Products

The Hioki IM7583 Impedance Analyzer is a high-speed, reliable LCR measurement device ideal for testing electronic components in high-volume production environments. It combines precision, compact design, and flexible operation for a wide range of applications.

Key Features

• Test frequency range: 1 MHz to 600 MHz
• Fastest analog test speed: 0.5 milliseconds
• Basic accuracy: ±0.65% rdg.
• Half-rack body with palm-sized test head for flexible placement
• RF I-V method for accurate impedance measurement
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for automated PASS/FAIL judgments

The Hioki IM7585 Impedance Analyzer is a high-speed, high-precision LCR and impedance measurement device designed for R&D and production environments. It delivers fast, accurate testing of electronic components from 1 MHz to 1.3 GHz.

Key Features

• Test frequency range: 1 MHz to 1.3 GHz
• Fastest test speed: 0.5 milliseconds (analog measurement)
• Exceptional stability with 0.07% measured value variability at 1 GHz
• Basic accuracy: ±0.65% rdg.
• Half-rack body with a palm-sized test head for flexible placement
• RF I-V method for precise impedance analysis
• Contact check with DCR testing, Hi-Z reject, or waveform judgment
• Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
• Comparator function for PASS/FAIL judgments

The Hioki IM9201 SMD Test Fixture is a high frequency test fixture designed exclusively for the IM7580 series impedance analyzers. Supporting six common SMD package sizes, it enables stable, repeatable impedance measurements up to 3 GHz for advanced component evaluation in R&D and production environments.

Key Features

• Designed exclusively for Hioki IM7580 series impedance analyzers
• Supports impedance measurement up to 3 GHz
• Accommodates six SMD package sizes in one fixture
• Dual device guides allow fast and accurate component placement
• Optimized for high frequency stability and repeatability
• Ideal for RF components, ferrite beads, and chip inductors

A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

Key Features:

• Continuous LCR/DCR/sweep measurements with one instrument
• Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
• High accuracy: ±0.08% basic accuracy for Z parameter
• Ideal for low-ESR measurement of functional polymer capacitors
• Suitable for resonance testing of piezoelectric elements
• Accurate DCR and L-Q testing of inductors, coils, and transformers

The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

Key Features:

• 1 MHz to 300 MHz frequency range
• 0.5 ms test speed
• ±0.72% basic accuracy
• Compact half-rack size with palm-sized test head
• Reliable contact check functions
• Frequency, level, and time sweeps in Analyzer Mode
• RF I-V method for precise measurement

The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

Key Features:

• 100 kHz to 300 MHz frequency range
• 0.5 ms fastest test speed
• ±0.72% basic accuracy
• Compact half-rack size, palm-sized test head
• Reliable contact check via DCR, Hi-Z reject, or waveform judgment
• Supports frequency, level, and time sweeps in Analyzer Mode
• Uses RF I-V method for precise measurement

The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

Key Features:

• Frequency range: 1 MHz to 3 GHz
• Test speed: 0.5 ms
• Measurement variability: 0.07%
• Basic accuracy: ±0.65% reading
• RF I-V measurement technique
• Compact half-rack design with palm-sized test head
• Robust contact check capabilities
• Analyzer mode: frequency and level sweeps, time interval measurements

Key Features:

• PXI/cPCI JTAG controller for seamless integration into PXI-based test systems
• Supports up to 4 JTAG chains on a Unit Under Test (UUT)
• Configurable I/O pin-out for maximum flexibility across projects
• Fully compatible with other XJLink2 controllers
• TCK clock speeds up to 166 MHz
• Programmable voltage domains from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltage meter and frequency counter on all I/O pins
• Adjustable signal termination with auto-skew control
• Includes LabVIEW™ Virtual Instruments (VIs) for easy integration
• Self-contained licence for use on multiple PXI racks or servers

Key Features:

• Portable USB-C to JTAG controller with 40 I/O pins
• Supports up to 8 separate JTAG TAP chains with independent frequencies
• Compact and rugged aluminium casing for lab, production, or field use
• Configurable JTAG pin-out to suit any Unit Under Test (UUT)
• Electrical protection against –30 V to +30 V input
• Four programmable I/O voltages (1.2 V to 3.3 V, in 0.1 V steps)
• Built-in voltmeter and frequency counter on all pins
• High-speed operation with TCK up to 166 MHz
• USB bus-powered with locking Type-C connector
• Self-contained licence for maximum flexibility

Key Features:

• Compact USB JTAG controller for flexible board testing
• Supports up to 4 JTAG chains per UUT
• Lightweight, portable, and ideal for lab, production, or field use
• Configurable pin-out for easy adaptation to any PCB design
• High-speed TCK clock up to 166 MHz
• Two programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• +5 V tolerant signals with auto-skew control
• USB bus-powered, no external PSU needed
• Self-contained licence, usable on multiple PCs

Key Features

• Approved by Keysight Technologies for i3070 ICT integration
• Fully compatible with all XJTAG projects
• High-speed programming with TCK up to 166 MHz
• Supports up to 4 JTAG chain connections to UUT
• Configurable interface voltages (1.1 V to 3.3 V)
• Adjustable signal slew rate and drive strength
• Automatic signal skew control for maximum reliability
• Frequency counter on all I/O pins (up to 200 MHz input)
• Fits into one i3070 utility card slot (multiple units supported)
• Enables test + programming in a single stage to boost throughput
• Supports additional protocols including I²C, SPI, and vendor-specific interfaces
• Flexible software licensing options for stand-alone or network operation

Key Features:

• 4-port JTAG tester for simultaneous testing of up to 4 boards
• High-speed USB 2.0 interface with robust performance
• Supports up to 4 TAP chains per UUT
• Configurable JTAG pin-out for simplified connectivity
• Parallel or independent testing on each port
• Programmable voltages from 1.1 V to 3.3 V in 0.1 V steps
• Built-in voltmeter and frequency counter on all I/O pins
• Automatic signal skew control for reliable operation
• Self-contained licence for use across multiple PCs
• Ideal for production lines and PCB manufacturers