TSX Series DC Power Supply

• High Accuracy & Precision – Achieves ±30 ηA accuracy on multi-current range channels, ensuring reliable and consistent results.
• Scalable Configurations – Choose from 1 to 16 channels across three series configurations, providing flexibility to expand as testing needs grow.
• Compact & Space-Efficient Design – Desktop form factor saves space while maintaining full testing capabilities.
• Comprehensive Data Collection – Log current, voltage, time, temperature, and other critical parameters with high-speed data acquisition.
• Versatile Applications – Ideal for cell and battery testing, fuel cell testing, super-capacitor testing, thermal battery testing, qualification testing, and more.
• Turn-Key System – Pre-configured software and hardware bundles ensure quick deployment and easy setup.
• Advanced Software Integration – Seamlessly integrates with Maccor’s proprietary software for automated testing, data analysis, and reporting.
• Safety & Reliability – Designed with built-in safety features to protect both users and equipment.
• High-Speed Data Logging – Collects high-resolution data for in-depth performance analysis and characterization.
• Multiple Test Modes & Sequences – Supports constant current, power, resistance, pulse, and custom waveforms for comprehensive testing scenarios.

Engineered for precision and safety, the EPS150TESLA delivers accurate on-wafer power device characterization up to 3,000 V and 100 A, making it a trusted choice for high-voltage and high-current testing.

Key Features:

• On-wafer power device characterization up to 3,000 V (triaxial) / 10,000 V (optional coaxial).
• High-current probing up to 100 A with ultra-low contact resistance.
• Triax chuck design for accurate low-leakage measurements.
• Shielded test environment with advanced grounding and arcing protection.
• Seamless integration with analyzers via SIGMA kit and optimized signal path.
• Safe probe tip exchange and thin-wafer handling capability.

The TESLA200 is a semi- or fully-automated 200 mm on-wafer probing solution designed for advanced power semiconductor testing.

Key Features:

• On-wafer device testing up to 10,000 V DC and 600 A.
• Supports IGBT, GaN, SiC, and Si devices.
• Advanced MicroVac™ and FemtoGuard™ technologies for low-noise, accurate measurements.
• Wide thermal range from -55°C to +300°C.
• Safety-certified interlock system with ergonomic clear enclosure.
• Compatible with T.I.P.S. “LuPo” High Voltage / High Power Probe Cards.
• Fully automated wafer handling, including thinned/warped wafers.
• Field-upgradeable to scale with growing test requirements.

The TT 1.0 PF Turn Table is a precision turntable designed for EMC and RF testing in anechoic and electromagnetic absorption chambers.

Key Features:

• Diameter: 1.0 m; height: 190 mm
• Load capacity up to 100 kg
• Free-standing design for chamber floor installation
• Adjustable rotation speed: 0.1–2.5 rpm
• Positioning accuracy: ±0.5°
• Rotating angle range: -200° to 400°
• Central 50 mm opening for power supply connections
• Controlled via LAN (TCP/IP) with FCU3.0 or NCD Controllers
• Durable PVC integral skin-foam cover plate
• Synchronous servo motor with toothed belt and worm gear drive