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  • A high-performance analyzer designed for R&D applications involving electrochemical components, materials, batteries, and EDLCs. It enables precise impedance measurements essential for advanced evaluation and development.

    Key Features:

    • Wide frequency range: 1 mHz to 200 kHz for detailed ion and solution behavior analysis
    • Dual function: High-speed continuous LCR and sweep measurements with one device
    • Battery analysis: Measures internal impedance under no-load conditions
    • Ultra-fast sweep: Perform measurements in as little as 2 ms
    • High accuracy: ±0.05% basic precision for reliable R&D and testing
    • Advanced analysis: Supports Cole-Cole plots and equivalent-circuit modeling for electrochemical studies
  • An advanced firmware upgrade for the IM3570 that enables quick and accurate equivalent circuit analysis, ideal for in-depth component evaluation and quality control.

    Key Features:

    • Automatically selects the optimal equivalent circuit model from five typical options
    • Minimizes discrepancies between measured and ideal frequency characteristics
    • Determines acceptance/rejection of L, C, and R elements with precision
    • Evaluates resonance sharpness (mechanical quality coefficient)
    • Enables detailed analysis of piezoelectric elements and inductors through resonance
    • Current measurement from insulated probing of conductor
    • Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
    • Wide dynamic range of 10mA to 20A peak to peak
    • Wide bandwidth of DC to 5MHz
    • Low noise figure equivalent to <6mA rms at full B/W
    • Safety rated to 300V Cat II (600V Cat 1)
    • Suitable for connection to any oscilloscope
    • High accuracy general purpose H-field probe
    • Converts to ‘closed magnetic circuit’ current probe

     

  • A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

    Key Features:

    • Continuous LCR/DCR/sweep measurements with one instrument
    • Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
    • High accuracy: ±0.08% basic accuracy for Z parameter
    • Ideal for low-ESR measurement of functional polymer capacitors
    • Suitable for resonance testing of piezoelectric elements
    • Accurate DCR and L-Q testing of inductors, coils, and transformers
  • The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

    Key Features:

    • 1 MHz to 300 MHz frequency range
    • 0.5 ms test speed
    • ±0.72% basic accuracy
    • Compact half-rack size with palm-sized test head
    • Reliable contact check functions
    • Frequency, level, and time sweeps in Analyzer Mode
    • RF I-V method for precise measurement
  • The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

    Key Features:

    • 100 kHz to 300 MHz frequency range
    • 0.5 ms fastest test speed
    • ±0.72% basic accuracy
    • Compact half-rack size, palm-sized test head
    • Reliable contact check via DCR, Hi-Z reject, or waveform judgment
    • Supports frequency, level, and time sweeps in Analyzer Mode
    • Uses RF I-V method for precise measurement
  • The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

    Key Features:

    • Frequency range: 1 MHz to 3 GHz
    • Test speed: 0.5 ms
    • Measurement variability: 0.07%
    • Basic accuracy: ±0.65% reading
    • RF I-V measurement technique
    • Compact half-rack design with palm-sized test head
    • Robust contact check capabilities
    • Analyzer mode: frequency and level sweeps, time interval measurements
  • The DCP-X probe is designed for engineers and scientists in device characterization, R&D, and testing, offering highly accurate and repeatable on-wafer electrical measurements (IV, CV, LFN). It uses MEMS technology to measure advanced devices (2, 3, 5 nm) on various pad materials, micro-bumps, and pads as small as 20 μm, reducing the need for retesting and cleaning while covering the full thermal range at lower testing costs. Compared to traditional probes, the DCP-X provides 1000x lower contact resistance, minimal skate, and over 500,000 contact cycles, ensuring precise measurements and longer probe life.

  • The Hioki PW8001 High-Precision Power Analyzer sets the benchmark for precision power analysis, offering unmatched accuracy and flexibility for evaluating motor and inverter efficiency. Supporting DC and frequencies from 0.1 Hz to 5 MHz, it features an 8-channel measurement capacity, enabling simultaneous analysis of complex systems like EV drivetrains, renewable energy sources, and high-efficiency SiC/GaN semiconductors.

    Equipped with advanced features such as automatic phase correction, intuitive Power Spectrum Analysis (PSA), and CAN/CAN FD integration, the PW8001 excels in capturing high-speed switching power fluctuations and harmonics. Its compatibility with high-voltage systems (up to 1500 V) and seamless connectivity with industry-standard software like LabVIEW and MATLAB ensure it meets diverse testing needs. With its robust design, real-time waveform visualization, and comprehensive motor analysis functions, the PW8001 is the ultimate tool for power conversion efficiency analysis.

     

    • S-parameters DC to 40 GHz, single-ended and mixed-mode
    • Impedance Profile with <1 mm resolution, differential and common-mode
    • Internal, automatic OSLT calibration
    • USB-connected, small, lightweight
    • Flexible display of the measurements
    • Remove effects from fixtures, connectors and cables
    • Emulate eye diagrams with CTLE, DFE and FFE equalization
    • Advanced jitter analysis

     

  • The TESLA300 Advanced On-Wafer Power Semiconductor Probe System is an integrated high-power test solution that enables the collection of accurate high-voltage and high-current measurement data up to 3 kV (triaxial) / 10 kV (coaxial) and 200 A (standard) / 600 A (high current), with complete operator safety.

    • Highly Damped Step Respond
    • Simple installation – No tuning require
    • Application-specific designs/products/
    • Capabilities to meet your needs
    • Ability to support massive machines, tools, systems

     

    • 6 degrees of freedom
    • Active gain starting from 0.5Hz
    • Variable Damping (patent pending)
    • Build In Artificial Intelligence Feature
    • Adjustable by software active bandwidth
    • Remote control
    • Built in real time diagnostic tools
      • Spectrum analyzer
      • Oscilloscope
    • Shaker Mode

     

    • 6 degrees of freedom
    • Active gain starting from 0.5Hz
    • Variable Damping (patent pending)
    • Build In Artificial Intelligence Feature
    • Adjustable by software active bandwidth
    • Remote control
    • Built in real time diagnostic tools
      • Spectrum analyzer
      • Oscilloscope
    • Shaker Mode

     

    • Highly Damped Step Respond
    • Simple installation – No tuning require
    • Application-specific designs/products/
    • Capabilities to meet your needs
    • Ability to support massive machines, tools, systems

     

    • Vector Network Analyzer (option up to 26.5GHz)
    • WinCal XE calibration software
    • Uses best measurement practices for optimized measurements
    • Known measurement accuracy traced back to independent standards
    • Supported by the measurement experts to make you successful
    • Best in class RF performance
    • Small benchtop footprint
    • Industry standard calibration techniques
    • Extended 2 Year warranty on FormFactor products for educational customers