Showing all 10 results


  • A high-performance analyzer designed for R&D applications involving electrochemical components, materials, batteries, and EDLCs. It enables precise impedance measurements essential for advanced evaluation and development.

    Key Features:

    • Wide frequency range: 1 mHz to 200 kHz for detailed ion and solution behavior analysis
    • Dual function: High-speed continuous LCR and sweep measurements with one device
    • Battery analysis: Measures internal impedance under no-load conditions
    • Ultra-fast sweep: Perform measurements in as little as 2 ms
    • High accuracy: ±0.05% basic precision for reliable R&D and testing
    • Advanced analysis: Supports Cole-Cole plots and equivalent-circuit modeling for electrochemical studies
  • An advanced firmware upgrade for the IM3570 that enables quick and accurate equivalent circuit analysis, ideal for in-depth component evaluation and quality control.

    Key Features:

    • Automatically selects the optimal equivalent circuit model from five typical options
    • Minimizes discrepancies between measured and ideal frequency characteristics
    • Determines acceptance/rejection of L, C, and R elements with precision
    • Evaluates resonance sharpness (mechanical quality coefficient)
    • Enables detailed analysis of piezoelectric elements and inductors through resonance
  • Key Features:

    • High-precision EIS measurement for EV and ESS battery testing
    • Frequency range: 0.01 Hz to 1.05 kHz for versatile impedance analysis
    • Measures impedance, voltage, and temperature simultaneously
    • Supports Nyquist (Cole-Cole) plotting for battery R&D
    • Four-terminal pair probes reduce magnetic flux for stable measurements
    • LAN interface enables multi-channel testing and integration into production systems
    • Compatible with third-party equivalent circuit analysis software
    • Reliable for both R&D and manufacturing applications

     

  • The Hioki IM7583 Impedance Analyzer is a high-speed, reliable LCR measurement device ideal for testing electronic components in high-volume production environments. It combines precision, compact design, and flexible operation for a wide range of applications.

    Key Features

    • Test frequency range: 1 MHz to 600 MHz
    • Fastest analog test speed: 0.5 milliseconds
    • Basic accuracy: ±0.65% rdg.
    • Half-rack body with palm-sized test head for flexible placement
    • RF I-V method for accurate impedance measurement
    • Contact check with DCR testing, Hi-Z reject, or waveform judgment
    • Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
    • Comparator function for automated PASS/FAIL judgments

     

  • The Hioki IM7585 Impedance Analyzer is a high-speed, high-precision LCR and impedance measurement device designed for R&D and production environments. It delivers fast, accurate testing of electronic components from 1 MHz to 1.3 GHz.

    Key Features

    • Test frequency range: 1 MHz to 1.3 GHz
    • Fastest test speed: 0.5 milliseconds (analog measurement)
    • Exceptional stability with 0.07% measured value variability at 1 GHz
    • Basic accuracy: ±0.65% rdg.
    • Half-rack body with a palm-sized test head for flexible placement
    • RF I-V method for precise impedance analysis
    • Contact check with DCR testing, Hi-Z reject, or waveform judgment
    • Frequency sweeps, level sweeps, and time interval measurements in Analyzer Mode
    • Comparator function for PASS/FAIL judgments

     

  • The Hioki IM9201 SMD Test Fixture is a high frequency test fixture designed exclusively for the IM7580 series impedance analyzers. Supporting six common SMD package sizes, it enables stable, repeatable impedance measurements up to 3 GHz for advanced component evaluation in R&D and production environments.

    Key Features

    • Designed exclusively for Hioki IM7580 series impedance analyzers
    • Supports impedance measurement up to 3 GHz
    • Accommodates six SMD package sizes in one fixture
    • Dual device guides allow fast and accurate component placement
    • Optimized for high frequency stability and repeatability
    • Ideal for RF components, ferrite beads, and chip inductors

     

  • A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

    Key Features:

    • Continuous LCR/DCR/sweep measurements with one instrument
    • Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
    • High accuracy: ±0.08% basic accuracy for Z parameter
    • Ideal for low-ESR measurement of functional polymer capacitors
    • Suitable for resonance testing of piezoelectric elements
    • Accurate DCR and L-Q testing of inductors, coils, and transformers
  • The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

    Key Features:

    • 1 MHz to 300 MHz frequency range
    • 0.5 ms test speed
    • ±0.72% basic accuracy
    • Compact half-rack size with palm-sized test head
    • Reliable contact check functions
    • Frequency, level, and time sweeps in Analyzer Mode
    • RF I-V method for precise measurement
  • The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

    Key Features:

    • 100 kHz to 300 MHz frequency range
    • 0.5 ms fastest test speed
    • ±0.72% basic accuracy
    • Compact half-rack size, palm-sized test head
    • Reliable contact check via DCR, Hi-Z reject, or waveform judgment
    • Supports frequency, level, and time sweeps in Analyzer Mode
    • Uses RF I-V method for precise measurement
  • The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

    Key Features:

    • Frequency range: 1 MHz to 3 GHz
    • Test speed: 0.5 ms
    • Measurement variability: 0.07%
    • Basic accuracy: ±0.65% reading
    • RF I-V measurement technique
    • Compact half-rack design with palm-sized test head
    • Robust contact check capabilities
    • Analyzer mode: frequency and level sweeps, time interval measurements

Showing all 10 results