visual alarms, it alerts users instantly when EMF exposure exceeds predefined safety thresholds, creating a safer working environment for military, aviation, and telecom personnel.

     

    • Available in 4.5-digit (60,000 count) and 6.5-digit (2,200,000 count) resolutions.
    • Wide measurement range:
      • DC Voltage: Up to 1000V
      • AC Voltage: Up to 750V (True RMS)
      • Current: 10A (AC/DC)
      • Resistance: 100MΩ (2-wire/4-wire)
      • Capacitance: 2nF – 100mF
      • Temperature measurements with TC and RTD sensor support.
    • High-speed measurements:
      • T3DMM4-5: 150 readings per second
      • T3DMM6-5: 10,000 readings per second
    • Advanced mathematical functions such as Max, Min, Standard Deviation, dBm/dB, Relative Measurement, Pass/Fail Analysis, and Histograms.
    • Connectivity: USB Device, USB Host, and LAN for remote operation via SCPI commands.
    • Data Storage: 1GB NAND flash memory for saving configuration files and test data.
    • Built-in cold junction compensation for accurate temperature measurements.
    • File management system supporting U-disc and local storage for convenient data access.
    • Comprehensive user interface with a dual-display system for easy navigation.
    • Automatic measurement functions, including statistical analysis, gating, and reference functions.

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     

    • Quick and easy probe tip navigation
    • Maximizes field-of-view
    • High magnification
    • Shadow-free view of the corresponding features
    • Automatically configure and optimize performance
    • cTUVus certified and CE
    • Compatible with TopHat for perfect shielding
    • 24/7 operating, Increased MTBF
    • Stops all system motion and warns of unobserved contact

     

  •  

    Contact Intelligence

    • Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

     

     

    • Highest accuracy with backlash-free positioning
    • Drift-free measurements over temperature and time*
    • Easy, and safe swapping between arms
    • Best signal integrity using optimized probe cabling systems
    • Full thermal capability*
    • Manual or progammable

     

    • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
    • Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

     


Showing 1–16 of 84 results