Hioki POWER METER PW3337
Description
Cascade PM300 Probe System Overview
The Cascade PM300 Probe System is a 300 mm manual analytical probe station designed for maximum stability, precision, and flexibility in semiconductor testing. Recognized as the industry benchmark in manual wafer probing, the PM300 delivers outstanding accuracy and repeatability, making it the go-to solution for engineers working in failure analysis, device characterization, process development, and wafer-level reliability testing.
Built on a highly stable granite base, the PM300 ensures vibration-free operation and precise measurements across a wide variety of applications. Independent coarse X and Y axis movement, paired with smooth fine adjustments, provides effortless high-precision probe positioning and fast navigation, minimizing operator fatigue while improving throughput.
For advanced testing needs, the PM300PS variant features a fully electromagnetically shielded environment. This design reduces electrical noise and enables ultra-low-noise measurements at attoampere, femtofarad, and microvolt levels. Combined with a thermal range of -60°C to +200°C, the shielded version ensures reliable results for sensitive applications such as 1/f noise measurements and device modeling.
The PM300 system is designed for flexibility and scalability. It supports reconfiguration for DC, RF, mmW, FA, WLR, and even 3D IC engineering test applications. Accessories such as thermal chucks, dark boxes, motorized microscopes, and multiple positioners enhance its adaptability. With 40 mm platen height adjustability and space for up to 12 positioners, the PM300 ensures both ease of use and ergonomic efficiency.
Whether in academic labs, R&D centers, or production testing environments, the Cascade PM300 Probe System offers engineers a straightforward yet powerful platform that grows with their needs. Its upgrade path and optional shielding capabilities make it one of the most versatile and future-ready manual probe stations available today.
Technical Highlights of PM300
| Feature Category | Specification / Capability |
| System Type | 300 mm Manual Analytical Probe Station |
| Base Design | Granite base for superior stability |
| Probe Positioning | Independent X-Y coarse with fine adjustments |
| Flexibility | DC, RF, mmW, FA, WLR, 3D IC |
| Thermal Range (PM300PS) | -60°C to +200°C |
| Thermal Range (PM300) | +15°C to +300°C |
| Shielding | EMI/RFI shielded, ultra-low-noise (PM300PS) |
| Capacity | Spacious chamber for up to 12 positioners |
| Accessories | Thermal chucks, microscopes, dark box, motorized positioners |
| Upgrade Path | Scalable for future testing needs |
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