Test and Measurement Products

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FormFactor Beaverton Inc Cascade MPS150-SiPh Probe Station
Cascade MPS150-SiPh Manual Silicon Photonics Probe Station

Key Features:
- Cost-effective entry-level photonics probe station.
- Supports surface coupling and horizontal edge coupling.
- Retro-mirror technology for precise fiber alignment.
- Tip-tilt base positioner with 6 degrees of freedom.
- Compatible with single fibers and fiber arrays.
- Optional eVue digital imaging or SlimVue high-performance microscope.
- Modular, upgradable design with platen extensions.
- Ergonomic and intuitive for users of all experience levels.
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FormFactor Beaverton Inc Cascade PAV200 Probe System
Cascade PAV200 – 200 mm Semi-Automated Vacuum Probe System

Key Features:
- Supports wafers and substrates up to 200 mm (optional upgrade to 300 mm)
- Operates in high vacuum down to < 1×10⁻⁴ mbar
- Semi-automated control with joystick and software-driven chuck movement
- Up to eight probe positioners and/or probe card integration
- Optional thermal chuck with -60°C to 300°C range
- Solid frame with vibration isolation for stable, accurate measurements
- Wide application support: DC, RF, MEMS, and optoelectronics
- Velox software for wafer alignment, mapping, and simplified automation
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FormFactor Beaverton Inc Cascade PLC50
The Cascade PLC50 is a precise, cost-effective cryogenic wafer probing system designed for research labs. It enables testing down to 77 K with liquid nitrogen or below 7 K with liquid helium, supporting DC, RF, MEMS, and optoelectronic measurements.

Key Features:
- Compatible with wafers up to 100 mm and single dies.
- Operates at 77 K (LN₂) or < 7 K (LHe).
- Up to six positioners for flexible probing.
- Independently cooled cold shield ensures stable, accurate results.
- Ice- and condensation-free probing in vacuum conditions.
- Ergonomic design with hinged lid and easy microscope access.
- Independent chuck stage and positioner control for high throughput.
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FormFactor Beaverton Inc Cascade PM8 Probe System
Cascade PM8 200 mm Manual Probe System

Key Features:
- Stable granite base for vibration-free measurements.
- Submicron precision with 1 µm repeatable separation stroke.
- Configurable for DC, RF, mmW, sub-THz, FA, MEMS, and opto-engineering.
- 40 mm platen height adjustability for flexible setups.
- Supports thermal chucks, motorized microscopes, and dark box options.
- Double-side probing for frontside and backside device access.
- Ergonomic and low-profile design for easy wafer handling.
- Upgradeable platform with accessories for future needs.
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FormFactor Beaverton Inc Cascade PMC200 Cryogenic Probe Station
Cascade PMC200 Cryogenic Probe Station – advanced manual solution for wafer probing down to cryogenic levels with unmatched flexibility and accuracy.

Key Features:
- 200 mm cryogenic manual probe station with probes inside chamber
- Supports wafers up to 200 mm or single dies
- Probe cards and up to eight positioners for advanced measurements
- Operates with liquid nitrogen (77 K) or helium (< 7 K)
- Optional microscope bridge and 300 mm wafer upgrade
- Front-loading capability for fast and ergonomic device changes
- Independently cooled cold shield for stable cryogenic performance
- Precise probe positioning with vibration-isolated frame
- Covers DC, RF, MEMS, OPTO, and superconducting device tests
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FormFactor Beaverton Inc Cascade PMV200 Vacuum Probe
A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

Key Features:
- Supports wafers and substrates up to 200 mm or single dies
- Up to eight positioners and probe card compatibility
- Optional thermal chuck (-60°C to 300°C) with pressure regulation
- Accessories available: black bodies and optical motion analysis tools
- Upgradeable to 300 mm wafer capability
- Built-in vibration isolation for precise, stable measurements
- Ideal for DC, RF, MEMS, and optoelectronic testing
- Ergonomic manual drives with front-loading capability
- High throughput with software-controlled chuck for fast step-and-repeat
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FormFactor Beaverton Inc Cascade Summit Probe System
Cascade Summit 200 mm Manual Probe System

Key Features:
- High-precision manual on-wafer device and process characterization.
- Wide thermal range from -60°C to +300°C.
- Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
- PureLine™ and AttoGuard® technologies for low-noise performance.
- Configurable for DC, RF, mmW, WLR, and FA applications.
- Locking roll-out stage for safe wafer access.
- Ergonomic 3-axis manual stage with intuitive controls.
- Dedicated Velox software with Augmented Align for accurate RF probing.
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FormFactor Beaverton Inc Cascade SUMMIT200 Probe Station
Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:
- High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
- Up to 5X faster time to accurate data with automated wafer handling.
- Wide thermal range from -60°C to +300°C with IceShield™.
- PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
- Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
- Flexible platform for device characterization, FA, WLR, and design debug.
- Velox control software with modern UI, workflow guide, and automation tools.
- Ergonomic operation with quick manual wafer access and roll-out stage.
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FormFactor Beaverton Inc Cascade TESLA300
Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:
- On-wafer device testing up to 10,000 V DC / 600 A
- AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
- MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
- TÜV-certified safety system with full enclosure and interlocks
- Wide thermal range: -60°C to +300°C with TopHat chamber
- Roll-out chuck and auxiliary mounts for flexible wafer handling
- Remote operation and full software integration with Velox and analyzers
- Material Handling Unit (MHU301) for automated wafer loading and barcode recognition
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Absolute EMC CDG 7000 Conducted Immunity
CDG 7000 Conducted Immunity Test System, 10 kHz – 400 MHz

Key Features:
- All-in-one IEC/EN 61000-4-6 immunity test system with RF signal generator, power amplifier, 3-channel RF voltmeter, and directional coupler.
- Frequency range from 10 kHz to 400 MHz with multiple amplifier versions (25 W, 75 W, 75 W/10k).
- Supports BCI tests (ISO 11452-4) and NAMUR standards.
- Advanced software HELIA 7 with EUT monitoring and automated reporting.
- Interfaces: USB, LAN, optional GPIB for flexible integration.
- Expandable with external amplifiers and configurable digital I/O.
- Compact, robust 19″ desktop housing with 3-year warranty.
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AE Techron CIS-25 Test Kit
The CIS-25 Test Kit by AE Techron is an all-in-one solution for aviation conducted and induced susceptibility testing. Designed to meet rigorous standards like DO-160 Sections 16, 18, and 19, this kit includes everything needed to perform accurate, repeatable EMC tests with minimal setup.

Key Features:
- Meets Multiple Standards: DO-160 Sections 16 (up to 24VDC), 18, 19, MIL STD 461, Airbus ABD0100.1.8
- Complete Test Kit: Includes DSR 100-25 power system, three coupling transformers, and chattering relay
- 4x Power Surge Capability: Ideal for in-rush testing (up to 200 ms)
- Built-In Standards Library: 3110A library for additional EMC tests
- Expert Guidance Included: Two hours of consulting from EMC specialist Patrick G. Andre
- Secure & Durable: Comes with a lockable storage cabinet and all necessary accessories
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FormFactor Beaverton Inc CM300xi-SiPh Probe System
Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:
- Integrated silicon photonics wafer and die-level probing solution.
- Autonomous SiPh Measurement Assistant for hands-free calibration.
- OptoVue™ technology for real-time, in-situ optical calibrations.
- Supports vertical, horizontal edge, and wafer-level edge coupling.
- Dark, shielded, frost-free environment with SiPh TopHat.
- Thermal capability from -40°C to +125°C.
- Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
- Partnerships with Keysight and PI for precision instrumentation.
- Easy setup and automation with Velox and Velox Dash™ interface.
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FormFactor Beaverton Inc CM300xi-ULN Probe System
Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:
- Ultra-low noise measurements with patented PureLine™ 3 technology.
- Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
- Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
- Plug-and-Go TestCell Power Management eliminating ground-loop noise.
- Autonomous 24/7 operation with optimized motorized probe positioners.
- Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
- Integrated Velox software for simple, efficient automation.
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Absolute EMC DAM 6.0-P Antenna Mast
The DAM 6.0-P Dual Antenna Mast is a high-precision, dual-antenna mast designed for accurate EMC measurements in magnetic absorption chambers.

Key Features:
- Adjustable height from 1.0 m to 6.0 m with electric stepper motor
- Pneumatic polarization change 0° to 90° in approx. 3 seconds
- Dual antenna support with max. load 20 kg (balanced)
- Rotating antenna bars to eliminate elevation errors
- Robust base: 0.95 m x 0.73 m
- Non-metallic construction (plastic and reinforced fiberglass)
- Remote control via LAN (TCP/IP) with FCU3.0 or NCD Controller
- Suitable for EMC testing labs, automotive, industrial, and telecom setups
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Absolute EMC dAV Fiber-optic Audio Link
Reliable digital transmission system for analog audio and video signals with multiple configuration options for EMC testing and monitoring.

Key Features:
- Transmits analog audio and video signals digitally over fiber optics
- Supports both unidirectional and bidirectional communication
- Available in multiple configurations: audio (stereo), video (NTSC/PAL), or combined
- Ideal for EMC testing, acoustic monitoring, and immunity test surveillance
- Integrated microphone and external input/output support in intercom models
- Suitable for automotive, military, aerospace, and RF industries
- Compliant with MIL-STD-461 standards
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Absolute EMC Dips Interrupts Test System
The Dips Interrupts Test System is a turnkey EMC solution for immunity testing across multiple IEC/EN 61000-4 standards. Available in 30kVA (43A) and 50kVA (75A) versions, this system is ideal for grid simulation, compliance testing, and R&D validation.

Key Features:
- Fully compliant with IEC/EN 61000-4-11/-13/-14/-27/-28/-34
- Fast switching: <5 µs voltage transition time
- Regenerative 4-quadrant AC grid simulator
- TC.VSE Voltage Slope Enhancer with 1000 A peak current
- Power range from 30 kVA up to 2000+ kVA
- User-friendly ACSControl software with test libraries
- Graphical interface for waveform preview and reporting
- Applications include EMC, inverter, anti-islanding, and medical testing
- Compact rack-mounted design with global certifications (CE, UKCA, RoHS)
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