Hioki POWER METER PW3337
Description
Cascade Evolvity 300 Semi-Automated Probe System
The Cascade Evolvity 300 is a 300 mm semi-automated probe system that redefines flexibility, efficiency, and precision in wafer-level testing. Designed as the latest addition to FormFactor’s engineering probe family, it complements the established CM300 product line while simplifying on-wafer probing for both RF and DC applications.
Drawing on the trusted legacy of Cascade’s S300 and Elite systems, the Evolvity 300 combines reliability with modern innovation. Its compact design ensures smooth integration into existing test cells, while field-upgradable components provide scalability for future measurement needs.
Engineered for RF/DC modeling and device characterization, the system offers unmatched versatility. Users can switch between multiple applications with ease, thanks to reconfigurable platen inserts that support TopHat, PCH, and IceShield configurations. The spacious platen design accommodates complex test setups without space restrictions, making it ideal for engineers handling a wide variety of measurements.
A key differentiator is the mechanical platen lift, which enhances safety during advanced RF setups. This feature not only boosts operator confidence but also reduces the risk of setup errors in demanding test environments.
The Evolvity 300 also integrates with FormFactor’s Autonomous RF/DC measurement assistants and the Velox Dash™ companion app, enabling simplified operation and enhanced automation. This reduces setup time, increases accuracy, and improves workflow efficiency.
Additionally, the system includes a Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck by default, ensuring excellent electrical and thermal stability for precise measurements.
By combining compactness, scalability, and automation, the Cascade Evolvity 300 empowers semiconductor engineers with a dependable and future-ready probing platform for today’s and tomorrow’s testing challenges.
Technical Specifications
| Feature | Specification |
| System Type | 300 mm Semi-Automated Probe System |
| Applications | RF/DC modeling, device characterization, probe cards |
| Platen Design | Spacious, supports RF and DC setups |
| Platen Inserts | Reconfigurable (TopHat, PCH, IceShield) |
| Safety | Mechanical platen lift for secure RF set-ups |
| Automation | Compatible with Autonomous RF/DC measurement assistants and Velox Dash™ |
| Design | Compact, space-efficient, field-upgradable |
| Included Components | Low-Volume MicroChamber, FemtoGuard thermal triaxial chuck |
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