Introducing the Vitrek V7X Series Hipot Testers

Vitrek V7X Series – No Other Hipot Tester can Touch ’em

For nearly 25 years, an obsessions has driven us to keep improving how hipot testers perform – speed, accuracy, user safety and reliability have been our driving force. Building a better hipot tester is in our DNA – it drove us to successfully engineer the first 4-in-1 safety tester back in 1990 and it has driven us to redefine performance in low cost hipot testers today.

The Hipot Experience has been Redefined

Our goal for the V7X series has been to achieve the unheard of. To provide state-of-the-art
performance in a powerful yet compact multi-function hipot tester – and do it at an entry level price. From our easy-to-use Touch user interface, to its ultra-reliability, high efficiency, fan free design – the V7X provides unrivaled performance. Have we met our goal? You be the judge – compare the V7X to our made in China competitors and see how well American engineering stands up. We build Vitrek Hipot Testers. What’s on your production line?

V75 with Built-in Hipot Switching

For high voltage cable & component testing – choose the V75 with 16 channels of built-in high voltage switching. With the versatile V75, you can test hipot or IR for any combination of up to 8 test points and you can measure low resistance (from .001 ohm to 60K ohms) on up to 8 conductors. All automatically with a single touch and all from a single compact tester. For requirements exceeding 8 points, the V7X can control up to 4 Vitrek 964i 64 channel HV Switching Systems – providing up to 256 channels of Hipot test capability. Simple, fast, automatic multi-point hipot – make the switch to the Vitrek V7X. You will be glad you did.

Key Features

• Product Features and Benefits
• 3″ Color Touch Display – Easy To Use Intuitive User Interface
• 6 Functions Choose From – AC/DC Hipot, IR, Ground Bond, Continuity & Built-in Switching
• Made in the USA – Designed & Built in San Diego CA
• Compact, Lightweight, Rugged, Fan Free, Fast (100mS min test time) & Accurate
• 5KV AC/DC Hipot, 20mA max source current
• Ground Bond 1-30A RMS (42 A peak), 100µΩ Resolution
• 100 nano-Amp Leakage Current Resolution
• Low Cost of Ownership – 2 Year Calibration Interval
• USB 2.0, Serial/RS232, Digital I/O Interfaces are Standard
• Continuously Variable Insulation Resistance 20-5000V, 450GΩ Max
• Multi Mode IR with Steady/Rising Pass Mode
• Test Memory Stores up to 999 Steps and 60 Test Sequences
• Internal Self Test Fully Exercises Output and Verifies Current Accuracy
• Pre-Programmed Daily Verification Test With Optional PVD Test Load
• 150µS Safety Shutdown
• Ramped Discharge Capability
• Selectable ARC Detection 1-20mA
• Meets UL, CSA, IEC Safety Tester Requirements
• CE Safety Mark Certified to EN61010
• 2 Year Parts & Labor Warranty

Key Benefits

Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range add 10% of the specification per C.
Decrease maximum ACW, DCW and IR voltages by 2.5%/1000ft above 5000ft ASL altitude.

All accuracy specifications are valid at the V7X terminals, and as such do not include any effects due to user wiring resistances, leakages or coupling, or other user generated leakages or interference.
Resolutions shown are for displayed measurements, limits and settings. Internally all measurements have typically 10x better resolution and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution.

Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface.
Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.

Specifications

V7X Test Step Specifications

Accuracy specifications shown are valid at temperatures within ±5C of the calibration temperature. Outside of this range add 10% of the specification per C.
Decrease maximum ACW, DCW and IR voltages by 2.5%/1000ft above 5000ft ASL altitude.
All accuracy specifications are valid at the V7X terminals, and as such do not include any effects due to user wiring resistances, leakages or coupling, or other user generated leakages or interference.
Resolutions shown are for displayed measurements, limits and settings. Internally all measurements have typically 10x better resolution and all limits and settings are implemented with the same resolution as entered by the user. Via an interface, all measurements are reported with 5 digit resolution.
Generally, user settings can be defined with up to 4 digit resolution and a selection of units (e.g. µA or mA) from the front panel; or with up to 6 digit resolution from an interface.
Unless otherwise specified, user terminated dwell/test periods can extend for up to 2 days.

Not all test types are available in all models of V7X.

ACW Test Steps

Voltage
10 to 5000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V75: 10 to 2000Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
Model V76: 10 to 2500Vrms (1V resolution) sinewave at 50 or 60Hz +/- 0.05%
1%+5V accuracy under all allowed loading conditions
Max. Load
20mArms (10mArms max resistive for >10sec), reduced by 20µA per V below 1000V, reduced by 10µA per V above 4000V
Leakage Accuracy
DC coupled, true RMS, 10Hz-4KHz 3dB bandwidth
DUT isolated (<1.1mA) : 1%+5µA (1µA resolution) DUT isolated (>1.1mA) : 1%+30µA (10µA resolution)
DUT grounded : 1%+30µA+(4µA per KV) (10µA resolution)
ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.1sec resolution) or user terminated
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
Frequency
DUT Isolated/Grounded
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure

DCW Test Steps

Voltage
20 to 5000VDC (1V resolution)
Model V75: 20 to 3000VDC (1V resolution)
Model V76: 20 to 2750VDC (1V resolution)
1%+5V accuracy under all allowed loading conditions
Max. Load
<2000V : 10mA (reduce by 10uA per Volt below 1000V), <0.25uF capacitance
2000-3000V : 7mA (reduce by 4µA per volt above 2000V), <0.1µF capacitance
3000-4000V : 3mA (reduce by 1µA per volt above 3000V), <0.05µF capacitance >4000V : 2mA (reduce by 0.5µA per volt above 4000V), <0.03µF capacitance
Leakage Accuracy
DUT resistive, isolated (<200µA) : 1%+1µA (0.1µA resolution)
DUT resistive, isolated (0.2-1.5mA) : 1%+2µA (1µA resolution)
Otherwise : 1%+20µA (10µA resolution)
ARC Limit
Disabled or up to 30mA (1mA resolution)
Ramp
DUT resistive : 0.1 to 99.9sec (0.02sec resolution)
DUT capacitive : 1.0 to 99.9sec (0.02sec resolution)
Dwell
0.1 to 9999sec (0.02sec resolution) or user terminated
Ramp Down
0sec or as defined for ramp
Discharge Internal
50KΩ discharge load and 0.03µF capacitive energy
Shutdown
Excessive HV terminal current : within 1ms
User Stop : within 2ms
Interlock opened (if enabled) : within 2ms
Load Breakdown (sudden uncontrolled increase of load current): within 150µs
Leakage Limit (if enabled) : within 100ms
ARC Limit (if enabled) : within 1ms
User Settings
Voltage Level
DUT Isolated/Grounded
DUT Resistive/Capacitive
Min. Leakage Limit (can be disabled)
Max. Leakage Limit (can be disabled)
ARC Limit (can be disabled)
Ramp Period
Dwell Period
Ramp Down Fast/As Ramp
Stop/Continue Sequence on Failure