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  • A high-speed, high-precision LCR meter ideal for low-ESR and impedance testing in advanced electronic components like polymer capacitors, inductors, and piezoelectric elements.

    Key Features:

    • Continuous LCR/DCR/sweep measurements with one instrument
    • Ultra-fast testing speeds: 1.5 ms (1 kHz), 0.5 ms (100 kHz)
    • High accuracy: ±0.08% basic accuracy for Z parameter
    • Ideal for low-ESR measurement of functional polymer capacitors
    • Suitable for resonance testing of piezoelectric elements
    • Accurate DCR and L-Q testing of inductors, coils, and transformers
  • The Hioki IM7580A is a compact, high-speed impedance analyzer for 1 MHz to 300 MHz testing, ideal for both production and R&D. It works seamlessly with the IM9201 SMD fixture for reliable component testing.

    Key Features:

    • 1 MHz to 300 MHz frequency range
    • 0.5 ms test speed
    • ±0.72% basic accuracy
    • Compact half-rack size with palm-sized test head
    • Reliable contact check functions
    • Frequency, level, and time sweeps in Analyzer Mode
    • RF I-V method for precise measurement
  • The Hioki IM7581 is a compact, high-speed impedance analyzer designed for accurate testing from 100 kHz to 300 MHz. It’s ideal for both production and development environments.

    Key Features:

    • 100 kHz to 300 MHz frequency range
    • 0.5 ms fastest test speed
    • ±0.72% basic accuracy
    • Compact half-rack size, palm-sized test head
    • Reliable contact check via DCR, Hi-Z reject, or waveform judgment
    • Supports frequency, level, and time sweeps in Analyzer Mode
    • Uses RF I-V method for precise measurement
  • The Hioki Impedance Analyzer IM7587 3 GHz provides precision, speed, and versatility for impedance measurements from 1 MHz to 3 GHz, ideal for both R&D and mass production applications in electronic component testing.

    Key Features:

    • Frequency range: 1 MHz to 3 GHz
    • Test speed: 0.5 ms
    • Measurement variability: 0.07%
    • Basic accuracy: ±0.65% reading
    • RF I-V measurement technique
    • Compact half-rack design with palm-sized test head
    • Robust contact check capabilities
    • Analyzer mode: frequency and level sweeps, time interval measurements