Description
RM3543 Resistance HiTESTER for Precision Low-Resistance Testing
The RM3543 Resistance HiTESTER is engineered for applications requiring ultra-precise measurement of low and super-low DC resistances, such as current sensing shunts in production lines. Capable of measuring 0.1 mΩ resistances with ±0.16% accuracy and providing a resolution of 0.01 μΩ, the RM3543 enables manufacturers to detect even the smallest deviations in component performance.
A key feature of the RM3543 is its offset voltage correction. This function eliminates errors caused by thermoelectromotive forces generated at junctions between different metals, providing stable readings even in variable temperature environments. This ensures measurements are accurate for both standalone components and mounted resistors.
The scaling function allows users to correct resistance measurements as if components are mounted, making it ideal for automated production systems where consistent testing is critical. Additionally, the contact improvement function removes oxide films and dirt from specimens, reducing contact errors and improving productivity by ensuring reliable probe connections.
The RM3543 also supports 4-terminal measurements with probe short detection, confirming the reliability of connections and preventing errors caused by foreign materials between measurement probes. Its intuitive interface, combined with strong noise immunity, makes it a robust solution for automated systems. For seamless integration, the RM3543-01 variant includes a GP-IB interface.
With advanced comparator functions, contact checks, and data export capabilities, the RM3543 provides manufacturers with precise, repeatable measurements, helping ensure product quality in demanding industrial and electronic applications.
Technical Specifications Table
| Specification | Details |
| Product Name | RM3543 Resistance HiTESTER |
| Measurement Range | Ultra-low and low resistance (0.1 mΩ min) |
| Resolution | 0.01 μΩ |
| Accuracy | ±0.16% for 0.1 mΩ |
| Measurement Method | 4-terminal method |
| Offset Voltage Correction | Yes, compensates thermoelectromotive effects |
| Scaling Function | Yes, for mounted component correction |
| Contact Improvement Function | Yes, ensures stable probe contact |
| Comparator & Contact Check | Yes, for reliable pass/fail judgments |
| Noise Immunity | High, suitable for automated systems |
| Communication Interface | GP-IB (RM3543-01 variant) |
| Included Accessories | Not included; select optional test fixture when ordering |
| Applications | Current sensing resistors, shunts, automated production lines, low-resistance components |
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