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    • Versatile Current Sensing: Accurately measure small and large currents, from sub-milliamp levels to thousands of amps.
    • High-Speed Pulse Monitoring: Patented distributed termination technology enables ultra-fast rise time measurement (as short as 2ns).
    • Enhanced Noise Immunity & Safety: Double shielding minimizes external noise, making these monitors ideal for high-voltage applications.
    • Robust Construction: Sealed models are suitable for high-voltage insulating oil or vacuum environments.
    • Broad Compatibility: Works with oscilloscopes, spectrum analyzers, power analyzers, digital voltmeters, ADCs, and more.

     

  • High-Precision Current Measurement with BNC Connectivity

    • Precision Current Sensing: ±1% accuracy ensures reliable real-time current monitoring.
    • BNC Connector for Seamless Connectivity: Works with oscilloscopes, ADCs, spectrum analyzers, and power analyzers.
    • Clamp-On Design for Non-Intrusive Measurement: Safely monitor live current flow without circuit disruption.
    • 50 Ohm Termination Compatible: Output reduces by half when using a 50Ω termination.
    • High-Voltage Safety Considerations: Conductive case requires adequate insulation for user safety.

     

  • High-Precision Voltage Measurement Up to 500kV

    • High-Voltage Measurement Capability: Supports up to 500kV in insulating oil and customizable calibration for air use.
    • Precision Division Ratios: Models with 5000:1, 10,000:1, and custom ratios, ensuring reliable voltage scaling.
    • Temperature-Compensated Accuracy: ±1% over 20°C to 80°C, providing stable voltage readings.
    • Robust Design for Harsh Environments: Sealed for high-voltage insulating oil use, with custom air calibration available.
    • Safe Operation with Ground Loop Control: The outer conductor is isolated from the case, allowing controlled grounding connections.

     

  • Precision Pulse Output Up to 500kV

    • Wide Voltage Range: Supports 100kV to 500kV pulse outputs for high-energy applications.
    • Fast Pulse Transmission: Pulse durations from 0.25 to 50 microseconds, ensuring efficient energy transfer.
    • Insulating Oil Immersion: Open-construction design for operation in high-voltage insulating oil, reducing breakdown risks.
    • Advanced Overvoltage Protection: Designed with built-in safety factors (50-100%) to prevent damage from overvoltages.
    • Reliable Flashover Protection: Corona ring-to-core insulation prevents damage from accidental flashovers.

     

  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

    • Available in 4.5-digit (60,000 count) and 6.5-digit (2,200,000 count) resolutions.
    • Wide measurement range:
      • DC Voltage: Up to 1000V
      • AC Voltage: Up to 750V (True RMS)
      • Current: 10A (AC/DC)
      • Resistance: 100MΩ (2-wire/4-wire)
      • Capacitance: 2nF – 100mF
      • Temperature measurements with TC and RTD sensor support.
    • High-speed measurements:
      • T3DMM4-5: 150 readings per second
      • T3DMM6-5: 10,000 readings per second
    • Advanced mathematical functions such as Max, Min, Standard Deviation, dBm/dB, Relative Measurement, Pass/Fail Analysis, and Histograms.
    • Connectivity: USB Device, USB Host, and LAN for remote operation via SCPI commands.
    • Data Storage: 1GB NAND flash memory for saving configuration files and test data.
    • Built-in cold junction compensation for accurate temperature measurements.
    • File management system supporting U-disc and local storage for convenient data access.
    • Comprehensive user interface with a dual-display system for easy navigation.
    • Automatic measurement functions, including statistical analysis, gating, and reference functions.

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers

     

  • Genius Education Kits Overview

     

    • Flexibility
      • Temperatures range from -60°C to +300°C
      • Surfaces are nickel or gold-plated
      • Hybrid chuck design – operation with and without cooling unit
      • Field-upgradeable: On-site cold upgrades for all main prober platforms
    • Highest Efficiency for Reduced Cost of Test
      • Up to 25% lower air consumption (CDA) than other systems on the market with no compromise in transition times
      • Up to 15% faster transition times than other systems on the market
    • Low Thermal Resistance
      • Low Thermal Resistance Technology
      • MultiSense with multiple temperature sensors
      • Best temperature accuracy and uniformity
    • Superior Electrical Performance
      • Isolated from ground
      • Includes a jack for grounding and biasing
      • Highly planar chuck surface for consistant contact force and overtravel

     

  • PureLine 3 Technology

    First automated probe station to achieve -190dB spectral noise*

    Plug In and Go

    Integrated TestCell Power Management provides fully managed and filtered AC power to the entire system, prober and instruments

    Autonomous 24/7 Operation

    Up to 4x faster flicker noise thermal testing on 30 μm pads

    Reduce Setup Time and Costs
    Exclusive low noise site survey, and system verification services

     

    • Quick and easy probe tip navigation
    • Maximizes field-of-view
    • High magnification
    • Shadow-free view of the corresponding features
    • Automatically configure and optimize performance
    • cTUVus certified and CE
    • Compatible with TopHat for perfect shielding
    • 24/7 operating, Increased MTBF
    • Stops all system motion and warns of unobserved contact

     

  •  

    Contact Intelligence

    • Ease of use –  Less experienced operators can perform DC measurements by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.

     

     

    • Highest accuracy with backlash-free positioning
    • Drift-free measurements over temperature and time*
    • Easy, and safe swapping between arms
    • Best signal integrity using optimized probe cabling systems
    • Full thermal capability*
    • Manual or progammable

     

    • Ease of use –  Less experienced operators can perform an RF calibration up to 330 GHz by simply pushing a button. This reduces the need of experienced users full time on each system.
    • Reduced Soak Time – The system will automatically re-align the probes to the pads if they drift from alignment. This reduces test time and increases throughput.
    • Unattended Use – Measurements can be left running over night or the weekend, testing all devices on the wafer, and at different temperatures without the need of an operator.
    • Calibration Monitor and Re-calibration – System will continuously monitor calibration drift, and automatically re-calibrate the system should the drift exceed a predefined limit.

     

    • Comprehensive,
    • Turn-key Integrated Measurement System (IMS)
    • with Keysight PNA for On-wafer R&D Measurements
    • from RF to millimeter wave to Terahertz

     

  • Accurate and precise measurement of device parameters up to 3,000 V

    • Coaxial and triaxial measurements up to 3,000 V
    • High-quality construction with low-noise electrical performance
    • Replaceable probe tips in a variety of tip sizes
    • Temperature range of -55 to 300ºC
    • Triaxial measurement ensures a much better understanding of device leakage in the off state
    • Highly reliable, stable and repeatable measurements
    • Integrally designed as part of a complete measurement solution

     


Showing 1–16 of 79 results