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  • The Hioki 3506-10 C Meter is a high-speed dual-band capacitance meter designed specifically for ceramic capacitor testing on automated production lines. Built for seamless integration with taping machines and sorting systems, it delivers fast, stable, and repeatable measurements even in demanding manufacturing environments.

    Key Features

    • Dual measurement frequencies of 1 kHz and 1 MHz
    • Ultra-fast analog test time of 0.6 ms at 1 MHz
    • Stable low-capacitance measurement for MLCC production
    • Enhanced noise resistance for reliable inline testing
    • BIN function for efficient component screening
    • Designed for integration with taping machines and sorters
    • Excellent repeatability for high-volume manufacturing

     

    • Current measurement from insulated probing of conductor
    • Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
    • Wide dynamic range of 10mA to 20A peak to peak
    • Wide bandwidth of DC to 5MHz
    • Low noise figure equivalent to <6mA rms at full B/W
    • Safety rated to 300V Cat II (600V Cat 1)
    • Suitable for connection to any oscilloscope
    • High accuracy general purpose H-field probe
    • Converts to ‘closed magnetic circuit’ current probe

     

  • Key Features:

    • PXI/cPCI JTAG controller for seamless integration into PXI-based test systems
    • Supports up to 4 JTAG chains on a Unit Under Test (UUT)
    • Configurable I/O pin-out for maximum flexibility across projects
    • Fully compatible with other XJLink2 controllers
    • TCK clock speeds up to 166 MHz
    • Programmable voltage domains from 1.1 V to 3.3 V in 0.1 V steps
    • Built-in voltage meter and frequency counter on all I/O pins
    • Adjustable signal termination with auto-skew control
    • Includes LabVIEW™ Virtual Instruments (VIs) for easy integration
    • Self-contained licence for use on multiple PXI racks or servers

     

  • Key Features:

    • Portable USB-C to JTAG controller with 40 I/O pins
    • Supports up to 8 separate JTAG TAP chains with independent frequencies
    • Compact and rugged aluminium casing for lab, production, or field use
    • Configurable JTAG pin-out to suit any Unit Under Test (UUT)
    • Electrical protection against –30 V to +30 V input
    • Four programmable I/O voltages (1.2 V to 3.3 V, in 0.1 V steps)
    • Built-in voltmeter and frequency counter on all pins
    • High-speed operation with TCK up to 166 MHz
    • USB bus-powered with locking Type-C connector
    • Self-contained licence for maximum flexibility

     

  • Key Features:

    • Compact USB JTAG controller for flexible board testing
    • Supports up to 4 JTAG chains per UUT
    • Lightweight, portable, and ideal for lab, production, or field use
    • Configurable pin-out for easy adaptation to any PCB design
    • High-speed TCK clock up to 166 MHz
    • Two programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
    • Built-in voltmeter and frequency counter on all I/O pins
    • +5 V tolerant signals with auto-skew control
    • USB bus-powered, no external PSU needed
    • Self-contained licence, usable on multiple PCs

     

  • Key Features

    • Approved by Keysight Technologies for i3070 ICT integration
    • Fully compatible with all XJTAG projects
    • High-speed programming with TCK up to 166 MHz
    • Supports up to 4 JTAG chain connections to UUT
    • Configurable interface voltages (1.1 V to 3.3 V)
    • Adjustable signal slew rate and drive strength
    • Automatic signal skew control for maximum reliability
    • Frequency counter on all I/O pins (up to 200 MHz input)
    • Fits into one i3070 utility card slot (multiple units supported)
    • Enables test + programming in a single stage to boost throughput
    • Supports additional protocols including I²C, SPI, and vendor-specific interfaces
    • Flexible software licensing options for stand-alone or network operation

     

  • Key Features:

    • 4-port JTAG tester for simultaneous testing of up to 4 boards
    • High-speed USB 2.0 interface with robust performance
    • Supports up to 4 TAP chains per UUT
    • Configurable JTAG pin-out for simplified connectivity
    • Parallel or independent testing on each port
    • Programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
    • Built-in voltmeter and frequency counter on all I/O pins
    • Automatic signal skew control for reliable operation
    • Self-contained licence for use across multiple PCs
    • Ideal for production lines and PCB manufacturers

     


Showing all 7 results