Products

Cascade PMC200 Cryogenic Probe Station – advanced manual solution for wafer probing down to cryogenic levels with unmatched flexibility and accuracy.

Key Features:

• 200 mm cryogenic manual probe station with probes inside chamber
• Supports wafers up to 200 mm or single dies
• Probe cards and up to eight positioners for advanced measurements
• Operates with liquid nitrogen (77 K) or helium (< 7 K)
• Optional microscope bridge and 300 mm wafer upgrade
• Front-loading capability for fast and ergonomic device changes
• Independently cooled cold shield for stable cryogenic performance
• Precise probe positioning with vibration-isolated frame
• Covers DC, RF, MEMS, OPTO, and superconducting device tests

A high-precision vacuum probe station engineered for advanced wafer and substrate testing up to 200 mm in demanding laboratory and industrial environments.

Key Features:

• Supports wafers and substrates up to 200 mm or single dies
• Up to eight positioners and probe card compatibility
• Optional thermal chuck (-60°C to 300°C) with pressure regulation
• Accessories available: black bodies and optical motion analysis tools
• Upgradeable to 300 mm wafer capability
• Built-in vibration isolation for precise, stable measurements
• Ideal for DC, RF, MEMS, and optoelectronic testing
• Ergonomic manual drives with front-loading capability
• High throughput with software-controlled chuck for fast step-and-repeat

Cascade Summit 200 mm Manual Probe System

Key Features:

• High-precision manual on-wafer device and process characterization.
• Wide thermal range from -60°C to +300°C.
• Moisture-free, light-tight, EMI-shielded test environment with MicroChamber®.
• PureLine™ and AttoGuard® technologies for low-noise performance.
• Configurable for DC, RF, mmW, WLR, and FA applications.
• Locking roll-out stage for safe wafer access.
• Ergonomic 3-axis manual stage with intuitive controls.
• Dedicated Velox software with Augmented Align for accurate RF probing.

Cascade SUMMIT200 Advanced 200 mm Probe Station

Key Features:

• High-accuracy electrical measurements for DC, RF, mmW, and THz applications.
• Up to 5X faster time to accurate data with automated wafer handling.
• Wide thermal range from -60°C to +300°C with IceShield™.
• PureLine™, AttoGuard®, and MicroChamber® technologies for ultra-low noise performance.
• Precision sub-micron positioning with advanced 4-axis stage and VueTrack PRO.
• Flexible platform for device characterization, FA, WLR, and design debug.
• Velox control software with modern UI, workflow guide, and automation tools.
• Ergonomic operation with quick manual wafer access and roll-out stage.

Cascade TESLA300 is a 300 mm semi- and fully-automated probe system for advanced on-wafer power device characterization, ensuring safe, precise, and high-power testing.

Key Features:

• On-wafer device testing up to 10,000 V DC / 600 A
• AttoGuard™ and FemtoGuard™ chuck technologies for low-leakage, high-accuracy measurements
• MicroVac™ chuck ensures thin wafer stability and minimal contact resistance
• TÜV-certified safety system with full enclosure and interlocks
• Wide thermal range: -60°C to +300°C with TopHat chamber
• Roll-out chuck and auxiliary mounts for flexible wafer handling
• Remote operation and full software integration with Velox and analyzers
• Material Handling Unit (MHU301) for automated wafer loading and barcode recognition

Cascade CM300xi-SiPh Probe System – 300 mm Wafer and Die-Level Photonics Testing

Key Features:

• Integrated silicon photonics wafer and die-level probing solution.
• Autonomous SiPh Measurement Assistant for hands-free calibration.
• OptoVue™ technology for real-time, in-situ optical calibrations.
• Supports vertical, horizontal edge, and wafer-level edge coupling.
• Dark, shielded, frost-free environment with SiPh TopHat.
• Thermal capability from -40°C to +125°C.
• Exclusive SiPh-Tools and Photonics Controller Interface (PCI) software.
• Partnerships with Keysight and PI for precision instrumentation.
• Easy setup and automation with Velox and Velox Dash™ interface.

Cascade CM300xi-ULN Probe System – Ultra Low Noise 300 mm Wafer Prober

Key Features:

• Ultra-low noise measurements with patented PureLine™ 3 technology.
• Ideal for flicker noise (1/f), RTN, and phase noise testing of ultra-sensitive devices.
• Fully shielded MicroChamber™ for EMI/RFI protection and frost-free low-temperature operation.
• Plug-and-Go TestCell Power Management eliminating ground-loop noise.
• Autonomous 24/7 operation with optimized motorized probe positioners.
• Wide thermal range from -65°C to +300°C with fA/fF measurement precision.
• Integrated Velox software for simple, efficient automation.

Compact and quiet bench power supply with precision linear regulation and a range of output options for lab or system use.

Key Features:

• Linear regulated bench DC power supply
• Single, dual, and triple output options
• Up to 56V and 5A with up to 130W output
• 4-digit voltage and current display per output
• Constant voltage or constant current operation
• Switchable local/remote sensing
• Silent, fan-free convection cooling
• Compact design saves bench space
• Optional RS232 or USB interfaces (on select models)
• Auxiliary output (1.5–5V/2A) on EL302RT

A compact and flexible semi-automated wafer probe system designed for RF/DC modeling, device characterization, and advanced measurement needs.

Key Features:

• Mechanical platen lift for safer RF set-ups and reduced operator errors
• Fully compatible with Autonomous RF/DC measurement assistants and Velox Dash™ app
• Reconfigurable platen inserts (TopHat, PCH, IceShield) for versatile test configurations
• Spacious platen design supporting RF and DC setups with ease
• Compact footprint with field-upgradable components
• Integrated Low-Volume MicroChamber and FemtoGuard thermal triaxial chuck

A versatile bench power supply series with mixed-mode regulation, ideal for lab or system environments.

Key Features:

• Single, dual, or triple outputs with up to 420W power
• Output ranges: 18V/10A, 20V/20A, 35V/5A, 42V/10A
• Dual model: 2×35V/4A or 150V/2A (combined)
• Triple model includes 1.5–5V/5A auxiliary output
• Independent 4-digit meters for each output
• Local or remote sensing with constant V or I modes
• Silent, fan-free operation for most models
• Compact, space-saving design
• RS232 or USB interfaces on select models

Compact, versatile, and efficient, the FX Series is ideal for test labs, R&D, and educational use.

Key Features:

• PowerFlex autoranging outputs (up to 105W per channel)
• Dual or triple output models (210W or 246W total)
• SELV compliant and high safety design
• Rotary, touch, and USB control options
• Low ripple noise (<2mV), high resolution (1mV/1mA)
• Voltage tracking and simultaneous V/I control
• Remote USB interface with SCPI protocol
• 25 user-defined memory presets
• Switchable remote sense & intelligent cooling
• Includes Test Bridge software for logging & automation

• Current measurement from insulated probing of conductor
• Suitable for observation and measurement of current in PCB tracks, component leads and ground planes
• Wide dynamic range of 10mA to 20A peak to peak
• Wide bandwidth of DC to 5MHz
• Low noise figure equivalent to <6mA rms at full B/W
• Safety rated to 300V Cat II (600V Cat 1)
• Suitable for connection to any oscilloscope
• High accuracy general purpose H-field probe
• Converts to ‘closed magnetic circuit’ current probe

Key Features

• Supports wafers up to 200 mm (optional 300 mm upgrade)
• Operates at cryogenic temperatures down to 10 K
• Semi-automated with optional full automation via autoloader
• Compatible with liquid nitrogen, liquid helium, or cryo-cooler
• Ice- and condensation-free probing for stable performance
• Up to eight probe positioners or probe card integration
• Solid vibration-isolated frame for precision measurements
• Velox software with intuitive alignment and automation

Key Features

• Entry-level manual wafer probing in vacuum < 1×10⁻⁴ mbar
• Supports wafers up to 150 mm or single dies
• Up to six probe positioners for flexible testing
• Optional thermal chuck from -60°C to +300°C
• Probing possible with open chamber lid at atmosphere
• Stable, vibration-isolated frame for precise results
• Ergonomic design with hinged topside lid for easy access
• Independent control of chuck stage and positioners
• Fast, manual step-and-repeat wafer testing

Cascade PM300 – 300 mm Analytical Probe Station

Key Features:

• Industry benchmark for manual wafer probing and failure analysis.
• Superior mechanical stability with granite base for precision and repeatability.
• High-precision probe positioning with independent X-Y coarse and fine adjustments.
• Configurable for DC, RF, mmW, WLR, FA, and 3D IC testing.
• Wide thermal range: -60°C to +200°C (PM300PS) / +15°C to +300°C (PM300).
• Optional electromagnetic shielding (PM300PS) for ultra-low-noise environments.
• Spacious, ergonomic design supporting up to 12 positioners.
• Upgradeable platform to support future testing needs.

Experience precision RF signal analysis on the go with this lightweight, handheld analyzer designed for both lab and field use.

Key Features:

• Frequency range: 1MHz to 1.3GHz (PSA1303) or 2.7GHz (PSA2703)
• RBW: 300Hz to 10MHz
• -115dBm typical noise floor
• Dual markers with absolute/difference values
• AM/FM demodulation in zero span
• Auto-find & smart marker peak tracking
• USB for waveform saving and PC connection
• Live, View, and Reference trace modes
• 6-hour lithium-ion battery operation
• Weighs just 0.58 kg
• Optional U01 Upgrade: Limit lines, data logging, triggering, compensation tables