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Cascade Autonomous Silicon Photonics

Cascade Autonomous Silicon Photonics

Cascade Autonomous Silicon Photonics delivers fully automated wafer and die-level photonics probing with Contact Intelligence™ for unmatched accuracy.

Key Features:

  • Flexible vertical and edge coupling with single fibers or fiber arrays
  • OptoVue™ technology for real-time in-situ calibrations
  • Exclusive TopHat environment for dark, frost-free thermal testing (-40°C to +125°C)
  • Sub-micron placement accuracy with Z displacement sensing
  • Collision avoidance technology for safe fiber alignment
  • SiPh-Tools software for automated alignment, calibration, and data management
  • Partnership with Keysight and PI for seamless instrumentation and precision positioning
  • Available on CM300xi-SiPh and SUMMIT200 probe stations

 

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Description

Cascade Autonomous Silicon Photonics Wafer Probing System

The Cascade Autonomous Silicon Photonics measurement assistant is the industry benchmark for wafer and die-level photonics testing, combining flexibility, precision, and automation. Designed for today’s rapidly evolving photonic applications, it supports vertical and edge coupling with both single fibers and fiber arrays, making it ideal for research, development, and production environments.

At the core of this solution is OptoVue™, a revolutionary calibration technology that enables real-time in-situ adjustments. Together with intelligent machine vision and advanced algorithms, it ensures optimized fiber-to-facet alignment, precise Z-height setting, and minimized coupling loss. The result is repeatable, accurate measurements with reduced test time and lower cost.

The exclusive SiPh TopHat environment provides a dark, shielded, and frost-free chamber, ensuring stable measurements across a wide thermal range from -40°C to +125°C. This allows testing under real-world conditions while maintaining the integrity of sensitive fiber-to-device couplings.

Engineered for precision, the system uses Z displacement sensing technology to achieve sub-micron accuracy, ensuring consistent results when stepping die-to-die. Collision avoidance safeguards fibers during alignment, reducing downtime and preventing damage.

Software integration plays a key role. SiPh-Tools and the Photonics Controller Interface (PCI) automate calibration and alignment, transforming complex manual processes into push-button workflows. This enables less experienced operators to run advanced optical tests confidently.

FormFactor’s close alliances with Keysight Technologies and Physik Instrumente (PI) enhance the solution with world-class measurement instrumentation and positioning performance. Proven test methodologies demonstrate reliable repeatability, with less than 0.3 dB variance across 900 measurements, even when all solution elements are repositioned between runs.

From engineering labs to high-volume production, the Cascade Autonomous Silicon Photonics assistant accelerates testing, improves measurement confidence, and enables faster time to market for next-generation photonic devices.

Technical Highlights of Cascade Autonomous Silicon Photonics

Feature Specification / Capability
Coupling Methods Vertical and edge coupling with single fibers or fiber arrays
Calibration Technology OptoVue™ real-time in-situ calibrations
Environment Control SiPh TopHat dark, shielded, frost-free; -40°C to +125°C range
Placement Accuracy Sub-micron precision with Z displacement sensing
Fiber Safety Collision avoidance technology for reliable testing
Software Tools SiPh-Tools, PCI interface, automated calibration & alignment
Proven Repeatability <0.3 dB variance across 900 measurements
Supported Probe Stations CM300xi-SiPh, SUMMIT200

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