Showing 1–16 of 57 results


  • The AH401D Picoammeter is a compact and high precision 4 channel charge integration electrometer designed for accurate low current measurements. Built with an advanced charge integration input stage and a 20 bit delta sigma ADC, the instrument ensures reliable sensing of extremely small currents with minimal noise. Its simultaneous multi channel sampling, Ethernet connectivity, and trigger input make it a powerful solution for beam monitoring, detector measurements, and scientific instrumentation. The AH401D is engineered for stable performance, high linearity, and precise signal acquisition in demanding laboratory environments.

    Key Features

    • 4 channel simultaneous sampling picoammeter
    • Advanced charge integration input stage for precise current sensing
    • 20 bit delta sigma ADC with digital noise reduction filter
    • Eight selectable input current ranges
    • Measurement ranges from 50 pA up to 2 µA
    • Ultra high resolution down to 50 aA
    • User selectable integration time from 1 ms to 1 s
    • Continuous current to voltage conversion without dead time
    • Ethernet interface with TCP/IP and UDP communication
    • External trigger input for synchronized measurements
    • Compact low noise design for close placement to signal sources
    • Plug and play oscilloscope software for configuration and analysis

     

  • The AH501D Picoammeter is a high performance 4 channel bipolar electrometer designed for precise low current measurements in advanced research and detector monitoring systems. Built with a transimpedance input stage and high resolution 24 bit conversion, the instrument delivers accurate simultaneous current measurements across multiple channels. With an integrated bias voltage source, analog monitoring outputs, and Ethernet connectivity, the AH501D provides a complete solution for beam position monitoring, detector analysis, and scientific instrumentation.

    Key Features

    • 4 channel simultaneous sampling bipolar picoammeter
    • 24 bit high resolution current measurement
    • Three selectable input current ranges
    • Bipolar current measurement capability
    • Measurement range from ±2.5 nA up to ±2.5 mA
    • Ultra high resolution down to 300 aA
    • Fast sampling with minimum period of 38.4 microseconds
    • Integrated low noise bias voltage source up to 30 V
    • Analog monitor outputs for real time signal observation
    • Ethernet interface with TCP/IP and UDP communication
    • External trigger and gate input for synchronized acquisition
    • Compact design to reduce cable noise interference
    • Plug and play oscilloscope software for configuration and analysis

     

  • The AMC-PICO-8 Picoammeter is a high performance 8 channel bipolar electrometer designed for precision current measurements in advanced instrumentation environments. Built in the MTCA.4 format, the device combines a specialized transimpedance input stage with 20 bit simultaneous sampling ADCs to deliver fast and accurate current sensing. With sampling speeds up to 1 MSPS and floating input capability up to ±300 V, the system supports demanding detector readout and scientific measurement applications. Its FPGA based signal processing and PCI Express communication ensure reliable data acquisition and efficient system integration.

    Key Features

    • 8 channel simultaneous bipolar current measurement
    • High resolution 20 bit analog to digital conversion
    • Sampling rate up to 1 MSPS for fast data acquisition
    • MTCA.4 Advanced Mezzanine Card architecture
    • Floating input capability up to ±300 V relative to chassis ground
    • Transimpedance input stage with advanced signal conditioning
    • Multiple selectable measurement ranges depending on configuration
    • Integrated FPGA for high speed signal processing
    • Digital channel calibration with onboard EEPROM storage
    • Trigger based acquisition with pre trigger memory capture
    • PCI Express communication interface for system control
    • Scatter gather DMA support for high speed data transfer

     

  • The BatReg² Battery Cycler is a high-precision bidirectional and regenerative battery testing system designed for advanced battery research, cycling, and charging applications. Built with state-of-the-art digital control and regenerative technology, it enables accurate testing while efficiently returning excess energy to the grid. With output ratings up to 100 V and ±150 A, this system delivers reliable performance for laboratories, research centers, and battery development facilities.

    Key Features

    • High-precision bidirectional and regenerative battery cycler
    • Output capability up to 100 V and ±150 A
    • Multiple regulation modes including Constant Voltage, Constant Current, and Constant Power
    • 24-bit resolution at 100 kHz for precise output setting and readback
    • Built-in polarity detection for safe battery connection
    • Embedded web server interface for monitoring and configuration
    • Integrated 24-bit Arbitrary Waveform Generator running at 100 kHz
    • 4-channel precision oscilloscope for advanced signal monitoring
    • High efficiency regenerative design that returns energy to the grid
    • Low output noise and ripple due to high switching frequency architecture
    • Ethernet connectivity supporting TCP/IP and UDP communication
    • Optional trigger, analog control, auxiliary ADC, and K-type thermocouple inputs

     

  • The BEST Beam Stabilization System is a complete turnkey solution designed to control and stabilize photon beam position and intensity in synchrotron radiation X ray beamlines. Developed to support high precision beamline experiments, the system integrates advanced hardware with powerful software tools to deliver reliable beam monitoring and correction. With a distributed architecture and FPGA driven control algorithms, the BEST system allows researchers to optimize beam stability, improve experimental accuracy, and maintain consistent beam performance in demanding scientific environments.

    Key Features

    • Complete turnkey system for photon beam position and intensity stabilization
    • Designed for synchrotron radiation X ray beamline applications
    • Simultaneous control of beam position X and Y and beam intensity I0
    • Distributed architecture for flexible installation near beamline components
    • High speed FPGA based hardware for low latency correction performance
    • Advanced control algorithms operating across several kHz frequency range
    • Integrated readout unit based on high precision picoammeter technology
    • Dedicated control and interface unit for system configuration and monitoring
    • Gigabit Ethernet connectivity for network integration
    • High throughput communication interface for real time system control
    • Compatible with EPICS based beamline control systems
    • Software tools for detector configuration and beamline optimization

     

  • Cascade Autonomous DC delivers fully automated DC wafer probing with unmatched precision and efficiency powered by Contact Intelligence™.

    Key Features:

    • Autonomous DC wafer probing with hands-free 24/7 operation
    • Contact Intelligence™ technology for dynamic probe correction and reliable pad placement
    • High throughput with up to 4x faster flicker noise thermal testing on pads as small as 30 µm
    • Unattended operation for overnight or weekend testing without user intervention
    • Automatic probe alignment compensating for thermal drift to reduce soak time
    • Flexible probe layouts supporting single DUT and multi-DUT configurations
    • Ease of use – start testing with just one button, ideal for operators at all levels

     

  • Cascade Autonomous RF delivers fully automated RF and mm-wave wafer probing with Contact Intelligence™ for unmatched accuracy and efficiency.

    Key Features:

    • Autonomous RF wafer probing with hands-free 24/7 operation
    • Contact Intelligence™ for on-the-fly probe correction and pad placement
    • Automatic calibration up to 500 GHz with WinCal XE software
    • Calibration drift monitoring with auto re-calibration when needed
    • Reduced soak time through dynamic probe re-alignment across temperatures
    • Unattended operation for continuous overnight and weekend testing
    • Supports 200 mm and 300 mm probe stations including CM300xi, SUMMIT200, Summit 12000, and Elite 300
    • Simplified one-button operation, suitable for operators at all levels

     

  • Cascade Autonomous Silicon Photonics delivers fully automated wafer and die-level photonics probing with Contact Intelligence™ for unmatched accuracy.

    Key Features:

    • Flexible vertical and edge coupling with single fibers or fiber arrays
    • OptoVue™ technology for real-time in-situ calibrations
    • Exclusive TopHat environment for dark, frost-free thermal testing (-40°C to +125°C)
    • Sub-micron placement accuracy with Z displacement sensing
    • Collision avoidance technology for safe fiber alignment
    • SiPh-Tools software for automated alignment, calibration, and data management
    • Partnership with Keysight and PI for seamless instrumentation and precision positioning
    • Available on CM300xi-SiPh and SUMMIT200 probe stations

     

  • Cascade CM300xi – 300 mm Semi-/Fully-Automated Probe System

    Key Features:

    • Supports DC, AC, RF/microwave, WLR, FA, and design debug applications
    • Wide thermal range from -60°C to +300°C with IceShield or TopHat compatibility
    • Reliable, repeatable probe contact in a moisture-free, EMI-shielded environment
    • Contact Intelligence™ technology for autonomous alignment and accurate measurements
    • Modular design with upgrade paths for semi- or fully-automated configurations
    • Handles up to 50 wafers with SEMI-standard cassette automation
    • Fast transition times with MicroVac™ and FemtoGuard™ low-noise technologies
    • Intuitive Velox software and Velox Dash™ touchscreen interface for simplified operation

     

  • Engineered for precision and safety, the EPS150TESLA delivers accurate on-wafer power device characterization up to 3,000 V and 100 A, making it a trusted choice for high-voltage and high-current testing.

    Key Features:

    • On-wafer power device characterization up to 3,000 V (triaxial) / 10,000 V (optional coaxial).
    • High-current probing up to 100 A with ultra-low contact resistance.
    • Triax chuck design for accurate low-leakage measurements.
    • Shielded test environment with advanced grounding and arcing protection.
    • Seamless integration with analyzers via SIGMA kit and optimized signal path.
    • Safe probe tip exchange and thin-wafer handling capability.

     

  • Cascade EPS200MMW mmW and THz Probe System

    Key Features:

    • Complete mmW, THz, and load-pull measurement solution.
    • Accurate probing up to 500 GHz with T-Wave Probes and VDI Extenders.
    • SlimVue Microscope with 1 μm resolution and quick lens exchange.
    • Resolves pads smaller than 50 μm with precision optics.
    • Sigma Application Kits for broadband, load-pull, coax RF, and waveguide setups.
    • Rock-solid mechanical design with submicron stage accuracy.
    • Motorized positioner with ±1 μm separation repeatability.
    • Stable and repeatable probe placement for THz frequencies.

     

  • Cascade EPS200RF 200 mm Manual Probe System

    Key Features:

    • Complete RF measurement package up to 67 GHz.
    • Based on the PM8 platform for stability and flexibility.
    • Supports Infinity, ACP, and |Z| probe technologies for different material types.
    • High precision probing with RF chuck ±3 μm planarity.
    • 500 μm platen stroke with ≤±1 μm accuracy for repeatable contact.
    • Reliable probing for pads as small as 25 µm x 35 µm.
    • Includes matching cables, substrates, and WinCal XE calibration software.
    • Delivers accurate S-parameter measurements with automated calibration.

     

  • Key Features:

    • 150 mm modular probe station with customizable base and starter kits.
    • Flexible options for IV/CV, RF, mmWave, THz, high power, and failure analysis.
    • Solid frame with built-in vibration isolation for measurement stability.
    • Supports advanced microscopes, triax, coax, and RF chucks.
    • Seamless integration with leading measurement instruments.
    • Ergonomic design with quick pull-out stage for fast device handling.
    • Re-configurable and upgradable to grow with future testing needs.

     

  • Cascade MPS150-SiPh Manual Silicon Photonics Probe Station

    Key Features:

    • Cost-effective entry-level photonics probe station.
    • Supports surface coupling and horizontal edge coupling.
    • Retro-mirror technology for precise fiber alignment.
    • Tip-tilt base positioner with 6 degrees of freedom.
    • Compatible with single fibers and fiber arrays.
    • Optional eVue digital imaging or SlimVue high-performance microscope.
    • Modular, upgradable design with platen extensions.
    • Ergonomic and intuitive for users of all experience levels.

     

  • Cascade PAV200 – 200 mm Semi-Automated Vacuum Probe System

    Key Features:

    • Supports wafers and substrates up to 200 mm (optional upgrade to 300 mm)
    • Operates in high vacuum down to < 1×10⁻⁴ mbar
    • Semi-automated control with joystick and software-driven chuck movement
    • Up to eight probe positioners and/or probe card integration
    • Optional thermal chuck with -60°C to 300°C range
    • Solid frame with vibration isolation for stable, accurate measurements
    • Wide application support: DC, RF, MEMS, and optoelectronics
    • Velox software for wafer alignment, mapping, and simplified automation

     

  • The Cascade PLC50 is a precise, cost-effective cryogenic wafer probing system designed for research labs. It enables testing down to 77 K with liquid nitrogen or below 7 K with liquid helium, supporting DC, RF, MEMS, and optoelectronic measurements.

    Key Features:

    • Compatible with wafers up to 100 mm and single dies.
    • Operates at 77 K (LN₂) or < 7 K (LHe).
    • Up to six positioners for flexible probing.
    • Independently cooled cold shield ensures stable, accurate results.
    • Ice- and condensation-free probing in vacuum conditions.
    • Ergonomic design with hinged lid and easy microscope access.
    • Independent chuck stage and positioner control for high throughput.

     


Showing 1–16 of 57 results