BAT-SCAN near field system

BAT-SCAN near field system

The BAT-SCAN near field system is an advanced robotic EMC measurement solution designed to analyze and visualize electromagnetic behavior in electronic components and circuits. Developed by NEXIO, it enables precise near-field scanning to identify EMC issues early in the design stage, improving product reliability and reducing development costs.

Key Features

  • Robotic near-field scanning system for EMC analysis
  • High precision measurement accuracy up to 0.1 mm
  • Measurement volume of 500 x 500 x 400 mm
  • High speed scanning up to 1 m/s
  • Integrated 4K high resolution camera for visual analysis
  • Lightweight system design at 11.2 kg
  • Automated EMC failure detection and localization
  • Compatible with multiple robotic scanning platforms
  • Supports PCB, IC, shielding, and enclosure analysis
  • Reduces qualification test cycles and debugging time

 

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Description

BAT-SCAN Near Field System

The BAT-SCAN near field system is a cutting edge robotic electromagnetic measurement platform developed by NEXIO to transform how engineers analyze and resolve EMC issues during product development. Designed for precision, speed, and usability, it provides a complete solution for near-field scanning and electromagnetic behavior visualization at the design stage.

This system enables engineers to identify the root causes of electromagnetic interference with high accuracy before final product validation. By scanning electronic circuits, printed circuit boards, and complete assemblies, BAT-SCAN helps detect leakage points, impedance mismatches, and unwanted coupling effects that can impact product performance and compliance.

At the core of the system is a robotic scanning mechanism that delivers exceptional repeatability and precision up to 0.1 mm. With a scanning speed of up to 1 m/s and a measurement volume of 500 x 500 x 400 mm, the system ensures fast and reliable coverage of complex electronic structures. The integrated 4K high resolution camera provides real time visual feedback, enabling engineers to correlate electromagnetic behavior with physical design features.

One of the most important advantages of the BAT-SCAN near field system is its ability to significantly reduce development and testing cycles. By identifying EMC issues early, it minimizes costly redesigns and reduces the number of formal qualification tests required. This results in faster time to market and improved product quality.

The system is particularly effective in analyzing shielding performance, PCB trace behavior, and component interaction within dense electronic environments. It also supports optimization of IC placement, PCB layout, and enclosure design to reduce self interference and improve overall electromagnetic compatibility.

The BAT-SCAN platform is designed for accessibility and collaboration. It does not require deep EMC expertise to operate, making it suitable for multidisciplinary teams including design engineers, validation specialists, and quality assurance professionals. Its portability also enables use across different project environments, improving collaboration and flexibility.

In addition to automated scanning, the system supports manual remeasurement functions for deeper investigation of suspicious or critical areas. This hybrid approach ensures both automation efficiency and expert level diagnostic capability when required.

By combining robotic precision with intelligent EMC analysis software, the BAT-SCAN near field system provides a powerful tool for improving product reliability, maintaining compliance, and optimizing electronic design performance.

Technical Specifications

Parameter Description
System Name BAT-SCAN Robotic Near Field Measurement System
Technology Robotic EMC near-field scanning platform
Measurement Accuracy Up to 0.1 mm
Maximum Scan Speed 1 m/s
Measurement Volume 500 x 500 x 400 mm
Camera System Integrated 4K high resolution camera
System Weight 11.2 kg
Function Type EMC design analysis and fault localization
Compatibility Multi robotic system integration
Analysis Capability PCB, IC, shielding, enclosure evaluation
Operation Mode Automated and manual remeasurement
Application Areas Electronics design, EMC debugging, RF optimization

 

 

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