Description
Cascade SUMMIT200 Probe Station for Advanced Wafer Testing
The Cascade SUMMIT200 Probe Station is a next-generation 200 mm probing platform designed to deliver high-accuracy measurements up to 5X faster. Engineered for research, development, device modeling, and niche production, the SUMMIT200 ensures precision electrical characterization across DC, RF, mmW, and THz domains, making it a top choice for scientists, engineers, and semiconductor test professionals.
Precision and Accuracy with Innovative Technologies
Equipped with PureLine™ low-noise architecture, AttoGuard® shielding, and MicroChamber® isolation, the SUMMIT200 achieves industry-leading accuracy for IV/CV, low-noise, and 1/f measurements. Its design minimizes AC and spectral noise while maintaining the shortest possible signal path, ensuring reliable, thermally stable results. Integrated RF calibration with WinCal further enhances measurement precision for advanced semiconductor devices.
Speed, Throughput, and Automation
Built for efficiency, the SUMMIT200 offers cassette handling for up to 50 wafers, advanced 200 mm fast stage movement, and unattended testing across multiple temperatures with VueTrack™. Its Contact Intelligence™ technology combines system design and image processing for autonomous, operator-independent test cycles. The result: faster time to accurate data, even for challenging devices such as thin wafers and high-power circuits.
Flexible Thermal and Probing Capabilities
Supporting a full thermal range of -60°C to +300°C, the SUMMIT200 integrates IceShield™ thermal protection for closed and open environments. It accommodates diverse testing needs, from RF/microwave characterization to WLR and failure analysis, while remaining modular and field-upgradable. Users can configure probe cards, positioners, and advanced microscopes for tailored performance.
User-Friendly Operation with Velox Software
The SUMMIT200 emphasizes usability with Velox software, offering simplified wafer mapping, automated workflows, and touch-enabled Velox Dash™ controls. The ergonomic roll-out stage allows quick wafer access, while the intuitive interface reduces training costs and enhances productivity for both expert and novice operators.
The Cascade SUMMIT200 is more than a probe station—it is a future-ready testing platform combining speed, accuracy, and flexibility to meet the evolving demands of semiconductor innovation.
Technical Specifications
| Feature | Details |
| Wafer Size | 200 mm |
| Measurement Types | DC, RF, mmW, THz, IV/CV, low-noise, 1/f |
| Throughput | Up to 5X faster data collection |
| Wafer Handling | Cassette handling up to 50 wafers, automated loader option |
| Thermal Range | -60°C to +300°C with IceShield™ |
| Accuracy Technologies | PureLine™, AttoGuard®, MicroChamber® |
| Positioning System | 4-axis semi-automatic stage, sub-micron accuracy, VueTrack PRO |
| Automation | Contact Intelligence™, Velox software, Velox Dash™ UI |
| Imaging System | eVue digital imaging, advanced wafer navigation |
| Applications | Device characterization, WLR, FA, design debug, R&D, niche production |
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